| A histogram-based testing method for estimating A/D converter performance HW Ting, BD Liu, SJ Chang IEEE Transactions on Instrumentation and Measurement 57 (2), 420-427, 2008 | 56 | 2008 |
| Transition-code based linearity test method for pipelined ADCs with digital error correction JF Lin, SJ Chang, TC Kung, HW Ting, CH Huang IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (12 …, 2011 | 32 | 2011 |
| Analysis of Nonideal Behaviors Based on INL/DNL Plots for SAR ADCs CP Huang, HW Ting, SJ Chang IEEE Transactions on Instrumentation and Measurement 65 (8), 1804-1817, 2016 | 28 | 2016 |
| A design of linearity built-in self-test for current-steering DAC HW Ting, SJ Chang, SL Huang Journal of Electronic Testing 27 (1), 85-94, 2011 | 15 | 2011 |
| Histogram based testing strategy for ADC HW Ting, S Chang 2006 15th Asian Test Symposium, 51-54, 2006 | 13 | 2006 |
| Improvement of stop-band attenuation for the sallen-key low-pass filter HW Ting, HY Wang 2010 International Symposium on Next Generation Electronics, 158-161, 2010 | 12 | 2010 |
| Realization of high octave decomposition for breast cancer feature extraction on ultrasound images HW Lee, KC Hung, BD Liu, SF Lei, HW Ting IEEE Transactions on Circuits and Systems I: Regular Papers 58 (6), 1287-1299, 2011 | 10 | 2011 |
| Reconstructive oscillator based sinusoidal signal generator for ADC BIST HW Ting, CW Lin, SJ Chang 2005 IEEE Asian Solid-State Circuits Conference, 65-68, 2005 | 9 | 2005 |
| Six-bit 2.7-GS/s 5.4-mW Nyquist complementary metal-oxide semiconductor digital-to-analogue converter for ultra-wideband transceivers RL Chen, HW Ting, SJ Chang IET circuits, devices & systems 6 (2), 95-102, 2012 | 8 | 2012 |
| An on-chip concurrent high frequency analog and digital sinusoidal generator HW Ting, BD Liu, SJ Chang The 2004 IEEE Asia-Pacific Conference on Circuits and Systems, 2004 …, 2004 | 8 | 2004 |
| A segmented resistor-string DAC based stimulus generator for ADC linearity testing HW Ting, ZT Wu, JZ Yan, HY Wu 2018 7th International Symposium on Next Generation Electronics (ISNE), 1-4, 2018 | 7 | 2018 |
| An Output Response Analyzer Circuit for ADC Built-in Self-Test HW Ting Journal of Electronic Testing 27 (4), 455-464, 2011 | 7 | 2011 |
| A time domain built-in self-test methodology for SNDR and ENOB tests of analog-to-digital converters HW Ting, BD Liu, SJ Chang 13th Asian Test Symposium, 52-57, 2004 | 6 | 2004 |
| A VLSI On-Chip Analog High-Order Low-Pass Filter Performance Evaluation Strategy HW Ting, CY Chen IEEE Transactions on Instrumentation and Measurement 67 (3), 621-633, 2018 | 5 | 2018 |
| A Digital Testing Strategy for Characterizing an Analog Circuit Block HW Ting IEEE Transactions on Instrumentation and Measurement 65 (6), 1374-1384, 2016 | 5 | 2016 |
| Analyses of Splittable Amplifier Technique and Cancellation of Memory Effect for Opamp Sharing IJ Chao, BD Liu, SJ Chang, CY Huang, HW Ting IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (2), 621-634, 2017 | 4 | 2017 |
| A third-order low-distortion delta-sigma modulator with opamp sharing and relaxed feedback path timing IJ Chao, CL Hsu, BD Liu, SJ Chang, CY Huang, HW Ting IEICE transactions on electronics 95 (11), 1799-1809, 2012 | 4 | 2012 |
| Oscillator-based reconfigurable sinusoidal signal generator for ADC BIST HW Ting, CW Lin, BD Liu, SJ Chang Journal of Electronic Testing 23 (6), 549-558, 2007 | 4 | 2007 |
| A CAM/WTA-based high speed and low power longest prefix matching circuit design RJ Tsai, HW Ting, CS Lin, BD Liu APCCAS 2006-2006 IEEE Asia Pacific Conference on Circuits and Systems, 426-429, 2006 | 4 | 2006 |
| A design and its practical application to the pseudo two-step successive-approximation register analog-to-digital converter with the active charge transfer technique HW Ting, CT Cheng, JT Kao Journal of the Chinese Institute of Engineers 40 (6), 514-524, 2017 | 3 | 2017 |
