| Estimations of bulk geometrically necessary dislocation density using high resolution EBSD T Ruggles, D Fullwood Ultramicroscopy 133, 8-15, 2013 | 163 | 2013 |
| Increasing accuracy and precision of digital image correlation through pattern optimization GF Bomarito, JD Hochhalter, TJ Ruggles, AH Cannon Optics and Lasers in Engineering 91, 73-85, 2017 | 147 | 2017 |
| Resolving geometrically necessary dislocation density onto individual dislocation types using EBSD-based continuum dislocation microscopy TJ Ruggles, DT Fullwood, JW Kysar International Journal of Plasticity 76, 231-243, 2016 | 92 | 2016 |
| The effect of length scale on the determination of geometrically necessary dislocations via EBSD continuum dislocation microscopy TJ Ruggles, TM Rampton, A Khosravani, DT Fullwood Ultramicroscopy 164, 1-10, 2016 | 75 | 2016 |
| Validation of kinematically simulated pattern HR-EBSD for measuring absolute strains and lattice tetragonality D Fullwood, M Vaudin, C Daniels, T Ruggles, SI Wright Materials Characterization 107, 270-277, 2015 | 61 | 2015 |
| A digital twin feasibility study (Part I): Non-deterministic predictions of fatigue life in aluminum alloy 7075-T651 using a microstructure-based multi-scale model SR Yeratapally, PE Leser, JD Hochhalter, WP Leser, TJ Ruggles Engineering Fracture Mechanics 228, 106888, 2020 | 50 | 2020 |
| Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction BE Dunlap, TJ Ruggles, DT Fullwood, B Jackson, MA Crimp Ultramicroscopy 184, 125-133, 2018 | 40 | 2018 |
| Analysis of traction‐free assumption in high‐resolution EBSD measurements TJ Hardin, TJ Ruggles, DP Koch, SR Niezgoda, DT Fullwood, ER Homer Journal of microscopy 260 (1), 73-85, 2015 | 39 | 2015 |
| Development of optimal multiscale patterns for digital image correlation via local grayscale variation GF Bomarito, JD Hochhalter, TJ Ruggles Experimental Mechanics 58, 1169-1180, 2018 | 37 | 2018 |
| New levels of high angular resolution EBSD performance via inverse compositional Gauss–Newton based digital image correlation TJ Ruggles, GF Bomarito, RL Qiu, JD Hochhalter Ultramicroscopy 195, 85-92, 2018 | 36 | 2018 |
| Correlating results from high resolution EBSD with TEM-and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reduction TJ Ruggles, YSJ Yoo, BE Dunlap, MA Crimp, J Kacher Ultramicroscopy 210, 112927, 2020 | 23 | 2020 |
| Ductility of Advanced High-Strength Steel in the Presence of a Sheared Edge T Ruggles, S Cluff, M Miles, D Fullwood, C Daniels, A Avila, M Chen JOM, 1-11, 2016 | 22 | 2016 |
| Investigation of fatigue crack incubation and growth in cast MAR-M247 subjected to low cycle fatigue at room temperature SR Yeratapally, JD Hochhalter, TJ Ruggles, MD Sangid International Journal of Fracture 208, 79-96, 2017 | 20 | 2017 |
| Non-deterministic calibration of crystal plasticity model parameters J Hochhalter, G Bomarito, S Yeratapally, P Leser, T Ruggles, J Warner, ... Integrated Computational Materials Engineering (ICME) Advancing …, 2020 | 17 | 2020 |
| Identification of star defects in gallium nitride with HREBSD and ECCI TJ Ruggles, JI Deitz, AA Allerman, CB Carter, JR Michael Microscopy and Microanalysis 27 (2), 257-265, 2021 | 14 | 2021 |
| Microstructure detail extraction via EBSD: an overview D Fullwood, B Adams, J Basinger, T Ruggles, A Khosravani, C Sorensen, ... Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local …, 2014 | 14 | 2014 |
| Selectively electron-transparent microstamping toward concurrent digital image correlation and high-angular resolution electron backscatter diffraction (EBSD) analysis TJ Ruggles, GF Bomarito, AH Cannon, JD Hochhalter Microscopy and Microanalysis 23 (6), 1091-1095, 2017 | 12 | 2017 |
| Characterizing defect structures in AM steel using direct electron detection EBSD J Kacher, T Ruggles, J Key, M Nowell, S Wright Scripta Materialia 221, 114952, 2022 | 11 | 2022 |
| Characterization of geometrically necessary dislocation content with EBSD-based continuum dislocation microscopy TJ Ruggles Brigham Young University, 2015 | 10 | 2015 |
| Micro speckle stamping: High contrast, no basecoat, repeatable, well-adhered AH Cannon, JD Hochhalter, GF Bomarito, T Ruggles International Digital Imaging Correlation Society: Proceedings of the First …, 2017 | 9 | 2017 |
