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Hoffmann Patrik
Hoffmann Patrik
head of laboratory
Bestätigte E-Mail-Adresse bei empa.ch
Titel
Zitiert von
Zitiert von
Jahr
Gas-assisted focused electron beam and ion beam processing and fabrication
I Utke, P Hoffmann, J Melngailis
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2008
13022008
A snake-based approach to accurate determination of both contact points and contact angles
AF Stalder, G Kulik, D Sage, L Barbieri, P Hoffmann
Colloids and surfaces A: physicochemical and engineering aspects 286 (1-3 …, 2006
10752006
Water wetting transition parameters of perfluorinated substrates with periodically distributed flat-top microscale obstacles
L Barbieri, E Wagner, P Hoffmann
Langmuir 23 (4), 1723-1734, 2007
4292007
Comparison of mechanically drawn and protection layer chemically etched optical fiber tips
P Hoffmann, B Dutoit, RP Salathé
Ultramicroscopy 61 (1-4), 165-170, 1995
3971995
Effect of COVID-19 pandemic lockdowns on planned cancer surgery for 15 tumour types in 61 countries: an international, prospective, cohort study
J Glasbey, A Ademuyiwa, A Adisa, E AlAmeer, AP Arnaud, F Ayasra, ...
The Lancet Oncology 22 (11), 1507-1517, 2021
2832021
Focused electron beam induced deposition of gold
I Utke, P Hoffmann, B Dwir, K Leifer, E Kapon, P Doppelt
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000
2182000
High-resolution magnetic Co supertips grown by a focused electron beam
I Utke, P Hoffmann, R Berger, L Scandella
Applied physics letters 80 (25), 4792-4794, 2002
2152002
AFM study of perfluoroalkylsilane and alkylsilane self-assembled monolayers for anti-stiction in MEMS/NEMS
B Bhushan, T Kasai, G Kulik, L Barbieri, P Hoffmann
Ultramicroscopy 105 (1-4), 176-188, 2005
1732005
Phosphonate self-assembled monolayers on aluminum surfaces
E Hoque, JA DeRose, P Hoffmann, HJ Mathieu, B Bhushan, M Cichomski
The Journal of chemical physics 124 (17), 2006
1452006
Alkylphosphonate modified aluminum oxide surfaces
E Hoque, JA DeRose, G Kulik, P Hoffmann, HJ Mathieu, B Bhushan
The Journal of Physical Chemistry B 110 (22), 10855-10861, 2006
1442006
Submicrometer Hall devices fabricated by focused electron-beam-induced deposition
G Boero, I Utke, T Bret, N Quack, M Todorova, S Mouaziz, P Kejik, ...
Applied Physics Letters 86 (4), 2005
1382005
Focused-electron-beam-induced deposition of freestanding three-dimensional nanostructures of pure coalesced copper crystals
I Utke, A Luisier, P Hoffmann, D Laub, PA Buffat
Applied Physics Letters 81 (17), 3245-3247, 2002
1252002
High‐resolution nanoimprinting with a robust and reusable polymer mold
DR Barbero, MSM Saifullah, P Hoffmann, HJ Mathieu, D Anderson, ...
Advanced Functional Materials 17 (14), 2419-2425, 2007
1212007
Microstructure and ferroelectricity of BaTiO3 thin films on Si for integrated photonics
KJ Kormondy, Y Popoff, M Sousa, F Eltes, D Caimi, MD Rossell, M Fiebig, ...
Nanotechnology 28 (7), 075706, 2017
1142017
Vapor phase self-assembly of fluorinated monolayers on silicon and germanium oxide
PW Hoffmann, M Stelzle, JF Rabolt
Langmuir 13 (7), 1877-1880, 1997
1121997
Alkylperfluorosilane self-assembled monolayers on aluminum: A comparison with alkylphosphonate self-assembled monolayers
E Hoque, JA DeRose, P Hoffmann, B Bhushan, HJ Mathieu
The Journal of Physical Chemistry C 111 (10), 3956-3962, 2007
1082007
Gold elliptical nanoantennas as probes for near field optical microscopy
O Sqalli, I Utke, P Hoffmann, F Marquis-Weible
Journal of applied physics 92 (2), 1078-1083, 2002
1082002
Electrodes for carbon nanotube devices by focused electron beam induced deposition of gold
T Brintlinger, MS Fuhrer, J Melngailis, I Utke, T Bret, A Perentes, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005
1062005
Effect of surface texturing on cast iron reciprocating against steel under starved lubrication conditions: A parametric study
F Saeidi, B Meylan, P Hoffmann, K Wasmer
Wear 348, 17-26, 2016
1012016
Micro∕ nanotribological study of perfluorosilane SAMs for antistiction and low wear
T Kasai, B Bhushan, G Kulik, L Barbieri, P Hoffmann
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005
962005
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