| NBTI degradation and its impact for analog circuit reliability NK Jha, PS Reddy, DK Sharma, VR Rao IEEE Transactions on Electron Devices 52 (12), 2609-2615, 2005 | 135 | 2005 |
| Optimization and realization of sub-100-nm channel length single halo p-MOSFETs DG Borse, MR Kn, NK Jha, AN Chandorkar, J Vasi, VR Rao, B Cheng, ... IEEE Transactions on Electron Devices 49 (6), 1077-1079, 2002 | 68 | 2002 |
| A new oxide trap-assisted NBTI degradation model NK Jha, VR Rao IEEE Electron Device Letters 26 (9), 687-689, 2005 | 36 | 2005 |
| Prediction for NBTI Degradation for Circuit Under AC Operation YS Tsai, NK Jha, YH Lee IRPS, 665-669, 2010 | 21 | 2010 |
| Sustainable production system: literature review and trends NVK Jasti, NK Jha, PK Chaganti, S Kota Management of Environmental Quality: An International Journal 33 (3), 692-717, 2022 | 15 | 2022 |
| A new drain voltage enhanced NBTI degradation mechanism [pMOSFETs] NK Jha, PS Reddy, VR Rao 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings …, 2005 | 15 | 2005 |
| Magnetic and electric properties of nanoparticles of Ni-substituted ferrites synthesized using a microwave refluxing process NK Prasad, A Naulakha, N Jha, SS Meena, D Bahadur, O Prakash, ... International journal of materials research 104 (7), 680-685, 2013 | 13 | 2013 |
| Reinvestigation of Gate Oxide Breakdown on Logic Circuit Reliability YC Huang, TY Yew, W Wang, YH Lee, R Ranjan, NK Jha, PJ Liao, ... IRPS, 2A.4.1-2A.4.6, 2011 | 13 | 2011 |
| Estimation of abrasive wear of nanostructured WC-10Co-4Cr TIG weld cladding using neural network and fuzzy logic approach UMR Paturi, DG Vanga, S Cheruku, ST Palakurthy, NK Jha Materials Today: Proceedings 78, 449-457, 2023 | 12 | 2023 |
| Performance and reliability of single halo deep sub-micron p-MOSFETs for analog applications NK Jha, MS Baghini, VR Rao Proceedings of the 9th International Symposium on the Physical and Failure …, 2002 | 7 | 2002 |
| Optimization of single halo p-MOSFET implant parameters for improved analog performance and reliability NK Jha, V Ramgopal Rao, JCS Woo Proceedings of the 32nd European Solid-State Device Research Conference …, 2002 | 7 | 2002 |
| Methodology for bias temperature instability test JR Shih, NK Jha, R Ranjan, NK Emani US Patent 7,759,962, 2010 | 6 | 2010 |
| Validity and reliability of sustainable supply chain management frameworks in Indian smart manufacturing industries NK Jha, NVK Jasti, PK Chaganti, S Kota, L Vijayvargy Management of Environmental Quality: An International Journal 34 (4), 865-901, 2023 | 5 | 2023 |
| Design methodology and analysis of double cavity metal-plastic-insert injection molding die for push board pin NK Jha, PV Ramana CVR Journal of Science and Technology 14, 91-96, 2018 | 4 | 2018 |
| Design and structural analysis of plastic chain link with polypropylene and polyoxymethylene material NK Jha, G Avinash, V Siddharth Materials Today: Proceedings 38, 3066-3076, 2021 | 3 | 2021 |
| Design and Process Analysis of Single Cavity Injection Molding Die for Plastic Wing Nut NK Jha, GB Reddy, V Kumar CVR Journal of Science and Technology 20 (1), 129-134, 2021 | 2 | 2021 |
| Design and analysis of welding fixture for elementary weld joints NK Jha CVR Journal of Science and Technology 15, 90-95, 2018 | 2 | 2018 |
| Understanding the NBTI degradation in halo-doped channel p-MOSFETs NK Jha, VR Rao Proceedings of the 11th International Symposium on the Physical and Failure …, 2004 | 2 | 2004 |
| An empirical study on implementation of sustainable production practices in Indian manufacturing industry NK Jha, NVK Jasti, PK Chaganti, S Kota, G Nagpal The TQM Journal 36 (8), 2570-2598, 2024 | 1 | 2024 |
| Design and Analysis of Injection Mold for Plastic Rivet with Buttress Thread Profile: DFM Approach NK Jha, V Kumar CVR Journal of Science and Technology 22 (1), 84-89, 2022 | 1 | 2022 |
