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Ernesto Sanchez
Ernesto Sanchez
Associate Professor at Politecnico di Torino
Bestätigte E-Mail-Adresse bei polito.it - Startseite
Titel
Zitiert von
Zitiert von
Jahr
Microprocessor software-based self-testing
M Psarakis, D Gizopoulos, E Sanchez, MS Reorda
IEEE Design & Test of Computers 27 (3), 4-19, 2010
3532010
Automatic test program generation: a case study
F Corno, E Sánchez, MS Reorda, G Squillero
IEEE Design & Test of Computers 21 (2), 102-109, 2004
1902004
A reliability analysis of a deep neural network
A Bosio, P Bernardi, A Ruospo, E Sanchez
2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019
1022019
Development flow for on-line core self-test of automotive microcontrollers
P Bernardi, R Cantoro, S De Luca, E Sánchez, A Sansonetti
IEEE Transactions on Computers 65 (3), 744-754, 2015
972015
Evolutionary Optimization: the μGP toolkit
E Sanchez, M Schillaci, G Squillero
Springer Science & Business Media, 2011
882011
Increasing pattern recognition accuracy for chemical sensing by evolutionary based drift compensation
S Di Carlo, M Falasconi, E Sánchez, A Scionti, G Squillero, A Tonda
Pattern Recognition Letters 32 (13), 1594-1603, 2011
612011
Evolving assembly programs: how games help microprocessor validation
F Corno, E Sánchez, G Squillero
IEEE Transactions on Evolutionary Computation 9 (6), 695-706, 2005
602005
Investigating data representation for efficient and reliable convolutional neural networks
A Ruospo, E Sanchez, M Traiola, I O’connor, A Bosio
Microprocessors and Microsystems 86, 104318, 2021
542021
Towards automated malware creation: code generation and code integration
A Cani, M Gaudesi, E Sanchez, G Squillero, A Tonda
Proceedings of the 29th annual ACM symposium on applied computing, 157-160, 2014
532014
Evaluating convolutional neural networks reliability depending on their data representation
A Ruospo, A Bosio, A Ianne, E Sanchez
2020 23rd Euromicro Conference on Digital System Design (DSD), 672-679, 2020
422020
Assessing convolutional neural networks reliability through statistical fault injections
A Ruospo, G Gavarini, C De Sio, J Guerrero, L Sterpone, MS Reorda, ...
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2023
412023
On-line functionally untestable fault identification in embedded processor cores
P Bernardi, M Bonazza, E Sánchez, MS Reorda, O Ballan
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2013
412013
A survey on deep learning resilience assessment methodologies
A Ruospo, E Sanchez, LM Luza, L Dilillo, M Traiola, A Bosio
Computer 56 (2), 57-66, 2023
402023
A pipelined multi-level fault injector for deep neural networks
A Ruospo, A Balaara, A Bosio, E Sanchez
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020
372020
A functional power evaluation flow for defining test power limits during at-speed delay testing
M Valka, A Bosio, L Dilillo, P Girard, S Pravossoudovitch, A Virazel, ...
2011 Sixteenth IEEE European Test Symposium, 153-158, 2011
372011
Fault grading of software-based self-test procedures for dependable automotive applications
P Bernardi, M Grosso, E Sánchez, O Ballan
2011 Design, Automation & Test in Europe, 1-2, 2011
372011
An effective technique for the automatic generation of diagnosis-oriented programs for processor cores
P Bernardi, EES Sánchez, M Schillaci, G Squillero, MS Reorda
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008
372008
On the reliability assessment of artificial neural networks running on ai-oriented mpsocs
A Ruospo, E Sanchez
Applied Sciences 11 (14), 6455, 2021
352021
Emulating the effects of radiation-induced soft-errors for the reliability assessment of neural networks
LM Luza, A Ruospo, D Söderström, C Cazzaniga, M Kastriotou, ...
IEEE Transactions on Emerging Topics in Computing 10 (4), 1867-1882, 2021
342021
On the functional test of branch prediction units
E Sanchez, MS Reorda
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (9 …, 2014
332014
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