Segueix
Jingzhong Fang
Jingzhong Fang
Department of Computer Science, Brunel University London
Correu electrònic verificat a brunel.ac.uk
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A survey of algorithms, applications and trends for particle swarm optimization
J Fang, W Liu, L Chen, S Lauria, A Miron, X Liu
Scilight Press, 2023
722023
An optimized CNN-BiLSTM network for bearing fault diagnosis under multiple working conditions with limited training samples
B Song, Y Liu, J Fang, W Liu, M Zhong, X Liu
Neurocomputing 574, 127284, 2024
582024
A two-stage integrated method for early prediction of remaining useful life of lithium-ion batteries
G Ma, Z Wang, W Liu, J Fang, Y Zhang, H Ding, Y Yuan
Knowledge-Based Systems 259, 110012, 2023
492023
A new particle swarm optimization algorithm for outlier detection: Industrial data clustering in wire arc additive manufacturing
J Fang, Z Wang, W Liu, S Lauria, N Zeng, C Prieto, F Sikström, X Liu
IEEE Transactions on Automation Science and Engineering 21 (2), 1244-1257, 2022
482022
Estimating the State of Health for Lithium-ion Batteries: A Particle Swarm Optimization-Assisted Deep Domain Adaptation Approach
G Ma, Z Wang, W Liu, J Fang, Y Zhang, H Ding, Y Yuan
IEEE/CAA Journal of Automatica Sinica 10 (7), 1530-1543, 2023
342023
Biased minimax probability machine-based adaptive regression for online analysis of gasoline property
K He, M Zhong, J Fang, Y Li
IEEE Transactions on Industrial Informatics 16 (4), 2799-2808, 2019
182019
Fault detection for a class of linear systems with integral measurements
X Zhu, Y Liu, J Fang, M Zhong
Science China Information Sciences 64, 1-10, 2021
112021
A new particle-swarm-optimization-assisted deep transfer learning framework with applications to outlier detection in additive manufacturing
J Fang, Z Wang, W Liu, L Chen, X Liu
Engineering Applications of Artificial Intelligence 131, 107700, 2024
52024
Class Imbalance Wafer Defect Pattern Recognition Based on Shared-database Decentralized Federated Learning Framework
Y Zhang, R Lan, X Li, J Fang, Z Ping, W Liu, Z Wang
IEEE Transactions on Instrumentation and Measurement, 2024
52024
En aquests moments el sistema no pot dur a terme l'operació. Torneu-ho a provar més tard.
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