| Gate oxide degradation condition monitoring technique for high-frequency applications of silicon carbide power MOSFETs J Naghibi, S Mohsenzade, K Mehran, MP Foster IEEE Transactions on Power Electronics 38 (1), 1079-1091, 2022 | 17 | 2022 |
| A Marx-based generator with adjustable FWHM using a controllable magnetic switch JN Nasab, A Hadizade, S Mohsenzade, M Zarghany, S Kaboli IEEE Transactions on Dielectrics and Electrical Insulation 26 (2), 324-331, 2019 | 14 | 2019 |
| An online failure assessment approach for sic-based mosfet power modules using iterative condition monitoring technique J Naghibi, K Mehran, MP Foster 2020 IEEE 21st Workshop on Control and Modeling for Power Electronics …, 2020 | 12 | 2020 |
| Reliability enhancement of power IGBTs under short-circuit fault condition using short-circuit current limiting-based technique S Mohsenzade, J Naghibi, K Mehran Energies 14 (21), 7397, 2021 | 10 | 2021 |
| High-frequency non-invasive magnetic field-based condition monitoring of sic power mosfet modules J Naghibi, K Mehran, MP Foster Energies 14 (20), 6720, 2021 | 10 | 2021 |
| Multiphysics condition monitoring technique for reliability assessment of wide bandgap-based power modules in electric vehicle application J Naghibi, K Mehran 2020 Fifteenth International Conference on Ecological Vehicles and Renewable …, 2020 | 7 | 2020 |
| Investigations on equivalent circuit models of high frequency transformers A Hadizade, JN Nasab, M Aghaei, S Kaboli 2018 9th Annual Power Electronics, Drives Systems and Technologies …, 2018 | 5 | 2018 |
| Real-time Degradation Level Assessment of IGBT Gate Oxide Layer Using Turn-off Delay Time M Jazayeri, S Mohsenzade, J Naghibi, K Mehran IEEE Transactions on Power Electronics, 2023 | 4 | 2023 |
| Package-related degradation condition monitoring of SiC power MOSFETs using current distribution anomaly detection J Naghibi, S Mohsenzade, K Mehran, MP Foster IET Digital Library, 2022 | 4 | 2022 |
| Evaluation of Drain-Source Voltage in Switch Transient Time Intervals as Gate Oxide Degradation Precursor of SiC Power MOSFETs J Naghibi, S Mohsenzade, K Mehran, MP Foster 2022 24th European Conference on Power Electronics and Applications (EPE'22 …, 2022 | 3 | 2022 |
| On the Effect of SiC Power MOSFET Gate Oxide Degradation in High Frequency Phase Leg-Based Applications J Naghibi, S Mohsenzade, S Iqbal, K Mehran, MP Foster 2022 IEEE Energy Conversion Congress and Exposition (ECCE), 1-6, 2022 | 2 | 2022 |
| Characterization of Si-IGBT crosstalk with a concentration on power circuit parasitic elements and the device operation point AA Rajabian, S Mohsenzade, J Naghibi, K Mehran 2022 24th European Conference on Power Electronics and Applications (EPE'22 …, 2022 | 2 | 2022 |
| Real-Time Comprehensive Condition Monitoring Technique for SiC MOSFET-Based Inverters in EV Applications J Naghibi, K Mehran, MP Foster Transportation Research Procedia 70, 380-387, 2023 | 1 | 2023 |
| An investigation on the quality of output voltage waveform in a nanosecond pulse generator using reverse recovery diodes JN Nasab, S Kaboli, A Eskandary 2018 9th Annual Power Electronics, Drives Systems and Technologies …, 2018 | 1 | 2018 |
| A Gate Driver-Level Isolated Monitoring Technique for Gate Oxide Degradation in Silicon Carbide Power MOSFETs J Naghibi, S Mohsenzade, K Mehran, MP Foster IEEE Transactions on Power Electronics, 2024 | | 2024 |
| High-Frequency Non-Invasive Magnetic Field-Based Condition Monitoring of SiC Power MOSFET Modules. Energies 2021, 14, 6720 J Naghibi, K Mehran, MP Foster s Note: MDPI stays neutral with regard to jurisdictional claims in published …, 2021 | | 2021 |
| A Multi-Output High Voltage DC Power Supply with Fast Regenerative Rectifier JN Nasab, S Kaboli Electrical Engineering (ICEE), Iranian Conference on, 1264-1268, 2018 | | 2018 |
| On the Performance of High Voltage Electrospray Echnique for Producing Nanoparticles S Kaboli, JN Nasab, M Elyasi, R Zarrabi, M Vosoghi Electrical Engineering (ICEE), Iranian Conference on, 283-288, 2018 | | 2018 |
kamyar mehranAssociate Professor in Electrical Engineering, Queen Mary University of LondonBestätigte E-Mail-Adresse bei qmul.ac.uk