| New weighted time lag method for the analysis of random telegraph signals J Martin-Martinez, J Diaz, R Rodriguez, M Nafria, X Aymerich IEEE Electron Device Letters 35 (4), 479-481, 2014 | 78 | 2014 |
| A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI MN Javier Diaz-Fortuny, Javier Martin-Martinez, Rosana Rodriguez, Rafael ... IEEE Journal of Solid-State Circuits, 1-13, 2018 | 46* | 2018 |
| Flexible setup for the measurement of CMOS time-dependent variability with array-based integrated circuits J Diaz-Fortuny, P Saraza-Canflanca, R Castro-Lopez, E Roca, ... IEEE Transactions on Instrumentation and Measurement 69 (3), 853-864, 2019 | 29 | 2019 |
| Analysis of Set and Reset mechanisms in Ni/HfO2-based RRAM with fast ramped voltages M Maestro, J Martin-Martinez, J Diaz, A Crespo-Yepes, MB Gonzalez, ... Microelectronic Engineering 147, 176-179, 2015 | 29 | 2015 |
| New high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM M Maestro, J Diaz, A Crespo-Yepes, MB Gonzalez, J Martin-Martinez, ... Solid-State Electronics 115, 140-145, 2016 | 27 | 2016 |
| TARS: A toolbox for statistical reliability modeling of CMOS devices J Diaz-Fortuny, J Martín-Martínez, R Rodríguez, M Nafria, R Castro-López, ... 2017 14th International Conference on Synthesis, Modeling, Analysis and …, 2017 | 17 | 2017 |
| A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging J Diaz-Fortuny, J Martín-Martínez, R Rodríguez, M Nafria, R Castro-López, ... 2017 14th International Conference on Synthesis, Modeling, Analysis and …, 2017 | 16 | 2017 |
| Characterization of random telegraph noise and its impact on reliability of SRAM sense amplifiers J Martin-Martinez, J Diaz, R Rodríguez, M Nafria, X Aymerich, E Roca, ... 2014 5th European Workshop on CMOS Variability (VARI), 1-6, 2014 | 14 | 2014 |
| A ring-oscillator-based degradation monitor concept with tamper detection capability J Diaz-Fortuny, P Saraza-Canflanca, E Bury, M Vandemaele, B Kaczer, ... 2022 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2022 | 13 | 2022 |
| A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level P Saraza-Canflanca, J Diaz-Fortuny, R Castro-López, E Roca, ... Integration 72, 13-20, 2020 | 13 | 2020 |
| Modeling and Understanding the Compact Performance of h‐BN Dual‐Gated ReS2 Transistor K Lee, J Choi, B Kaczer, A Grill, JW Lee, S Van Beek, E Bury, ... Advanced Functional Materials 31 (23), 2100625, 2021 | 12 | 2021 |
| A model parameter extraction methodology including time-dependent variability for circuit reliability simulation J Diaz-Fortuny, P Saraza-Canflanca, A Toro-Frías, R Castro-López, ... 2018 15th International Conference on Synthesis, Modeling, Analysis and …, 2018 | 12 | 2018 |
| Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability VM Van Santen, J Diaz-Fortuny, H Amrouch, J Martin-Martinez, ... 2018 IEEE International Reliability Physics Symposium (IRPS), P-CR. 6-1-P-CR …, 2018 | 11 | 2018 |
| Calibrated fast thermal calculation and experimental characterization of advanced BEOL stacks X Chang, H Oprins, M Lofrano, V Cherman, B Vermeersch, JD Fortuny, ... 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE …, 2023 | 10 | 2023 |
| A smart noise-and RTN-removal method for parameter extraction of CMOS aging compact models J Diaz-Fortuny, J Martin-Martinez, R Rodriguez, R Castro-Lopez, E Roca, ... Solid-State Electronics 159, 99-105, 2019 | 9 | 2019 |
| Design considerations of an SRAM array for the statistical validation of time-dependent variability models P Saraza-Canflanca, D Malagon, F Passos, A Toro, J Núñez, ... 2018 15th International Conference on Synthesis, Modeling, Analysis and …, 2018 | 9 | 2018 |
| A new time efficient methodology for the massive characterization of RTN in CMOS devices G Pedreira, J Martín-Martínez, J Diaz-Fortuny, P Saraza-Canflanca, ... 2019 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2019 | 8 | 2019 |
| New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors P Saraza-Canflanca, J Diaz-Fortuny, R Castro-López, E Roca, ... 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 150-155, 2019 | 8 | 2019 |
| Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions J Diaz-Fortuny, P Saraza-Canflanca, R Rodriguez, J Martin-Martinez, ... Solid-State Electronics 185, 108037, 2021 | 7 | 2021 |
| TiDeVa: a toolbox for the automated and robust analysis of Time-Dependent Variability at transistor level P Saraza-Canflanca, J Diaz-Fortuny, R Castro-López, E Roca, ... 2019 16th International Conference on Synthesis, Modeling, Analysis and …, 2019 | 6 | 2019 |
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