| Wafer‐scale 2D hafnium diselenide based memristor crossbar array for energy‐efficient neural network hardware S Li, ME Pam, Y Li, L Chen, YC Chien, X Fong, D Chi, KW Ang Advanced Materials 34 (25), 2103376, 2022 | 154 | 2022 |
| An electro-photo-sensitive synaptic transistor for edge neuromorphic visual systems N Duan, Y Li, HC Chiang, J Chen, WQ Pan, YX Zhou, YC Chien, YH He, ... Nanoscale 11 (38), 17590-17599, 2019 | 88 | 2019 |
| Interface‐Modulated Resistive Switching in Mo‐Irradiated ReS2 for Neuromorphic Computing ME Pam, S Li, T Su, YC Chien, Y Li, YS Ang, KW Ang Advanced Materials 34 (30), 2202722, 2022 | 41 | 2022 |
| Enhancing Memory Window Efficiency of Ferroelectric Transistor for Neuromorphic Computing via Two‐Dimensional Materials Integration H Xiang, YC Chien, L Li, H Zheng, S Li, NT Duong, Y Shi, KW Ang Advanced Functional Materials 33 (42), 2304657, 2023 | 27 | 2023 |
| H2O adsorption on amorphous In-Ga-Zn-O thin-film transistors under negative bias stress J Yang, PY Liao, TC Chang, HC Chiang, BW Chen, YC Chien, D Lin, ... Applied Physics Letters 111 (7), 2017 | 25 | 2017 |
| Role of H2O Molecules in Passivation Layer of a-InGaZnO Thin Film Transistors YC Chien, TC Chang, HC Chiang, HM Chen, YC Tsao, CC Shih, ... IEEE Electron Device Letters 38 (4), 469-472, 2017 | 25 | 2017 |
| Dynamic Ferroelectric Transistor‐Based Reservoir Computing for Spatiotemporal Information Processing NT Duong, YC Chien, H Xiang, S Li, H Zheng, Y Shi, KW Ang Advanced Intelligent Systems 5 (6), 2300009, 2023 | 20 | 2023 |
| Abnormal hump in capacitance–voltage measurements induced by ultraviolet light in a-IGZO thin-film transistors YC Tsao, TC Chang, HM Chen, BW Chen, HC Chiang, GF Chen, ... Applied Physics Letters 110 (2), 2017 | 19 | 2017 |
| Application of 2D Materials in Hardware Security for Internet‐of‐Things: Progress and Perspective H Xiang, YC Chien, Y Shi, KW Ang Small Structures 3 (8), 2200060, 2022 | 14 | 2022 |
| Hydrogen as a cause of abnormal subchannel formation under positive bias temperature stress in a-InGaZnO thin-film transistors YC Chien, YC Yang, YC Tsao, HC Chiang, MC Tai, YL Tsai, PH Chen, ... IEEE Transactions on Electron Devices 66 (7), 2954-2959, 2019 | 14 | 2019 |
| A Dual‐Gate InGaZnO4‐Based Thin‐Film Transistor for High‐Sensitivity UV Detection PH Chen, YC Tsao, YC Chien, HC Chiang, HM Chen, YH Lu, CC Shih, ... Advanced Materials Technologies 4 (8), 1900106, 2019 | 13 | 2019 |
| A MoS2 Hafnium Oxide Based Ferroelectric Encoder for Temporal‐Efficient Spiking Neural Network YC Chien, H Xiang, Y Shi, NT Duong, S Li, KW Ang Advanced Materials 35 (2), 2204949, 2023 | 12 | 2023 |
| Origin of High Current and Illumination Stress Instability in Self-Aligned a-InGaZnO Thin Film Transistors With Al2O3 as High-κ Gate Dielectric YC Chien, HL Ramírez, S Steudel, C Rolin, R Pendurthi, TC Chang, ... IEEE Electron Device Letters 41 (4), 565-568, 2020 | 12 | 2020 |
| Improving reliability of high-performance ultraviolet sensor in a-InGaZnO thin-film transistors YL Tsai, YC Chien, TC Chang, YC Tsao, MC Tai, HY Tu, JJ Chen, ... IEEE Electron Device Letters 40 (9), 1455-1458, 2019 | 10 | 2019 |
| Coupled Ferroelectric‐Photonic Memory in a Retinomorphic Hardware for In‐Sensor Computing NT Duong, Y Shi, S Li, YC Chien, H Xiang, H Zheng, P Li, L Li, Y Wu, ... Advanced Science 11 (12), 2303447, 2024 | 8 | 2024 |
| Attack Resilient True Random Number Generators Using Ferroelectric‐Enhanced Stochasticity in 2D Transistor YC Chien, H Xiang, J Wang, Y Shi, X Fong, KW Ang Small 19 (38), 2302842, 2023 | 7 | 2023 |
| A comprehensive negative bias temperature instability model for gallium-nitride metal-insulator-semiconductor high electron mobility transistors from 77K to 393K TT Kuo, YC Chen, YS Lin, YC Chien, FM Ciou, PH Chen, TC Chang 2021 IEEE International Symposium on the Physical and Failure Analysis of …, 2021 | 7 | 2021 |
| Reliability test integrating electrical and mechanical stress at high temperature for a-InGaZnO thin film transistors YC Tsao, TC Chang, SP Huang, YL Tsai, YC Chien, MC Tai, HY Tu, ... IEEE Transactions on Device and Materials Reliability 19 (2), 433-436, 2019 | 7 | 2019 |
| Floating top gate-induced output enhancement of a-InGaZnO thin film transistors under single gate operations MC Tai, TC Chang, MC Chen, HC Chiang, YC Tsao, YC Chien, YX Wang, ... Applied Physics Letters 113 (17), 2018 | 7 | 2018 |
| Charge Carrier Mobility and Series Resistance Extraction in 2D Field‐Effect Transistors: Toward the Universal Technique YC Chien, X Feng, L Chen, KC Chang, WC Tan, S Li, L Huang, KW Ang Advanced Functional Materials 31 (41), 2105003, 2021 | 6 | 2021 |
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