A Novel High-Endurance FeFET Memory Device Based on ZrO2 Anti-Ferroelectric and IGZO Channel Z Liang, K Tang, J Dong, Q Li, Y Zhou, R Zhu, Y Wu, D Han, R Huang
2021 IEEE International Electron Devices Meeting (IEDM), 17.3. 1-17.3. 4, 2021
35 2021 Ferroelectric and interlayer co-optimization with in-depth analysis for high endurance FeFET Y Zhou, Z Liang, W Luo, M Yu, R Zhu, X Lv, J Li, Q Huang, F Liu, K Tang, ...
2022 International Electron Devices Meeting (IEDM), 6.2. 1-6.2. 4, 2022
29 2022 Hybrid-FE-Layer FeFET with high linearity and endurance toward on-chip CIM by array demonstration Y Zhou, H Shao, R Zhu, W Luo, W Huang, L Shan, R Huang, K Tang
IEEE Electron Device Letters 45 (2), 276-279, 2023
4 2023 A novel FeFET array-based PUF: Co-optimization of entropy source and CRP generation for enhanced robustness in IoT security H Shao, Y Zhou, W Huang, C Su, Z Fu, W Luo, K Tang, R Huang
2023 International Electron Devices Meeting (IEDM), 1-4, 2023
2 2023 HAO Y Zhou, Z Liang, R Zhu, Q Huang, K Tang, R Huang
IEEE Transactions on Electron Devices, 2024
1 2024 Improved Memory Density and Endurance by a Novel 1T3C FeFET for BEOL Multi-level Cell Memory R Zhu, Y Zhou, C Sun, W Huang, J Dong, R Huang, K Tang
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024
1 2024 First Demonstration of High Throughput and Reliable Homomorphic Encryption Using FeFET Arrays for Resource-Limited IoT Clients H Shao, Y Zhou, Z Ning, W Luo, X Bin, J Yang, K Tang, R Huang
2024 IEEE International Electron Devices Meeting (IEDM), 1-4, 2024
2024 A Compact Writing Scheme for the Reliability Challenges in 1T Multi-level FeFET Array: Variation, Endurance and Write Disturb Y Zhou, H Shao, W Huang, R Zhu, Y Zhang, R Huang, K Tang
IEEE Electron Device Letters, 2024
2024 A Reliable 2 bit MLC FeFET with High Uniformity and 109 Endurance by Gate Stack and Write Pulse Co-optimization Y Zhou, W Huang, R Zhu, R Huang, K Tang
2024 IEEE European Solid-State Electronics Research Conference (ESSERC), 657-660, 2024
2024 A Novel Hybrid-FE-layer FeFET with Enhanced Linearity for On-chip Training of CIM Accelerator Y Zhou, R Huang, K Tang
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024
2024 
Kechao TangPeking UniversityПотвърден имейл адрес: pku.edu.cn