متابعة
Saman Kiamehr
Saman Kiamehr
SEG-Auomotive
بريد إلكتروني تم التحقق منه على seg-automotive.com
عنوان
عدد مرات الاقتباسات
عدد مرات الاقتباسات
السنة
Aging-aware logic synthesis‏
M Ebrahimi, F Oboril, S Kiamehr, MB Tahoori‏
2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 61-68, 2013‏
762013
Analysis of transient voltage fluctuations in FPGAs‏
DRE Gnad, F Oboril, S Kiamehr, MB Tahoori‏
2016 International Conference on Field-Programmable Technology (FPT), 12-19, 2016‏
692016
Aging effects in FPGAs: An experimental analysis‏
A Amouri, F Bruguier, S Kiamehr, P Benoit, L Torres, M Tahoori‏
2014 24th international conference on Field Programmable Logic and …, 2014‏
662014
NBTI mitigation by optimized NOP assignment and insertion‏
F Firouzi, S Kiamehr, MB Tahoori‏
2012 Design, Automation & Test in Europe Conference & Exhibition (DATE), 218-223, 2012‏
562012
An experimental evaluation and analysis of transient voltage fluctuations in FPGAs‏
DRE Gnad, F Oboril, S Kiamehr, MB Tahoori‏
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (10 …, 2018‏
552018
Aging mitigation in memory arrays using self-controlled bit-flipping technique‏
A Gebregiorgis, M Ebrahimi, S Kiamehr, F Oboril, S Hamdioui, ...‏
The 20th Asia and South Pacific Design Automation Conference, 231-236, 2015‏
542015
Investigation of NBTI and PBTI induced aging in different LUT implementations‏
S Kiamehr, A Amouri, MB Tahoori‏
2011 International Conference on Field-Programmable Technology, 1-8, 2011‏
502011
Fine-grained aging-induced delay prediction based on the monitoring of run-time stress‏
A Vijayan, A Koneru, S Kiamehr, K Chakrabarty, MB Tahoori‏
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016‏
482016
Aging-aware timing analysis considering combined effects of NBTI and PBTI‏
S Kiamehr, F Firouzi, MB Tahoori‏
International Symposium on Quality Electronic Design (ISQED), 53-59, 2013‏
442013
Contemporary CMOS aging mitigation techniques: Survey, taxonomy, and methods‏
N Khoshavi, RA Ashraf, RF DeMara, S Kiamehr, F Oboril, MB Tahoori‏
Integration 59, 10-22, 2017‏
422017
Temperature-aware dynamic voltage scaling to improve energy efficiency of near-threshold computing‏
S Kiamehr, M Ebrahimi, MS Golanbari, MB Tahoori‏
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (7), 2017‏
412017
Power-aware minimum NBTI vector selection using a linear programming approach‏
F Firouzi, S Kiamehr, MB Tahoori‏
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2012‏
402012
VLSI Systems Long-Term Reliability–Modeling, Simulation and Optimization‏
SXD Tan, M Tahoori, T Kim, S Wang, Z Sun, S Kiamehr‏
Cham, Switzerland: Springer, 2019‏
372019
Statistical analysis of BTI in the presence of process-induced voltage and temperature variations‏
F Firouzi, S Kiamehr, MB Tahoori‏
2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC), 594-600, 2013‏
362013
Aging-aware standard cell library design‏
S Kiamehr, F Firouzi, M Ebrahimi, MB Tahoori‏
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-4, 2014‏
322014
Altering LUT configuration for wear-out mitigation of FPGA-mapped designs‏
PMB Rao, A Amouri, S Kiamehr, MB Tahoori‏
2013 23rd International Conference on Field programmable Logic and …, 2013‏
322013
Reducing NBTI-induced processor wearout by exploiting the timing slack of instructions‏
F Oboril, F Firouzi, S Kiamehr, M Tahoori‏
Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware …, 2012‏
312012
Radiation-induced soft error analysis of SRAMs in SOI FinFET technology: A device to circuit approach‏
S Kiamehr, T Osiecki, M Tahoori, S Nassif‏
Proceedings of the 51st Annual Design Automation Conference, 1-6, 2014‏
302014
Chip-level modeling and analysis of electrical masking of soft errors‏
S Kiamehr, M Ebrahimi, F Firouzi, MB Tahoori‏
2013 IEEE 31st VLSI Test Symposium (VTS), 1-6, 2013‏
302013
Incorporating the impacts of workload-dependent runtime variations into timing analysis‏
F Firouzi, S Kiamehr, M Tahoori, S Nassif‏
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2013‏
302013
يتعذر على النظام إجراء العملية في الوقت الحالي. عاود المحاولة لاحقًا.
مقالات 1–20