Strained crystalline nanomechanical resonators with quality factors above 10 billion A Beccari, DA Visani, SA Fedorov, MJ Bereyhi, V Boureau, NJ Engelsen, ... Nature Physics 18 (4), 436-441, 2022 | 76 | 2022 |
Crystal growth of bullet-shaped magnetite in magnetotactic bacteria of the Nitrospirae phylum J Li, N Menguy, C Gatel, V Boureau, E Snoeck, G Patriarche, E Leroy, ... Journal of the Royal Society Interface 12 (103), 20141288, 2015 | 70 | 2015 |
Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopy. B Haas, JL Rouviere, V Boureau, R Berthier, D Cooper Ultramicroscopy 198, 58-72, 2019 | 62 | 2019 |
Effect of bias on the response of GaN axial p–n junction single-nanowire photodetectors S Cuesta, M Spies, V Boureau, F Donatini, M Hocevar, MI Den Hertog, ... Nano Letters 19 (8), 5506-5514, 2019 | 46 | 2019 |
Off-axis electron holography combining summation of hologram series with double-exposure phase-shifting: theory and application V Boureau, R McLeod, B Mayall, D Cooper Ultramicroscopy 193, 52-63, 2018 | 37 | 2018 |
High Performance Semiconducting Nanosheets via a Scalable Powder-Based Electrochemical Exfoliation Technique RA Wells, M Zhang, TH Chen, V Boureau, M Caretti, Y Liu, JH Yum, ... ACS nano 16 (4), 5719-5730, 2022 | 33 | 2022 |
Improved measurement of electric fields by nanobeam precession electron diffraction L Bruas, V Boureau, AP Conlan, S Martinie, JL Rouviere, D Cooper Journal of Applied Physics 127 (20), 2020 | 32 | 2020 |
High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast V Boureau, M Staňo, JL Rouviere, JC Toussaint, O Fruchart, D Cooper Journal of Physics D: Applied Physics 54 (8), 085001, 2020 | 24 | 2020 |
Three-dimensional measurement of Mg dopant distribution and electrical activity in GaN by correlative atom probe tomography and off-axis electron holography L Amichi, I Mouton, E Di Russo, V Boureau, F Barbier, A Dussaigne, ... Journal of Applied Physics 127 (6), 2020 | 22 | 2020 |
Imaging, modeling and engineering of strain in gate-all-around nanosheet transitors S Reboh, R Coquand, N Loubet, N Bernier, E Augendre, R Chao, J Li, ... 2019 IEEE International Electron Devices Meeting (IEDM), 11.5. 1-11.5. 4, 2019 | 22 | 2019 |
Determination of the internal piezoelectric potentials and indium concentration in InGaN based quantum wells grown on relaxed InGaN pseudo-substrates by off-axis electron … D Cooper, V Boureau, A Even, F Barbier, A Dussaigne Nanotechnology 31 (47), 475705, 2020 | 21 | 2020 |
In situ nucleation‐decoupled and site‐specific incorporation of Å‐scale pores in graphene via epoxidation S Huang, LF Villalobos, S Li, MT Vahdat, HY Chi, KJ Hsu, L Bondaz, ... Advanced Materials 34 (51), 2206627, 2022 | 19 | 2022 |
Bottom-up synthesis of graphene films hosting atom-thick molecular-sieving apertures LF Villalobos, C Van Goethem, KJ Hsu, S Li, M Moradi, K Zhao, ... Proceedings of the National Academy of Sciences 118 (37), e2022201118, 2021 | 18 | 2021 |
Correlative investigation of Mg doping in GaN layers grown at different temperatures by atom probe tomography and off-axis electron holography L Amichi, I Mouton, V Boureau, E Di Russo, P Vennegues, P De Mierry, ... Nanotechnology 31 (4), 045702, 2019 | 17 | 2019 |
Highly spatially resolved mapping of the piezoelectric potentials in InGaN quantum well structures by off-axis electron holography V Boureau, D Cooper Journal of Applied Physics 128 (15), 2020 | 16 | 2020 |
Strain/composition interplay in thin SiGe layers on insulator processed by Ge condensation V Boureau, D Benoit, B Warot, M Hÿtch, A Claverie Materials Science in Semiconductor Processing 42, 251-254, 2016 | 15 | 2016 |
Quantitative Mapping of the Charge Density in a Monolayer of MoS2 at Atomic Resolution by Off-Axis Electron Holography V Boureau, B Sklenard, R McLeod, D Ovchinnikov, D Dumcenco, A Kis, ... ACS nano 14 (1), 524-530, 2019 | 14 | 2019 |
Lattice contraction due to boron doping in silicon V Boureau, JM Hartmann, A Claverie Materials Science in Semiconductor Processing 87, 65-68, 2018 | 14 | 2018 |
Measuring electrical properties in semiconductor devices by pixelated STEM and off-axis electron holography (or convergent beams vs. plane waves). D Cooper, L Bruas, M Bryan, V Boureau Micron 179, 103594, 2024 | 11 | 2024 |
Hemoglobin-stabilized gold nanoclusters displaying oxygen transport ability, self-antioxidation, auto-fluorescence properties and long-term storage potential X Cun, MMT Jansman, X Liu, V Boureau, PW Thulstrup, L Hosta-Rigau RSC advances 13 (23), 15540-15553, 2023 | 10 | 2023 |