| Failure Mode & Effect Analysis and another Methodology for Improving Data Veracity and Validity. C Herrera, Ana & Walshaw, Chris & Bailey Annals of Emerging Technologies in Computing (AETiC) 4 (3), 2020 | 5* | 2020 |
| Data driven predictive model to compact a production stop-on-fail test set for an electronic device A Hinojosa, S Stoyanov 2018 International Conference on Computing, Electronics & Communications …, 2018 | 4 | 2018 |
| Failure mode & effect analysis for improving data veracity and validity AE Hinojosa Herrera, C Walshaw, C Bailey, C Yin iCCECE 2019, 100-105, 2019 | 3* | 2019 |
| Data analytics to reduce stop-on-fail test in electronics manufacturing AEH Herrera, S Stoyanov, C Bailey, C Walshaw, C Yin Open Computer Science 9 (1), 200-211, 2019 | 3 | 2019 |
| Improving Black Box Classification Model Veracity for Electronics Anomaly Detection AEH Herrera, C Walshaw, C Bailey 2020 15th IEEE Conference on Industrial Electronics and Applications (ICIEA …, 2020 | 1 | 2020 |
| Solución exacta del problema diseño de redes multiproducto con arcos no dirigidos y capacidad finita AEH Herrera | | 2007 |