Low-power electronic technologies for harsh radiation environments J Prinzie, FM Simanjuntak, P Leroux, T Prodromakis
Nature Electronics 4 (4), 243-253, 2021
79 2021 Comparison of a 65 nm CMOS Ring-and LC-Oscillator Based PLL in Terms of TID and SEU Sensitivity J Prinzie, J Christiansen, P Moreira, M Steyaert, P Leroux
IEEE Transactions on Nuclear Science 64 (1), 245-252, 2016
71 2016 A 2.56-GHz SEU Radiation Hard J Prinzie, J Christiansen, P Moreira, M Steyaert, P Leroux
IEEE Transactions on Nuclear Science 65 (1), 407-412, 2017
52 2017 A review of semiconductor based ionising radiation sensors used in Harsh radiation environments and their applications A Karmakar, J Wang, J Prinzie, V De Smedt, P Leroux
Radiation 1 (3), 194-217, 2021
51 2021 A single-event upset robust, 2.2 GHz to 3.2 GHz, 345 fs jitter PLL with triple-modular redundant phase detector in 65 nm CMOS J Prinzie, M Steyaert, P Leroux, J Christiansen, P Moreira
2016 IEEE Asian Solid-State Circuits Conference (A-SSCC), 285-288, 2016
32 2016 Study of SEU sensitivity of SRAM-based radiation monitors in 65-nm CMOS J Wang, J Prinzie, A Coronetti, S Thys, RG Alia, P Leroux
IEEE Transactions on Nuclear Science 68 (5), 913-920, 2021
28 2021 Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing J rey Prinzie, M Steyaert, P Leroux
Springer, 2018
26 2018 A low noise fault tolerant radiation hardened 2.56 Gbps clock-data recovery circuit with high speed feed forward correction in 65 nm CMOS S Biereigel, S Kulis, P Leitao, R Francisco, P Moreira, P Leroux, J Prinzie
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (5), 1438-1446, 2019
22 2019 PicoTDC: a flexible 64 channel TDC with picosecond resolution S Altruda, J Christiansen, M Horstmann, L Perktold, D Porret, J Prinzie
Journal of instrumentation 18 (07), P07012, 2023
21 2023 SISSA: The lpGBT PLL and CDR Architecture, Performance and SEE Robustness S Biereigel, P Moreira, S Kulis, R Francisco, PV Leitao, P Leroux, ...
PoS, 034, 2020
21 2020 Radiation-tolerant digitally controlled ring oscillator in 65-nm CMOS S Biereigel, S Kulis, P Leroux, P Moreira, J Prinzie
IEEE Transactions on Nuclear Science 69 (1), 17-25, 2021
18 2021 Single-event effect responses of integrated planar inductors in 65-nm CMOS S Biereigel, S Kulis, P Leroux, P Moreira, A Kölpin, J Prinzie
IEEE transactions on nuclear science 68 (11), 2587-2597, 2021
18 2021 An SRAM-Based Radiation Monitor With Dynamic Voltage Control in 0.18- J Prinzie, S Thys, B Van Bockel, J Wang, V De Smedt, P Leroux
IEEE Transactions on Nuclear Science 66 (1), 282-289, 2018
18 2018 lpGBT documentation: release P Moreira, S Baron, S Biereigel, J Carvalho, B Faes, M Firlej, T Fiutowski, ...
CERN, Switzerland, 2022
17 2022 Optimal physical implementation of radiation tolerant high-speed digital integrated circuits in deep-submicron technologies J Prinzie, K Appels, S Kulis
Electronics 8 (4), 432, 2019
15 2019 A self-calibrated bang–bang phase detector for low-offset time signal processing J Prinzie, M Steyaert, P Leroux
IEEE Transactions on Circuits and Systems II: Express Briefs 63 (5), 453-457, 2015
15 2015 A single shot TDC with 4.8 ps resolution in 40 nm CMOS for high energy physics applications J Prinzie, M Steyaert, P Leroux
Journal of Instrumentation 10 (01), C01031, 2015
14 2015 Radiation-tolerant all-digital PLL/CDR with varactorless LC DCO in 65 nm CMOS S Biereigel, S Kulis, P Moreira, A Kölpin, P Leroux, J Prinzie
Electronics 10 (22), 2741, 2021
13 2021 Radiation assessment of a 15.6 ps single-shot time-to-digital converter in terms of TID B Van Bockel, J Prinzie, P Leroux
Electronics 8 (5), 558, 2019
13 2019 Radiation effects in CMOS technology J Prinzie, M Steyaert, P Leroux, J Prinzie, M Steyaert, P Leroux
Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing …, 2018
13 2018