| Low power BIST for scan-shift and capture power Y Sato, S Wang, T Kato, K Miyase, S Kajihara 2012 IEEE 21st Asian Test Symposium, 173-178, 2012 | 53 | 2012 |
| Structure-based methods for selecting fault-detection-strengthened FF under multi-cycle test with sequential observation S Wang, HT Al-Awadhi, S Hamada, Y Higami, H Takahashi, H Iwata, ... 2016 IEEE 25th Asian Test Symposium (ATS), 209-214, 2016 | 28 | 2016 |
| Testing of interconnect defects in memory based reconfigurable logic device (MRLD) S Wang, Y Higami, H Takahashi, M Sato, M Katsu, S Sekiguchi 2017 IEEE 26th Asian Test Symposium (ATS), 17-22, 2017 | 14 | 2017 |
| Automotive functional safety assurance by POST with sequential observation S Wang, Y Higami, H Takahashi, H Iwata, J Matsushima IEEE Design & Test 35 (3), 39-45, 2018 | 12 | 2018 |
| A scan-out power reduction method for multi-cycle BIST S Wang, Y Sato, K Miyase, S Kajihara 2012 IEEE 21st Asian Test Symposium, 272-277, 2012 | 12 | 2012 |
| Genetic algorithm based approach for segmented testing X Fan, SM Reddy, S Wang, S Kajihara, Y Sato 2011 IEEE/IFIP 41st International Conference on Dependable Systems and …, 2011 | 9 | 2011 |
| A compact TRNG design for FPGA based on the metastability of RO-driven shift registers Q Peng, J Bian, Z Huang, S Wang, A Yan ACM Transactions on Design Automation of Electronic Systems 29 (1), 1-17, 2023 | 8 | 2023 |
| Design of true random number generator based on multi-ring convergence oscillator using short pulse enhanced randomness T Ni, Q Peng, J Bian, L Yao, Z Huang, A Yan, S Wang, X Wen IEEE Transactions on Circuits and Systems I: Regular Papers 70 (12), 5074-5085, 2023 | 8 | 2023 |
| A pattern partitioning algorithm for field test S Wang, S Kajihara, Y Sato, X Fan, SM Reddy Proc. 2nd Int'l Workshop on Reliability Aware System Design and Test (RASDAT …, 2011 | 8 | 2011 |
| Test point insertion for multi-cycle power-on self-test S Wang, X Zhou, Y Higami, H Takahashi, H Iwata, Y Maeda, ... ACM Transactions on Design Automation of Electronic Systems 28 (3), 1-21, 2023 | 7 | 2023 |
| Scan-out power reduction for logic BIST S Wang, Y Sato, S Kajihara, K Miyase IEICE TRANSACTIONS on Information and Systems 96 (9), 2012-2020, 2013 | 7 | 2013 |
| Capture-Pattern-Control to address the fault detection degradation problem of multi-cycle test in logic BIST S Wang, T Aono, Y Higami, H Takahashi, H Iwata, Y Maeda, ... 2018 IEEE 27th Asian Test Symposium (ATS), 155-160, 2018 | 6 | 2018 |
| Fault-detection-strengthened method to enable the POST for very-large automotive MCU in compliance with ISO26262 S Wang, Y Higami, H Takahashi, H Iwata, Y Maeda, J Matsushima 2018 IEEE 23rd European Test Symposium (ETS), 1-2, 2018 | 6 | 2018 |
| Physical power evaluation of low power logic-BIST scheme using test element group chip S Wang, Y Sato, S Kajihara, H Takahashi Journal of Low Power Electronics 11 (4), 528-540, 2015 | 6 | 2015 |
| Machine learning based fault diagnosis for stuck-at faults and bridging faults Y Higami, T Yamauchi, T Inamoto, S Wang, H Takahashi, KK Saluja 2022 37th International Technical Conference on Circuits/Systems, Computers …, 2022 | 4 | 2022 |
| MNN: A solution to implement neural networks into a memory-based reconfigurable logic device (MRLD) X Zhou, S Wang, Y Higami, H Takahashi, M Katsu, S Sekiguchi 2021 36th International Technical Conference on Circuits/Systems, Computers …, 2021 | 4 | 2021 |
| A Flexible Scan-in Power Control Method in Logic BIST and Its Evaluation with TEG Chips T Kato, S Wang, Y Sato, S Kajihara, X Wen IEEE Transactions on Emerging Topics in Computing 8 (3), 591-601, 2017 | 3 | 2017 |
| A flexible power control method for right power testing of scan-based logic BIST T Kato, S Wang, Y Sato, S Kajihara, X Wen 2016 IEEE 25th Asian Test Symposium (ATS), 203-208, 2016 | 3 | 2016 |
| A Low Area-Overhead and Low Delay Triple-Node-Upset Self-Recoverable Design Based on Stacked Transistors H Xu, J Li, R Ma, H Liang, C Liu, S Wang, X Wen IEEE Transactions on Device and Materials Reliability, 2024 | 2 | 2024 |
| Test Point Selection Using Deep Graph Convolutional Networks and Advantage Actor Critic (A2C) Reinforcement Learning S Wei, K Shiotani, S Wang, H Kai, Y Higami, H Takahashi, G Wang 2023 International Technical Conference on Circuits/Systems, Computers, and …, 2023 | 2 | 2023 |