| Fabrication of electron beam physical vapor deposited polysilicon piezoresistive MEMS pressure sensor K Singh, R Joyce, S Varghese, J Akhtar Sensors and Actuators A: Physical 223, 151-158, 2015 | 78 | 2015 |
| Barrier height inhomogeneities induced anomaly in thermal sensitivity of Ni/4H-SiC Schottky diode temperature sensor V Kumar, AS Maan, J Akhtar Journal of Vacuum Science & Technology B 32 (4), 2014 | 78 | 2014 |
| A digital hygrometer for trace moisture measurement T Islam, AU Khan, J Akhtar, MZU Rahman IEEE Transactions on Industrial Electronics 61 (10), 5599-5605, 2014 | 77 | 2014 |
| Growth of residual stress-free ZnO films on SiO2/Si substrate at room temperature for MEMS devices J Singh, S Ranwa, J Akhtar, M Kumar AIP Advances 5 (6), 2015 | 70 | 2015 |
| Epitaxial 4H–SiC based Schottky diode temperature sensors in ultra-low current range V Kumar, J Verma, AS Maan, J Akhtar Vacuum 182, 109590, 2020 | 62 | 2020 |
| Diameter dependent thermal sensitivity variation trend in Ni/4H-SiC Schottky diode temperature sensors V Kumar, S Pawar, AS Maan, J Akhtar Journal of Vacuum Science & Technology B 33 (5), 2015 | 59 | 2015 |
| Distributed MEMS mass-sensor based on piezoelectric resonant micro-cantilevers P Joshi, S Kumar, VK Jain, J Akhtar, J Singh Journal of Microelectromechanical Systems 28 (3), 382-389, 2019 | 55 | 2019 |
| Synthesis, phase to phase deposition and characterization of rutile nanocrystalline titanium dioxide (TiO2) thin films SK Gupta, J Singh, K Anbalagan, P Kothari, RR Bhatia, PK Mishra, ... Applied Surface Science 264, 737-742, 2013 | 49 | 2013 |
| Synthesis and applications of ZnO nanowire: A review S Bagga, J Akhtar, S Mishra AIP Conference Proceedings 1989 (1), 2018 | 46 | 2018 |
| Capacitance roll‐off and frequency‐dispersion capacitance–conductance phenomena in field plate and guard ring edge‐terminated Ni/SiO2/4H‐nSiC Schottky … V Kumar, N Kaminski, AS Maan, J Akhtar physica status solidi (a) 213 (1), 193-202, 2016 | 46 | 2016 |
| Fabrication of poly (vinylidene fluoride-trifluoroethylene)–Zinc oxide based piezoelectric pressure sensor SC Karumuthil, K Singh, U Valiyaneerilakkal, J Akhtar, S Varghese Sensors and Actuators A: Physical 303, 111677, 2020 | 43 | 2020 |
| Investigation of structural and magnetic properties of Ni, NiFe and NiFe2O4 thin films J Singh, SK Gupta, AK Singh, P Kothari, RK Kotnala, J Akhtar Journal of Magnetism and Magnetic Materials 324 (6), 999-1005, 2012 | 42 | 2012 |
| Improved electrical parameters of vacuum annealed Ni/4H-SiC (0 0 0 1) Schottky barrier diode SK Gupta, A Azam, J Akhtar Physica B: Condensed Matter 406 (15-16), 3030-3035, 2011 | 42 | 2011 |
| MEMS impedance flow cytometry designs for effective manipulation of micro entities in health care applications M Kumar, S Yadav, A Kumar, NN Sharma, J Akhtar, K Singh Biosensors and Bioelectronics 142, 111526, 2019 | 41 | 2019 |
| Effect of semiconductor on sensitivity of a graphene-based surface plasmon resonance biosensor G Mohanty, J Akhtar, BK Sahoo Plasmonics 11, 189-196, 2016 | 41 | 2016 |
| Room temperature single walled carbon nanotubes (SWCNT) chemiresistive ammonia gas sensor BS Dasari, WR Taube, PB Agarwal, M Rajput, A Kumar, J Akhtar Sensors & Transducers 190 (7), 24, 2015 | 40 | 2015 |
| Capacitance–conductance spectroscopic investigation of interfacial oxide layer in Ni/4H–SiC (0 0 0 1) Schottky diode SK Gupta, B Shankar, WR Taube, J Singh, J Akhtar Physica B: Condensed Matter 434, 44-50, 2014 | 39 | 2014 |
| MeV ion-induced movement of lattice disorder in single crystallinesilicon P Sen, J Akhtar, FM Russell Europhysics Letters 51 (4), 401, 2000 | 39 | 2000 |
| An oscillator-based active bridge circuit for interfacing capacitive sensors with microcontroller compatibility AU Khan, T Islam, J Akhtar IEEE Transactions on Instrumentation and Measurement 65 (11), 2560-2568, 2016 | 37 | 2016 |
| Design, fabrication, and characterization of Ni/4H-SiC (0001) Schottky diodes array equipped with field plate and floating guard ring edge termination structures SK Gupta, N Pradhan, C Shekhar, J Akhtar IEEE transactions on semiconductor manufacturing 25 (4), 664-672, 2012 | 34 | 2012 |
Prof.(Dr.) Kulwant SinghShri Vishwakarma Skill University, PalwalCorreu electrònic verificat a svsu.ac.in
