Roger H. French

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Laura S. BruckmanAssociate Professor, Case Western Reserve University, Case School of Engineering, MaterialsCorreu electrònic verificat a case.edu
Wai-Yim ChingUniversity of Missouri-Kansas CityCorreu electrònic verificat a umkc.edu
Jennifer L. BraidPrincipal Member of Technical Staff, Sandia National LaboratoriesCorreu electrònic verificat a sandia.gov
Rudolf PodgornikChinese Academy of SciencesCorreu electrònic verificat a fmf.uni-lj.si
Alan CurranCorreu electrònic verificat a columbus.rr.com
Yet-Ming ChiangProfessor of Materials Science and Engineering, MITCorreu electrònic verificat a mit.edu
Fumio S. OhuchiUniverstiy of Washington, Professor of Materials Science & EngineeringCorreu electrònic verificat a uw.edu
Michael KempeNational Renewable Energy LaboratoryCorreu electrònic verificat a nrel.gov
Yinghui WuCase Western Reserve UniversityCorreu electrònic verificat a case.edu
Steve LustigNortheastern UniversityCorreu electrònic verificat a northeastern.edu
Jiqi LiuApple IncCorreu electrònic verificat a apple.com
Mohammad Akram HossainCase Western Reserve University, Cisco Systems, Q CELLS, Intel, PG&ECorreu electrònic verificat a pge.com
Ahmad Maroof KarimiOak Ridge National LaboratoryCorreu electrònic verificat a case.edu
Kristopher O. DavisUniversity of Central FloridaCorreu electrònic verificat a ucf.edu
Xiaohong Gunational institute of standards and technologyCorreu electrònic verificat a nist.gov
Nicole F. Steinmetz, Ph.D.UC San DiegoCorreu electrònic verificat a ucsd.edu
Klaus van BenthemUniversity of California, DavisCorreu electrònic verificat a ucdavis.edu
Hoang V. TranDuPont Electronics and ImagingCorreu electrònic verificat a dupont.com
Anand JagotaLehigh University, Bioengineering Department and Chemical & Biomolecular Engineering DepartmentCorreu electrònic verificat a lehigh.edu
Joshua S. SteinSandia National LaboratoriesCorreu electrònic verificat a sandia.gov

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Roger H. French

Kyocera Professor, Case Western Reserve University, Case School of Engineering, Materials Science

Correu electrònic verificat a case.edu - Pàgina d'inici

Materials Science Computer & Data Sciences Physics Biomedical Engineering Computer Science


Títol Ordena per cites Ordena per any Ordena per títol	Citada per Citada per	Any
Bulk electronic structure of Experiment and theory K Van Benthem, C Elsässer, RH French Journal of applied physics 90 (12), 6156-6164, 2001	1189	2001
Electronic Band Structure of Al₂O₃, with Comparison to Alon and AIN RH French Journal of the American Ceramic Society 73 (3), 477-489, 1990	682	1990
Experimental and theoretical determination of the electronic structure and optical properties of three phases of ZrO\textsubscript{2} RH French, SJ Glass, FS Ohuchi, YN Xu, WY Ching Physical Review B 49 (8), 5133, 1994	666	1994
Vibrational spectroscopy of aluminum nitride LE McNeil, M Grimsditch, RH French Journal of the American Ceramic Society 76 (5), 1132-1136, 1993	542	1993
Long range interactions in nanoscale science RH French, VA Parsegian, R Podgornik, RF Rajter, A Jagota, J Luo, ... Reviews of Modern Physics 82 (2), 1887-1944, 2010	490	2010
Origins and applications of London dispersion forces and Hamaker constants in ceramics RH French Journal of the American Ceramic Society 83 (9), 2117-2146, 2000	402	2000
Comparisons of Hamaker constants for ceramic systems with intervening vacuum or water: From force laws and physical properties HD Ackler, RH French, YM Chiang Journal of colloid and interface science 179 (2), 460-469, 1996	352	1996
Optical properties of aluminum oxide: determined from vacuum ultraviolet and electron energy‐loss spectroscopies RH French, H Müllejans, DJ Jones Journal of the American Ceramic Society 81 (10), 2549-2557, 1998	283	1998
Parametric tip model and force–distance relation for Hamaker constant determination from atomic force microscopy C Argento, RH French Journal of Applied Physics 80 (11), 6081-6090, 1996	269	1996
Method for providing nano-structures of uniform length RH French, T Gierke, MA Harmer, A Jagota, SR Lustig, RH Mehta, ... US Patent 6,998,358, 2006	253	2006
Optical properties of Teflon^® AF amorphous fluoropolymers MK Yang, RH French, EW Tokarsky Journal of Micro/Nanolithography, MEMS and MOEMS 7 (3), 033010-033010-9, 2008	219	2008
Method For Providing Nano-structures Of Uniform Length R French, T Gierke, M Harmer, P Hietpas, A Jagota, S Lustig, R Mehta, ... WO Patent 2,003,086,961, 2003	193	2003
Thin glass film between ultrafine conductor particles in thick‐film resistors YM Chiang, LA Silverman, RH French, RM Cannon Journal of the American Ceramic Society 77 (5), 1143-1152, 1994	185	1994
Temperature dependence of the electronic structure of oxides: MgO, MgAl\textsubscript{2}O\textsubscript{4} and Al\textsubscript{2}O\textsubscript{3} ML Bortz, RH French, DJ Jones, RV Kasowski, FS Ohuchi Physica Scripta 41 (4), 537, 1990	185	1990
Electronic structure of β-BaB\textsubscript{2}O\textsubscript{4} and LiB\textsubscript{3}O\textsubscript{5} nonlinear optical crystals RH French, JW Ling, FS Ohuchi, CT Chen Physical Review B 44 (16), 8496, 1991	171*	1991
Full spectral calculation of non-retarded Hamaker constants for ceramic systems from interband transition strengths RH French, RM Cannon, LK DeNoyer, YM Chiang Solid State Ionics 75, 13-33, 1995	164	1995
Heteroepitaxy of N-type β-Ga2O3 thin films on sapphire substrate by low pressure chemical vapor deposition S Rafique, L Han, AT Neal, S Mou, MJ Tadjer, RH French, H Zhao Applied Physics Letters 109 (13), 2016	161	2016
Multiple scattering from rutile TiO2 particles LE McNeil, RH French Acta materialia 48 (18-19), 4571-4576, 2000	142	2000
Optical properties and London dispersion interaction of amorphous and crystalline SiO\textsubscript{2} determined by vacuum ultraviolet GL Tan, MF Lemon, DJ Jones, RH French Physical Review-Section B-Condensed Matter 72 (20), 205117-205117, 2005	141*	2005
Optical reflectivity measurements using a laser plasma light source ML Bortz, RH French Applied Physics Letters 55 (19), 1955-1957, 1989	140	1989

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