Sebastian Stach

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Ștefan ȚăluUniversitatea Tehnică din Cluj-Napoca, Direcția pentru Managementul Cercetării, Dezvoltării şiCorreu electrònic verificat a auto.utcluj.ro
Żaneta Garczyk-MundałaInstitute of Biomedical Engineering | Faculty of Science and Technology | Univeristy of SilesiaCorreu electrònic verificat a us.edu.pl
Stanisław RoskoszFaculty of Materials Engineering, Silesian University of TechnologyCorreu electrònic verificat a polsl.pl
Mihai TaluCorreu electrònic verificat a edu.ucv.ro
Atefeh GhaderiQuantum Technologies Research Center (QTRC), Science and Research Branch, Islamic Azad UniversityCorreu electrònic verificat a alzahra.ac.ir
Shahram SolaymaniHead of Quantum Technologies Research Center, Science and Research Branch, Islamic Azad UniversityCorreu electrònic verificat a srbiau.ac.ir
Seyed Mohammad ElahiProfessor of physics, science and research Branch, Islamic Azad UniversityCorreu electrònic verificat a srbiau.ac.ir
Wiktoria SapotaBiomedical Engineering and Materials Science and Engineering, University of SilesiaCorreu electrònic verificat a us.edu.pl
Zygmunt WróbelUniveristy of SilesiaCorreu electrònic verificat a us.edu.pl
Dr. Dinesh Pathak Ph. D. PDF (Europe)Univerzita Pardubice, Europe ; Queens University Canada ; University of West Indies; GNDU, IndiaCorreu electrònic verificat a upce.cz
Joanna MaszybrockaUniversity of Silesia in Katowice, Institute of Materials ScienceCorreu electrònic verificat a us.edu.pl
Carlos Luna CriadoUniversidad Autónoma de Nuevo León (UANL), Facultad de Ciencias Físico Matemáticas (FCFM), CICFiMCorreu electrònic verificat a uanl.edu.mx
Nader GhobadiPhysics Department, Faculty of Science, Malayer University, Malayer, IranCorreu electrònic verificat a malayeru.ac.ir
Rostam Moradianprofessor of physics, Razi University, Kermanshah, IranCorreu electrònic verificat a razi.ac.ir
Negin Beryani NezafatPostdoc, University of Duisburg-EssenCorreu electrònic verificat a uni-due.de
Asja ČelebićStomatološki fakultet Sveučilišta u ZagrebuCorreu electrònic verificat a sfzg.hr
Aman MahajanProfessor in Physics, Guru Nanak Dev University, AmritsarCorreu electrònic verificat a gndu.ac.in
Dr. Anshul Kumar SharmaDepartment of Higher Education, Govt. of Himachal Pradesh/Guru Nanak Dev University, AmritsarCorreu electrònic verificat a gndu.ac.in
Grzegorz DerczInstitute of Materials Engineering, Faculty of Science and Technology, University of SilesiaCorreu electrònic verificat a us.edu.pl
Denitsa ElenkovaСофийски УниверситетCorreu electrònic verificat a chem.uni-sofia.bg

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Sebastian Stach

University of Silesia in Katowice, Faculty of Science and Technology, Institute of Biomedical Engine

Correu electrònic verificat a us.edu.pl - Pàgina d'inici

biomedical engineering fracture surface multifractal analysis confocal microscopy


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AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates D Dallaeva, Ş Ţălu, S Stach, P Škarvada, P Tománek, L Grmela Applied Surface Science 312, 81-86, 2014	113	2014
Usefulness of 3D surface roughness parameters for nondestructive evaluation of pull-off adhesion of concrete layers J Hoła, Ł Sadowski, J Reiner, S Stach Construction and Building Materials 84, 111-120, 2015	107	2015
Characterization of ETL 9357FLA photomultiplier tubes for cryogenic temperature applications A Ankowski, M Antonello, P Aprili, F Arneodo, A Badertscher, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2006	83	2006
Multifractal description of fracture morphology: theoretical basis S Stach, J Cybo Materials characterization 51 (1), 79-86, 2003	80	2003
Stereometric parameters of the Cu/Fe NPs thin films S Stach, Z Garczyk, S Talu, S Solaymani, A Ghaderi, R Moradian, ... The Journal of Physical Chemistry C 119 (31), 17887-17898, 2015	79	2015
Morphological features in aluminum nitride epilayers prepared by magnetron sputtering S Stach, D Dallaeva, Ş Ţălu, P Kaspar, P Tománek, S Giovanzana, ... Materials Science-Poland 33 (1), 175-184, 2015	74	2015
Topographic characterization of Cu–Ni NPs@ aC: H films by AFM and multifractal analysis S Talu, S Stach, T Ghodselahi, A Ghaderi, S Solaymani, A Boochani, ... The Journal of Physical Chemistry B 119 (17), 5662-5670, 2015	73	2015
3-D surface stereometry studies of sputtered TiN thin films obtained at different substrate temperatures S Stach, W Sapota, Ş Ţălu, A Ahmadpourian, C Luna, N Ghobadi, ... Journal of Materials Science: Materials in Electronics 28, 2113-2122, 2017	69	2017
Surface morphology of titanium nitride thin films synthesized by DC reactive magnetron sputtering Ş Ţǎlu, S Stach, S Valedbagi, SM Elahi, R Bavadi Materials Science-Poland 33 (1), 137-143, 2015	64	2015
Multifractal spectra of atomic force microscope images of Cu/Fe nanoparticles based films thickness Ş Ţălu, S Stach, S Solaymani, R Moradian, A Ghaderi, MR Hantehzadeh, ... Journal of Electroanalytical Chemistry 749, 31-41, 2015	63	2015
Multifractal characterization of nanostructure surfaces of electrodeposited Ni-P coatings Ş Ţălu, S Stach, A Méndez, G Trejo, M Ţălu Journal of the Electrochemical Society 161 (1), D44, 2013	61	2013
Epitaxy of silicon carbide on silicon: Micromorphological analysis of growth surface evolution R Shikhgasan, Ţ Ştefan, S Dinara, S Sebastian, R Guseyn Superlattices and Microstructures 86, 395-402, 2015	58	2015
Surface roughness characterization of poly (methylmethacrylate) films with immobilized Eu (III) β-Diketonates by fractal analysis Ş Ţălu, S Stach, J Zaharieva, M Milanova, D Todorovsky, S Giovanzana International Journal of Polymer Analysis and Characterization 19 (5), 404-421, 2014	58	2014
Multifractal characteristics of titanium nitride thin films Ş Ţălu, S Stach, S Valedbagi, R Bavadi, SM Elahi, M Ţălu Materials Science-Poland 33 (3), 541-548, 2015	57	2015
Multifractal characterization of water soluble copper phthalocyanine based films surfaces Ş Ţălu, S Stach, A Mahajan, D Pathak, T Wagner, A Kumar, RK Bedi, ... Electronic Materials Letters 10, 719-730, 2014	57	2014
Multifractal analysis of drop‐casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates Ş Ţălu, S Stach, A Mahajan, D Pathak, T Wagner, A Kumar, RK Bedi Surface and Interface Analysis 46 (6), 393-398, 2014	57	2014
Morphology and optical properties of SiO2-based composite thin films with immobilized terbium (III) complex with a biscoumarin derivative D Elenkova, J Zaharieva, M Getsova, I Manolov, M Milanova, S Stach, ... International Journal of Polymer Analysis and Characterization 20 (1), 42-56, 2015	56	2015
Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation Ş Ţălu, Z Marković, S Stach, BT Marković, M Ţălu Applied Surface Science 289, 97-106, 2014	56	2014
Fracture surface--fractal or multifractal? S Stach, J Cybo, J Chmiela Materials Characterization 46 (2-3), 163-167, 2001	56	2001
Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al_0.08In_0.08Ga_0.84N thin film assessed by atomic force microscopy and fractal … Ş Ţălu, AJ Ghazai, S Stach, A Hassan, Z Hassan, M Ţălu Journal of Materials Science: Materials in Electronics 25, 466-477, 2014	54	2014

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