| Overview of the IBM Blue Gene/P project G Almasi, S Asaad, RE Bellofatto, HR Bickford, MA Blumrich, B Brezzo, ... IBM Journal of Research and Development 52 (1-2), 199-220, 2008 | 220 | 2008 |
| System and method for executing compute-intensive database user-defined programs on an attached high-performance parallel computer R Natarajan, M Kochte US Patent 7,885,969, 2011 | 89 | 2011 |
| Fine-grained access management in reconfigurable scan networks R Baranowski, MA Kochte, HJ Wunderlich IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 82 | 2015 |
| Efficient fault simulation on many-core processors MA Kochte, M Schaal, HJ Wunderlich, CG Zoellin Proceedings of the 47th Design Automation Conference, 380-385, 2010 | 73 | 2010 |
| Reconfigurable scan networks: Modeling, verification, and optimal pattern generation R Baranowski, MA Kochte, HJ Wunderlich ACM Transactions on Design Automation of Electronic Systems (TODAES) 20 (2), 30, 2015 | 56 | 2015 |
| Modeling, verification and pattern generation for reconfigurable scan networks R Baranowski, MA Kochte, HJ Wunderlich 2012 IEEE International Test Conference, 1-9, 2012 | 56 | 2012 |
| Module diversification: Fault tolerance and aging mitigation for runtime reconfigurable architectures H Zhang, L Bauer, MA Kochte, E Schneider, C Braun, ME Imhof, ... 2013 IEEE International Test Conference (ITC), 1-10, 2013 | 54 | 2013 |
| Power-aware test generation with guaranteed launch safety for at-speed scan testing X Wen, K Enokimoto, K Miyase, Y Yamato, MA Kochte, S Kajihara, ... 29th VLSI Test Symposium, 166-171, 2011 | 44 | 2011 |
| Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience A Herkersdorf, H Aliee, M Engel, M Glaß, C Gimmler-Dumont, J Henkel, ... Microelectronics Reliability 54 (6-7), 1066-1074, 2014 | 43 | 2014 |
| FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects S Hellebrand, T Indlekofer, M Kampmann, MA Kochte, C Liu, ... 2014 International Test Conference, 1-8, 2014 | 42 | 2014 |
| Scan pattern retargeting and merging with reduced access time R Baranowski, MA Kochte, HJ Wunderlich 2013 18th IEEE European Test Symposium (ETS), 1-7, 2013 | 42 | 2013 |
| Concurrent self-test with partially specified patterns for low test latency and overhead MA Kochte, CG Zoellin, HJ Wunderlich 2009 14th IEEE European Test Symposium, 53-58, 2009 | 41 | 2009 |
| Aging Resilience and Fault Tolerance in Runtime Reconfigurable Architectures H Zhang, L Bauer, MA Kochte, E Schneider, HJ Wunderlich, J Henkel IEEE Transactions on Computers, 2016 | 40 | 2016 |
| Test Strategies for Reliable Runtime Reconfigurable Architectures L Bauer, C Braun, ME Imhof, MA Kochte, E Schneider, H Zhang, J Henkel, ... IEEE Transactions on Computers, 1, 2013 | 39 | 2013 |
| GPU-Accelerated Simulation of Small Delay Faults E Schneider, MA Kochte, S Holst, X Wen, HJ Wunderlich IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017 | 36 | 2017 |
| STRAP: Stress-Aware Placement for Aging Mitigation in Runtime Reconfigurable Architectures H Zhang, MA Kochte, E Schneider, L Bauer, HJ Wunderlich, J Henkel Proceedings of the IEEE/ACM International Conference on Computer-Aided …, 2015 | 35 | 2015 |
| Access Port Protection for Reconfigurable Scan Networks R Baranowski, MA Kochte, HJ Wunderlich Journal of Electronic Testing 30 (6), 711-723, 2014 | 35 | 2014 |
| Securing access to reconfigurable scan networks R Baranowski, MA Kochte, HJ Wunderlich 2013 22nd Asian Test Symposium, 295-300, 2013 | 33 | 2013 |
| Specification and verification of security in reconfigurable scan networks MA Kochte, M Sauer, LR Gomez, P Raiola, B Becker, HJ Wunderlich 2017 22nd IEEE European Test Symposium (ETS), 1-6, 2017 | 28 | 2017 |
| GUARD: GUAranteed Reliability in Dynamically Reconfigurable Systems H Zhang, MA Kochte, ME Imhof, L Bauer, HJ Wunderlich, J Henkel Proceedings of the The 51st Annual Design Automation Conference on Design …, 2014 | 27 | 2014 |
Hans-Joachim WunderlichProfessor Emeritus of Computer Science, University of StuttgartCorreu electrònic verificat a informatik.uni-stuttgart.de
