Study of diluted magnetic semiconductor: Co-doped ZnO HJ Lee, SY Jeong, CR Cho, CH Park
Applied Physics Letters 81 (21), 4020-4022, 2002
882 2002 Room-temperature ferromagnetism in Cr-doped GaN single crystals SE Park, HJ Lee, YC Cho, SY Jeong, CR Cho, S Cho
Applied Physics Letters 80 (22), 4187-4189, 2002
224 2002 Hydrogen-induced ferromagnetism in ZnCoO HJ Lee, CH Park, SY Jeong, KJ Yee, CR Cho, MH Jung, DJ Chadi
Applied physics letters 88 (6), 2006
136 2006 A study of magnetic and optical properties of Cu‐doped ZnO HJ Lee, BS Kim, CR Cho, SY Jeong
physica status solidi (b) 241 (7), 1533-1536, 2004
108 2004 The structural and optical behaviors of K-doped SK Kim, SA Kim, CH Lee, HJ Lee, SY Jeong, CR Cho
Applied Physics Letters 85 (3), 419-421, 2004
73 2004 Ferromagnetism in Li co-doped ZnO: Cr HJ Lee, SY Jeong, JY Hwang, CR Cho
Europhysics Letters 64 (6), 797, 2003
53 2003 Role of Hydrogen in Active Layer of Oxide-Semiconductor-Based Thin Film Transistors HY Noh, J Kim, JS Kim, MJ Lee, HJL Lee
Crystals 9, 75, 2019
39 2019 Reliable Multivalued Conductance States in TaOx MJ Lee, GS Park, DH Seo, SM Kwon, HJ Lee, JS Kim, MK Jung, CY You, ...
ACS applied materials & interfaces 10 (35), 29757-29765, 2018
39 2018 Gate-controlled magnetic properties of the magnetic semiconductor (Zn, Co) O HJ Lee, E Helgren, F Hellman
Applied physics letters 94 (21), 2009
35 2009 The formation of precipitates in the ZnCoO system HJ Lee, SH Choi, CR Cho, HK Kim, SY Jeong
Europhysics Letters 72 (1), 76, 2005
31 2005 Analysis of the hump phenomenon and needle defect states formed by driving stress in the oxide semiconductor HJ Lee, K Abe, HY Noh, JS Kim, H Lee, MJ Lee
Scientific Reports 9 (1), 11977, 2019
25 2019 Impact of transient currents caused by alternating drain stress in oxide semiconductors HJ Lee, SH Cho, K Abe, MJ Lee, M Jung
Scientific Reports 7 (1), 9782, 2017
24 2017 Measurement of Exciton and Trion Energies in Multistacked hBN/WS2 Coupled Quantum Wells for Resonant Tunneling Diodes MJ Lee, DH Seo, SM Kwon, D Kim, Y Kim, WS Yun, JH Cha, HK Song, ...
ACS nano 14 (11), 16114-16121, 2020
18 2020 Degradation model of a-IGZO TFT due to high drain bias stress K Kim, S Jeon, H Lee, M Seo, H Cho, B Choi
ecs Journal of solid state science and technology 8 (7), Q3242, 2019
17 2019 Electron-blocking by the potential barrier originated from the asymmetrical local density of state in the oxide semiconductor HJ Lee, K Abe, JS Kim, MJ Lee
Scientific Reports 7 (1), 17963, 2017
13 2017 Electron-Mediated Ferromagnetic Behavior in HJ Lee, C Bordel, J Karel, DW Cooke, M Charilaou, F Hellman
Physical Review Letters 110 (8), 087206, 2013
13 2013 Hydrogen diffusion and its electrical properties variation as a function of the IGZO stacking structure HY Noh, WG Lee, H GR, JH Cha, JS Kim, WS Yun, MJ Lee, HJ Lee
Scientific Reports 12 (1), 19816, 2022
12 2022 Influence of impurities on the structural and magnetic properties in ZnO HJ Lee, SK Kim, CR Cho, SJ Kim, SY Jeong
Journal of the Korean Physical Society 46 (9), 34, 2005
11 2005 A study on the effect of pulse rising and falling time on amorphous oxide semiconductor transistors in driver circuits HJ Lee, K Abe
IEEE Electron Device Letters 41 (6), 896-899, 2020
10 2020 Scaling of the anomalous Hall effect in lower conductivity regimes J Karel, C Bordel, DS Bouma, A de Lorimier-Farmer, HJ Lee, F Hellman
Europhysics Letters 114 (5), 57004, 2016
10 2016 