Следене
Bohan Xu
Bohan Xu
NaMLab gGmbH, TU Dresden
Потвърден имейл адрес: namlab.com
Заглавие
Позовавания
Позовавания
Година
Investigating charge trapping in ferroelectric thin films through transient measurements
S Lancaster, PD Lomenzo, M Engl, B Xu, T Mikolajick, U Schroeder, ...
Frontiers in Nanotechnology 4, 939822, 2022
332022
Influence of Si-Doping on 45 nm Thick Ferroelectric ZrO2 Films
B Xu, PD Lomenzo, A Kersch, T Mikolajick, U Schroeder
ACS Applied Electronic Materials 4 (7), 3648-3654, 2022
262022
Reduced fatigue and leakage of ferroelectric TiN/Hf0. 5Zr0. 5O2/TiN capacitors by thin alumina interlayers at the top or bottom interface
HA Hsain, Y Lee, S Lancaster, PD Lomenzo, B Xu, T Mikolajick, ...
Nanotechnology 34 (12), 125703, 2023
222023
Role of oxygen source on buried interfaces in atomic-layer-deposited ferroelectric hafnia–zirconia thin films
HA Hsain, Y Lee, S Lancaster, M Materano, R Alcala, B Xu, T Mikolajick, ...
ACS Applied Materials & Interfaces 14 (37), 42232-42244, 2022
222022
Discovery of Nanoscale Electric Field‐Induced Phase Transitions in ZrO2
PD Lomenzo, L Collins, R Ganser, B Xu, R Guido, A Gruverman, A Kersch, ...
Advanced Functional Materials 33 (41), 2303636, 2023
212023
Reliability Improvement from La2O3 Interfaces in Hf0.5Zr0.5O2‐Based Ferroelectric Capacitors
F Mehmood, R Alcala, P Vishnumurthy, B Xu, R Sachdeva, T Mikolajick, ...
Advanced Materials Interfaces 10 (8), 2202151, 2023
212023
Strain as a Global Factor in Stabilizing the Ferroelectric Properties of ZrO2
B Xu, PD Lomenzo, A Kersch, T Schenk, C Richter, CM Fancher, ...
Advanced Functional Materials 34 (8), 2311825, 2024
162024
Using Raman spectroscopy and x-ray diffraction for phase determination in ferroelectric mixed Hf1− xZrxO2-based layers
U Schroeder, R Sachdeva, PD Lomenzo, B Xu, M Materano, T Mikolajick, ...
Journal of Applied Physics 132 (21), 2022
162022
Influence of the Ozone Dose Time during Atomic Layer Deposition on the Ferroelectric and Pyroelectric Properties of 45 nm-Thick ZrO2 Films
B Xu, L Collins, KM Holsgrove, T Mikolajick, U Schroeder, PD Lomenzo
ACS Applied Electronic Materials 5 (4), 2288-2295, 2023
152023
The Role of Interface Dynamics on the Reliability Performance of BEOL Integrated Ferroelectric HfO2 Capacitors
R Alcala, PD Lomenzo, T Mittmann, B Xu, R Guido, S Lancaster, ...
2022 International Electron Devices Meeting (IEDM), 32.8. 1-32.8. 4, 2022
62022
Influence of Biaxial Strain and Interfacial Layer Growth on Ferroelectric Wake-Up and Phase Transition Fields in ZrO2
B Xu, R Ganser, KM Holsgrove, X Wang, P Vishnumurthy, T Mikolajick, ...
ACS Applied Materials & Interfaces 16 (25), 32533-32542, 2024
52024
Voltage Programmable Pyroelectric Sensors with ZrO2-based Antiferroelectrics
PD Lomenzo, S Li, B Xu, T Mikolajick, U Schroeder
IEEE Sensors Journal, 2024
42024
Wake-up free ferroelectric hafnia-zirconia capacitors fabricated via vacuum-maintaining atomic layer deposition
HA Hsain, Y Lee, PD Lomenzo, R Alcala, B Xu, T Mikolajick, U Schroeder, ...
Journal of Applied Physics 133 (22), 2023
42023
Impact of Hafnium Doping on Phase Transition, Interface, and Reliability Properties of ZrxHf1–xO2-Based Capacitors
P Vishnumurthy, B Xu, F Wunderwald, C Richter, O Rehm, L Baumgarten, ...
ACS Applied Electronic Materials 6 (8), 6174-6185, 2024
32024
Revealing the role of B-site cations in the antiferroelectricity of NaNbO3-based perovskites
TC Ma, B Xu, M Zheng, Y Hou, K Wang, W Gong, MH Zhang
Journal of the European Ceramic Society 45 (2), 116928, 2025
2025
Stabilizing Ferroelectric Properties in Zirconia Thin Films
B Xu
2024
Mechanism of Antiferroelectricity in Polycrystalline ZrO2
R Ganser, PD Lomenzo, L Collins, B Xu, LA Antunes, T Mikolajick, ...
Advanced Functional Materials 34 (40), 2405513, 2024
2024
Ferroelectric Al0.85Sc0.15N and Hf0.5Zr0.5O2 Domain Switching Dynamics
R Guido, X Wang, B Xu, R Alcala, T Mikolajick, U Schroeder, PD Lomenzo
ACS Applied Materials & Interfaces 16 (32), 42415-42425, 2024
2024
A Ferroelectric CMOS Microelectrode Array with ZrO2 Recording and Stimulation Sites for In-Vitro Neural Interfacing
MT Becker, A Corna, B Xu, U Schroeder, O Amft, S Keil, R Thewes, ...
2024 IEEE BioSensors Conference (BioSensors), 1-4, 2024
2024
Interaction Between Strain and Phase Formation in HfxZr1‐xO2 Thin Films
F Wunderwald, B Xu, A Kersch, KM Holsgrove, YC Kao, C Richter, ...
Small, 2408133, 0
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Статии 1–20