| Reducing false positives of static analysis for sei cert c coding standard TT Nguyen, P Maleehuan, T Aoki, T Tomita, I Yamada 2019 IEEE/ACM Joint 7th International Workshop on Conducting Empirical …, 2019 | 18 | 2019 |
| Code-centric learning-based just-in-time vulnerability detection S Nguyen, TT Nguyen, TT Vu, TD Do, KT Ngo, HD Vo Journal of Systems and Software 214, 112014, 2024 | 17 | 2024 |
| Arist: An effective api argument recommendation approach S Nguyen, CT Manh, KT Tran, TM Nguyen, TT Nguyen, KT Ngo, HD Vo Journal of Systems and Software 204, 111786, 2023 | 12 | 2023 |
| Variability fault localization: a benchmark KT Ngo, TT Nguyen, S Nguyen, HD Vo Proceedings of the 25th ACM International Systems and Software Product Line …, 2021 | 8 | 2021 |
| Context-based statement-level vulnerability localization TT Nguyen, HD Vo Information and Software Technology 169, 107406, 2024 | 7 | 2024 |
| A variability fault localization approach for software product lines TT Nguyen, KT Ngo, S Nguyen, HD Vo IEEE Transactions on Software Engineering 48 (10), 4100-4118, 2021 | 7 | 2021 |
| Multiple Program Analysis Techniques Enable Precise Check for SEI CERT C Coding Standard TT Nguyen, T Aoki, T Tomita, I Yamada 2019 26th Asia-Pacific Software Engineering Conference (APSEC), 70-77, 2019 | 7 | 2019 |
| Ranking Warnings of Static Analysis Tools Using Representation Learning KT Ngo, DT Do, TT Nguyen, HD Vo 2021 28th Asia-Pacific Software Engineering Conference (APSEC), 327-337, 2021 | 6 | 2021 |
| Detecting false-passing products and mitigating their impact on variability fault localization in software product lines TT Nguyen, KT Ngo, S Nguyen, HD Vo Information and Software Technology, 107080, 2022 | 4 | 2022 |
| Automated description generation for software patches TT Vu, TD Bui, TD Do, TT Nguyen, HD Vo, S Nguyen Information and Software Technology 177, 107543, 2025 | 3 | 2025 |
| RAMBO: Enhancing RAG-based Repository-Level Method Body Completion TD Bui, DT Luu-Van, TP Nguyen, TT Nguyen, S Nguyen, HD Vo arXiv preprint arXiv:2409.15204, 2024 | 3 | 2024 |
| An Empirical Study on Capability of Large Language Models in Understanding Code Semantics TT Nguyen, TT Vu, HD Vo, S Nguyen arXiv preprint arXiv:2407.03611, 2024 | 3 | 2024 |
| Detecting Coincidental Correctness and Mitigating Its Impacts on Localizing Variability Faults TT Nguyen, HD Vo 2022 14th International Conference on Knowledge and Systems Engineering (KSE …, 2022 | 3 | 2022 |
| API parameter recommendation based on language model and program analysis CT Manh, KT Trung, TM Nguyen, TT Nguyen, S Nguyen, HD Vo 2021 28th Asia-Pacific Software Engineering Conference (APSEC), 492-496, 2021 | 2 | 2021 |
| Practical approach to access the impact of global variables on program parallelism TT Nguyen, H Nguyen, QC Bui, PN Hung, DH Vo, S Takeuchi 2020 International Conference on Advanced Computing and Applications (ACOMP …, 2020 | 1 | 2020 |
| Automated program repair for variability bugs in software product line systems TT Nguyen, XY Zhang, P Arcaini, F Ishikawa, HD Vo Journal of Systems and Software 221, 112152, 2025 | | 2025 |
| Leveraging local and global relationships for corrupted label detection P Lam, HL Nguyen, XTD Dang, VS Tran, MD Le, TT Nguyen, S Nguyen, ... Future Generation Computer Systems, 107729, 2025 | | 2025 |
| Correctness Assessment of Code Generated by Large Language Models Using Internal Representations TD Bui, TT Vu, TT Nguyen, S Nguyen, HD Vo arXiv preprint arXiv:2501.12934, 2025 | | 2025 |
| Generating Critical Scenarios for Testing Automated Driving Systems TH Nguyen, TG Vuong, HN Duong, S Nguyen, HD Vo, T Aoki, TT Nguyen arXiv preprint arXiv:2412.02574, 2024 | | 2024 |
| CLUE: A CLUSTERING-BASED TEST REDUCTION APPROACH FOR SOFTWARE PRODUCT LINES HD Vo, TT Nguyen Journal of Computer Science and Cybernetics 40 (2), 165-185, 2024 | | 2024 |
Hieu Dinh VoVNUVerificeret mail på vnu.edu.vn
