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Stefano Di Carlo
Stefano Di Carlo
Full Professor, Politecnico di Torino
Bestätigte E-Mail-Adresse bei polito.it - Startseite
Titel
Zitiert von
Zitiert von
Jahr
An expanded evaluation of protein function prediction methods shows an improvement in accuracy
Y Jiang, TR Oron, WT Clark, AR Bankapur, D D’Andrea, R Lepore, ...
Genome biology 17, 1-19, 2016
4442016
The CAFA challenge reports improved protein function prediction and new functional annotations for hundreds of genes through experimental screens
N Zhou, Y Jiang, TR Bergquist, AJ Lee, BZ Kacsoh, AW Crocker, ...
Genome biology 20, 1-23, 2019
4282019
Drift correction methods for gas chemical sensors in artificial olfaction systems: techniques and challenges
S Di Carlo, M Falasconi
INTECH Open Access Publisher, 2012
1162012
A watchdog processor to detect data and control flow errors
A Benso, S Di Carlo, G Di Natale, P Prinetto
9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003., 144-148, 2003
882003
Multi-level and hybrid modelling approaches for systems biology
R Bardini, G Politano, A Benso, S Di Carlo
Computational and structural biotechnology journal 15, 396-402, 2017
722017
Control-flow checking via regular expressions
A Benso, S Di Carlo, G Di Natale, P Prinetto, L Tagliaferri
Proceedings 10th Asian Test Symposium, 299-303, 2001
672001
Increasing pattern recognition accuracy for chemical sensing by evolutionary based drift compensation
S Di Carlo, M Falasconi, E Sánchez, A Scionti, G Squillero, A Tonda
Pattern Recognition Letters 32 (13), 1594-1603, 2011
612011
Software-based self-test of set-associative cache memories
S Di Carlo, P Prinetto, A Savino
IEEE Transactions on Computers 60 (7), 1030-1044, 2010
602010
Cost of sickness absenteeism during seasonal influenza outbreaks of medium intensity among health care workers
MM Gianino, G Politano, A Scarmozzino, M Stillo, V Amprino, S Di Carlo, ...
International journal of environmental research and public health 16 (5), 747, 2019
572019
HD/sup 2/BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs
A Benso, S Chiusano, S Di Carlo, P Prinetto, F Ricciato, M Spadari, ...
Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159 …, 2000
562000
An area-efficient 2-D convolution implementation on FPGA for space applications
S Di Carlo, G Gambardella, M Indaco, D Rolfo, G Tiotto, P Prinetto
2011 IEEE 6th international design and test workshop (IDT), 88-92, 2011
532011
A software-based self test of CUDA Fermi GPUs
S Di Carlo, G Gambardella, M Indaco, I Martella, P Prinetto, D Rolfo, ...
2013 18th IEEE European Test Symposium (ETS), 1-6, 2013
522013
March AB, March AB1: new March tests for unlinked dynamic memory faults
A Benso, A Bosio, S Di Carlo, G Di Natale, P Prinetto
IEEE International Conference on Test, 2005., 8 pp.-841, 2005
512005
Statistical reliability estimation of microprocessor-based systems
A Savino, S Di Carlo, G Politano, A Benso, A Bosio, G Di Natale
IEEE Transactions on Computers 61 (11), 1521-1534, 2011
502011
A programmable BIST architecture for clusters of multiple-port SRAMs
A Benso, S Di Carlo, G Di Natale, P Prinetto, ML Bodoni
Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159 …, 2000
502000
A functional verification based fault injection environment
A Benso, A Bosio, S Di Carlo, R Mariani
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007
472007
IEEE standard 1500 compliance verification for embedded cores
A Benso, S Di Carlo, P Prinetto, Y Zorian
IEEE transactions on very large scale integration (VLSI) systems 16 (4), 397-407, 2008
432008
Spiker: an fpga-optimized hardware accelerator for spiking neural networks
A Carpegna, A Savino, S Di Carlo
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 14-19, 2022
422022
Data criticality estimation in software applications
A Benso, S Di Carlo, G Di Natale, P Prinetto, L Tagliaferri
International test conference, 802-810, 2003
412003
Cross-layer system reliability assessment framework for hardware faults
A Vallero, A Savino, G Politano, S Di Carlo, A Chatzidimitriou, S Tselonis, ...
2016 IEEE International Test Conference (ITC), 1-10, 2016
402016
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