| Hardness, toughness, and scratchability of germanium–selenium chalcogenide glasses JP Guin, T Rouxel, JC Sanglebœuf, I Melscoët, J Lucas Journal of the American Ceramic Society 85 (6), 1545-1552, 2002 | 337 | 2002 |
| Indentation creep of Ge–Se chalcogenide glasses below Tg: elastic recovery and non-Newtonian flow JP Guin, T Rouxel, V Keryvin, JC Sanglebœuf, I Serre, J Lucas Journal of non-crystalline solids 298 (2-3), 260-269, 2002 | 255 | 2002 |
| Indentation deformation mechanism in glass: densification versus shear flow T Rouxel, H Ji, JP Guin, F Augereau, B Rufflé Journal of applied physics 107 (9), 2010 | 228 | 2010 |
| Fracture of silicate glasses: ductile or brittle? JP Guin, SM Wiederhorn Physical review letters 92 (21), 215502, 2004 | 135 | 2004 |
| Perfectly Transparent Sr3Al2O6 Polycrystalline Ceramic Elaborated from Glass Crystallization S Alahraché, K Al Saghir, S Chenu, E Veron, D de Sousa Meneses, ... Chemistry of Materials 25 (20), 4017-4024, 2013 | 76 | 2013 |
| Effect of water penetration on the strength and toughness of silica glass SM Wiederhorn, T Fett, G Rizzi, S Fünfschilling, MJ Hoffmann, JP Guin Journal of the American Ceramic Society 94, s196-s203, 2011 | 75 | 2011 |
| Optical waveguide based on amorphous Er3+-doped Ga–Ge–Sb–S (Se) pulsed laser deposited thin films V Nazabal, P Němec, AM Jurdyc, S Zhang, F Charpentier, H Lhermite, ... Thin Solid Films 518 (17), 4941-4947, 2010 | 72 | 2010 |
| Sputtering and Pulsed Laser Deposition for Near‐ and Mid‐Infrared Applications: A Comparative Study of Ge25Sb10S65 and Ge25Sb10Se65 Amorphous … V Nazabal, F Charpentier, JL Adam, P Nemec, H Lhermite, ... International Journal of Applied Ceramic Technology 8 (5), 990-1000, 2011 | 68 | 2011 |
| Surface damage resistance of gel‐derived oxycarbide glasses: hardness, toughness, and scratchability T Rouxel, JC Sanglebœuf, JP Guin, V Keryvin, GD Soraru Journal of the American Ceramic Society 84 (10), 2220-2224, 2001 | 64 | 2001 |
| RF sputtered amorphous chalcogenide thin films for surface enhanced infrared absorption spectroscopy F Verger, V Nazabal, F Colas, P Němec, C Cardinaud, E Baudet, ... Optical Materials Express 3 (12), 2112-2131, 2013 | 63 | 2013 |
| Surface enhanced infrared absorption (SEIRA) spectroscopy using gold nanoparticles on As2S3 glass F Verger, T Pain, V Nazabal, C Boussard-Plédel, B Bureau, F Colas, ... Sensors and Actuators B: Chemical 175, 142-148, 2012 | 63 | 2012 |
| Constitutive modeling of the densification process in silica glass under hydrostatic compression V Keryvin, JX Meng, S Gicquel, JP Guin, L Charleux, JC Sangleboeuf, ... Acta Materialia 62, 250-257, 2014 | 56 | 2014 |
| Water penetration—its effect on the strength and toughness of silica glass SM Wiederhorn, T Fett, G Rizzi, MJ Hoffmann, JP Guin Metallurgical and Materials Transactions A 44, 1164-1174, 2013 | 56 | 2013 |
| Crack growth threshold in soda lime silicate glass: role of hold-time JP Guin, SM Wiederhorn Journal of non-crystalline solids 316 (1), 12-20, 2003 | 52 | 2003 |
| Explosive cladding of a thin Ni-film to an aluminium alloy M Gerland, HN Presles, JP Guin, D Bertheau Materials Science and Engineering: A 280 (2), 311-319, 2000 | 51 | 2000 |
| Griffith cracks at the nanoscale SM Wiederhorn, T Fett, JP Guin, M Ciccotti International Journal of Applied Glass Science 4 (2), 76-86, 2013 | 50 | 2013 |
| The effect of water penetration on crack growth in silica glass SM Wiederhorn, T Fett, G Rizzi, MJ Hoffmann, JP Guin Engineering Fracture Mechanics 100, 3-16, 2013 | 49 | 2013 |
| Temperature dependence of the mechanical behaviour of a GeAsSe glass E Le Bourhis, P Gadaud, JP Guin, N Tournerie, XH Zhang, J Lucas, ... Scripta materialia 45 (3), 317-323, 2001 | 49 | 2001 |
| A method for measuring the contact area in instrumented indentation testing by tip scanning probe microscopy imaging L Charleux, V Keryvin, M Nivard, JP Guin, JC Sangleboeuf, Y Yokoyama Acta Materialia 70, 249-258, 2014 | 47 | 2014 |
| Locally enhanced dissolution rate as a probe for nanocontact-induced densification in oxide glasses YF Niu, K Han, JP Guin Langmuir 28 (29), 10733-10740, 2012 | 47 | 2012 |
Sheldon WiederhornNational Institute of Standards and TechnologyBestätigte E-Mail-Adresse bei nist.gov
