| Optimization of ferroelectric tunnel junction TFET in presence of temperature and its RF analysis P Ghosh, R Goswami, B Bhowmick Microelectronics Journal 92, 104618, 2019 | 30 | 2019 |
| Investigation of Electrical Characteristics in a Ferroelectric L-patterned Gate Dual Tunnel Diode TFET P Ghosh, B Bhowmick IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 2020 | 26 | 2020 |
| Low-frequency noise analysis of heterojunction SELBOX TFET P Ghosh, B Bhowmick Applied Physics A 124, 1-9, 2018 | 24 | 2018 |
| Effect of temperature in selective buried oxide TFET in the presence of trap and its RF analysis P Ghosh, B Bhowmick International Journal of RF and Microwave Computer‐Aided Engineering 30 (8 …, 2020 | 15 | 2020 |
| Analysis of kink reduction and reliability issues in low‐voltage DTD‐based SOI TFET P Ghosh, B Bhowmick Micro & Nano Letters 15 (3), 130-135, 2020 | 13 | 2020 |
| Optimization of ferroelectric SELBOX TFET and ferroelectric SOI TFET P Ghosh, B Bhowmick ECS Journal of Solid State Science and Technology 9 (2), 023001, 2020 | 13 | 2020 |
| Effect of temperature on reliability issues of ferroelectric dopant segregated Schottky barrier tunnel field effect transistor (Fe DS-SBTFET) P Ghosh, B Bhowmick Silicon 12 (5), 1137-1144, 2020 | 12 | 2020 |
| Reduction of the kink effect in a SELBOX tunnel FET and its RF/analog performance P Ghosh, B Bhowmick Journal of Computational Electronics 18 (4), 1182-1191, 2019 | 12 | 2019 |
| The impact of donor/acceptor types of interface traps on selective buried oxide TFET characteristics P Ghosh, A Roy, B Bhowmick Applied Physics A 126, 1-7, 2020 | 10 | 2020 |
| Performance assessment of dielectrically modulated negative capacitance germanium source vertical tunnel FET biosensor for detection of breast cancer cell lines K Vanlalawmpuia, P Ghosh AEU-International Journal of Electronics and Communications 171, 154902, 2023 | 8 | 2023 |
| Deep insight into material-dependent DC performance of Fe DS-SBTFET and its noise analysis in the presence of interface traps P Ghosh, B Bhowmick AEU-International Journal of Electronics and Communications 117, 153124, 2020 | 6 | 2020 |
| Optimisation of electrical parameters in Fe DS-SBTFET and its application as a digital inverter P Ghosh, B Bhowmick International Journal of Electronics 106 (11), 1617-1631, 2019 | 6 | 2019 |
| Noise behaviour of δp+ Si1−xGex layer SELBOX TFET P Ghosh, B Bhowmick Indian Journal of Physics 94 (4), 493-500, 2020 | 4 | 2020 |
| The impact of interface traps (acceptor/donor) on fe ds-sbtfet characteristics P Ghosh, B Bhowmick TENCON 2019-2019 IEEE Region 10 Conference (TENCON), 73-77, 2019 | 4 | 2019 |
| Electrical characteristics assessment and noise analysis of pocket-doped multi source T-shaped gate tunnel FET S Kumari, P Ghosh Microelectronics Journal 144, 106059, 2024 | 3 | 2024 |
| An extended dual source double-gate TFET-based optical sensor for near-infrared-sensing applications P Ghosh, S Tripathi, WV Devi Applied Physics A 129 (11), 781, 2023 | 3 | 2023 |
| Electrical performance and noise assessment of vertical ferroelectric tunnel junction based SELBOX TFET P Ghosh Physica Scripta 98 (2), 025008, 2023 | 3 | 2023 |
| Performance enhancement of a FET device with ferroelectric tunnel junction and its application as a biosensor P Ghosh, B Bhowmick Journal of Computational Electronics 21 (6), 1416-1424, 2022 | 3 | 2022 |
| Study of variability induced by random dopant fluctuation in Fe DS-SBTFET P Ghosh, B Bhowmick Microelectronics Journal 125, 105467, 2022 | 3 | 2022 |
| Performance analysis and digital application of vertical L-pattern dual tunnel diode TFET P Ghosh Microelectronics Journal 129, 105604, 2022 | 2 | 2022 |
Dr. BRINDA BHOWMICKProfessor, NIT SilcharBestätigte E-Mail-Adresse bei ece.nits.ac.in