| Induced giant piezoelectricity in centrosymmetric oxides DS Park, M Hadad, LM Riemer, R Ignatans, D Spirito, V Esposito, V Tileli, ... Science 375 (6581), 653-657, 2022 | 114 | 2022 |
| Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications D Jannis, C Hofer, C Gao, X Xie, A Béché, TJ Pennycook, J Verbeeck Ultramicroscopy 233, 113423, 2022 | 71 | 2022 |
| Atomically engineered interfaces yield extraordinary electrostriction H Zhang, N Pryds, DS Park, N Gauquelin, S Santucci, DV Christensen, ... Nature 609 (7928), 695-700, 2022 | 40 | 2022 |
| Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings A Velazco, A Béché, D Jannis, J Verbeeck Ultramicroscopy 232, 113398, 2022 | 39 | 2022 |
| Spatially controlled octahedral rotations and metal–insulator transitions in nickelate superlattices B Chen, N Gauquelin, RJ Green, JH Lee, C Piamonteze, M Spreitzer, ... Nano letters 21 (3), 1295-1302, 2021 | 35 | 2021 |
| Strain‐Engineered Metal‐to‐Insulator Transition and Orbital Polarization in Nickelate Superlattices Integrated on Silicon B Chen, N Gauquelin, D Jannis, DM Cunha, U Halisdemir, C Piamonteze, ... Advanced materials 32 (50), 2004995, 2020 | 34 | 2020 |
| Coupling charge and topological reconstructions at polar oxide interfaces TC van Thiel, W Brzezicki, C Autieri, JR Hortensius, D Afanasiev, ... Physical review letters 127 (12), 127202, 2021 | 30 | 2021 |
| Spectroscopic coincidence experiments in transmission electron microscopy D Jannis, K Müller-Caspary, A Béché, A Oelsner, J Verbeeck Applied physics letters 114 (14), 2019 | 30 | 2019 |
| Signatures of enhanced out-of-plane polarization in asymmetric BaTiO3 superlattices integrated on silicon B Chen, N Gauquelin, N Strkalj, S Huang, U Halisdemir, MD Nguyen, ... Nature communications 13 (1), 265, 2022 | 23 | 2022 |
| Real-time integration center of mass (riCOM) reconstruction for 4D STEM CP Yu, T Friedrich, D Jannis, S Van Aert, J Verbeeck Microscopy and Microanalysis 28 (5), 1526-1537, 2022 | 18 | 2022 |
| Coincidence detection of eels and edx spectral events in the electron microscope D Jannis, K Müller-Caspary, A Béché, J Verbeeck Applied Sciences 11 (19), 9058, 2021 | 17 | 2021 |
| Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science C Gao, C Hofer, D Jannis, A Béché, J Verbeeck, TJ Pennycook Applied Physics Letters 121 (8), 2022 | 16 | 2022 |
| Strain measurement in semiconductor FinFET devices using a novel moiré demodulation technique V Prabhakara, D Jannis, A Béché, H Bender, J Verbeeck Semiconductor Science and Technology 35 (3), 034002, 2020 | 16 | 2020 |
| Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process D Jannis, A Velazco, A Béché, J Verbeeck Ultramicroscopy 240, 113568, 2022 | 14 | 2022 |
| Optical versus electron diffraction imaging of Twist-angle in 2D transition metal dichalcogenide bilayers S Psilodimitrakopoulos, A Orekhov, L Mouchliadis, D Jannis, ... npj 2D Materials and Applications 5 (1), 77, 2021 | 12 | 2021 |
| Pattern formation by electric-field quench in a Mott crystal N Gauquelin, F Forte, D Jannis, R Fittipaldi, C Autieri, G Cuono, V Granata, ... Nano Letters 23 (17), 7782-7789, 2023 | 11 | 2023 |
| Physical properties of epitaxial SrMnO2. 5− δFγ oxyfluoride films J Wang, Y Shin, N Gauquelin, Y Yang, C Lee, D Jannis, J Verbeeck, ... Journal of Physics: Condensed Matter 31 (36), 365602, 2019 | 11 | 2019 |
| HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale V Prabhakara, D Jannis, G Guzzinati, A Béché, H Bender, J Verbeeck Ultramicroscopy 219, 113099, 2020 | 10 | 2020 |
| Deep learning for automated materials characterisation in core-loss electron energy loss spectroscopy A Annys, D Jannis, J Verbeeck Scientific Reports 13 (1), 13724, 2023 | 8 | 2023 |
| High-Strain-Induced Local Modification of the Electronic Properties of VO2 Thin Films YA Birkholzer, K Sotthewes, N Gauquelin, L Riekehr, D Jannis, ... ACS Applied Electronic Materials 4 (12), 6020-6028, 2022 | 8 | 2022 |
