Scott David Findlay

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Naoya ShibataThe University of TokyoVerificeret mail på sigma.t.u-tokyo.ac.jp
Adrian D'AlfonsoUniversity of Melbourne School of PhysicsVerificeret mail på dalfonso.com.au
James LeBeauAssociate Professor, Massachusetts Institute of TechnologyVerificeret mail på mit.edu
Stephen PennycookUniversity of TennesseeVerificeret mail på utk.edu
Teruyasu MizoguchiInstitute of Industrial Science, The University of TokyoVerificeret mail på iis.u-tokyo.ac.jp
Hamish G BrownIan Holmes Imaging Centre, Bio21 Institute, The University of MelbourneVerificeret mail på unimelb.edu.au
Matthew WeylandAssociate Professor, Monash UniversityVerificeret mail på monash.edu
Zhen ChenInstitute of Physics, Chinese Academy of SciencesVerificeret mail på iphy.ac.cn
Takehito SekiThe University of TokyoVerificeret mail på sigma.t.u-tokyo.ac.jp
Peter NellistProfessor of Materials, University of OxfordVerificeret mail på materials.ox.ac.uk
Yukihito KondoResearcher in JEOL Ltd.Verificeret mail på jeol.co.jp
Nathan LuggThe University of TokyoVerificeret mail på sigma.t.u-tokyo.ac.jp
Gabriel Sánchez-SantolinoDepartment of Materials Physics, Universidad Complutense de Madrid (ORCID: 0000-0001-8036-707X)Verificeret mail på ucm.es
Timothy PetersenMonash Centre for Electron Microscopy, Monash UniversityVerificeret mail på monash.edu
Klaus van BenthemUniversity of California, DavisVerificeret mail på ucdavis.edu
Colin OphusNational Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National LabVerificeret mail på lbl.gov
Maria VarelaUniversidad Complutense MadridVerificeret mail på ucm.es
Benjamin D ForbesUniversity of MelbourneVerificeret mail på unimelb.edu.au
Albina BorisevichOak Ridge National laboratoryVerificeret mail på ornl.gov
Michael J MorganMonash UniversityVerificeret mail på monash.edu

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Scott David Findlay

Monash University

Verificeret mail på monash.edu - Startside

Electron diffraction and imaging


Titel Sortér efter henvisninger Sortér efter årstal Sortér efter titel	Citeret af Citeret af	År
Dynamics of annular bright field imaging in scanning transmission electron microscopy SD Findlay, N Shibata, H Sawada, E Okunishi, Y Kondo, Y Ikuhara Ultramicroscopy 110 (7), 903-923, 2010	518	2010
Differential phase-contrast microscopy at atomic resolution N Shibata, SD Findlay, Y Kohno, H Sawada, Y Kondo, Y Ikuhara Nature Physics 8 (8), 611-615, 2012	474	2012
Quantitative atomic resolution scanning transmission electron microscopy JM LeBeau, SD Findlay, LJ Allen, S Stemmer Physical Review Letters 100 (20), 206101, 2008	461	2008
Robust atomic resolution imaging of light elements using scanning transmission electron microscopy SD Findlay, N Shibata, H Sawada, E Okunishi, Y Kondo, T Yamamoto, ... Applied Physics Letters 95 (19), 2009	431	2009
Spectroscopic imaging of single atoms within a bulk solid M Varela, SD Findlay, AR Lupini, HM Christen, AY Borisevich, N Dellby, ... Physical Review Letters 92 (9), 095502, 2004	391	2004
Two-dimensional mapping of chemical information at atomic resolution M Bosman, VJ Keast, JL Garcia-Munoz, AJ D’Alfonso, SD Findlay, ... Physical Review Letters 99 (8), 086102, 2007	320	2007
Three-dimensional imaging of individual hafnium atoms inside a semiconductor device K Van Benthem, AR Lupini, M Kim, HS Baik, SJ Doh, JH Lee, MP Oxley, ... Applied Physics Letters 87 (3), 2005	293	2005
Position averaged convergent beam electron diffraction: Theory and applications JM LeBeau, SD Findlay, LJ Allen, S Stemmer Ultramicroscopy 110 (2), 118-125, 2010	269	2010
Standardless atom counting in scanning transmission electron microscopy JM LeBeau, SD Findlay, LJ Allen, S Stemmer Nano letters 10 (11), 4405-4408, 2010	268	2010
Modelling the inelastic scattering of fast electrons LJ Allen, SD Findlay Ultramicroscopy 151, 11-22, 2015	253	2015
Lattice-resolution contrast from a focused coherent electron probe. Part I LJ Allen, SD Findlay, MP Oxley, CJ Rossouw Ultramicroscopy 96 (1), 47-63, 2003	244	2003
Atomic Structure of a CeO₂ Grain Boundary: The Role of Oxygen Vacancies H Hojo, T Mizoguchi, H Ohta, SD Findlay, N Shibata, T Yamamoto, ... Nano letters 10 (11), 4668-4672, 2010	230	2010
Electric field imaging of single atoms N Shibata, T Seki, G Sánchez-Santolino, SD Findlay, Y Kohno, ... Nature communications 8 (1), 15631, 2017	190	2017
Quantum mechanical model for phonon excitation in electron diffraction and imaging using a Born-Oppenheimer approximation BD Forbes, AV Martin, SD Findlay, AJ D’Alfonso, LJ Allen Physical Review B—Condensed Matter and Materials Physics 82 (10), 104103, 2010	176	2010
New area detector for atomic-resolution scanning transmission electron microscopy N Shibata, Y Kohno, SD Findlay, H Sawada, Y Kondo, Y Ikuhara Journal of electron microscopy 59 (6), 473-479, 2010	171	2010
Oxygen-vacancy ordering at surfaces of lithium manganese (III, IV) oxide spinel nanoparticles R Huang, Y Ikuhara, T Mizoguchi, S Findlay, A Kuwabara, C Fisher, ... Angewandte Chemie-International Edition 50 (13), 3053-3057, 2011	169	2011
Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons R Close, Z Chen, N Shibata, SD Findlay Ultramicroscopy 159, 124-137, 2015	166	2015
Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy K van Benthem, AR Lupini, MP Oxley, SD Findlay, LJ Allen, ... Ultramicroscopy 106 (11-12), 1062-1068, 2006	162	2006
Atomic-scale imaging of individual dopant atoms in a buried interface N Shibata, SD Findlay, S Azuma, T Mizoguchi, T Yamamoto, Y Ikuhara Nature Materials 8 (8), 654-658, 2009	152	2009
Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy N Shibata, SD Findlay, H Sasaki, T Matsumoto, H Sawada, Y Kohno, ... Scientific reports 5 (1), 10040, 2015	151	2015

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