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Kisub Kim
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On the efficiency of test suite based program repair: A systematic assessment of 16 automated repair systems for java programs
K Liu, S Wang, A Koyuncu, K Kim, TF Bissyandé, D Kim, P Wu, J Klein, ...
Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020
1792020
FaCoY: a code-to-code search engine
K Kim, D Kim, TF Bissyandé, E Choi, L Li, J Klein, YL Traon
Proceedings of the 40th International Conference on Software Engineering …, 2018
1732018
Learning to spot and refactor inconsistent method names
K Liu, D Kim, TF Bissyandé, T Kim, K Kim, A Koyuncu, S Kim, Y Le Traon
2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), 1-12, 2019
1462019
LSRepair: Live search of fix ingredients for automated program repair
K Liu, A Koyuncu, K Kim, D Kim, TF Bissyandé
2018 25th Asia-Pacific Software Engineering Conference (APSEC), 658-662, 2018
882018
Augmenting and structuring user queries to support efficient free-form code search
R Sirres, TF Bissyandé, D Kim, D Lo, J Klein, K Kim, YL Traon
Proceedings of the 40th international conference on software engineering …, 2018
752018
Exploring parameter-efficient fine-tuning techniques for code generation with large language models
M Weyssow, X Zhou, K Kim, D Lo, H Sahraoui
ACM Transactions on Software Engineering and Methodology, 2023
602023
Where were the repair ingredients for defects4j bugs? exploring the impact of repair ingredient retrieval on the performance of 24 program repair systems
D Yang, K Liu, D Kim, A Koyuncu, K Kim, H Tian, Y Lei, X Mao, J Klein, ...
Empirical Software Engineering 26, 1-33, 2021
332021
Out of Sight, Out of Mind: Better Automatic Vulnerability Repair by Broadening Input Ranges and Sources
X Zhou, K Kim, B Xu, DG Han, D Lo
Proceedings of the IEEE/ACM 46th International Conference on Software …, 2024
252024
Representation learning for stack overflow posts: How far are we?
J He, X Zhou, B Xu, T Zhang, K Kim, Z Yang, F Thung, IC Irsan, D Lo
ACM Transactions on Software Engineering and Methodology 33 (3), 1-24, 2024
242024
Generation-based code review automation: how far are weƒ
X Zhou, K Kim, B Xu, DG Han, J He, D Lo
2023 IEEE/ACM 31st International Conference on Program Comprehension (ICPC …, 2023
222023
Learning to spot and refactor inconsistent method names. In 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE)
K Liu, D Kim, TF Bissyandé, T Kim, K Kim, A Koyuncu, S Kim, Y Le Traon
IEEE, 1ś12, 2019
222019
The devil is in the tails: How long-tailed code distributions impact large language models
X Zhou, K Kim, B Xu, J Liu, DG Han, D Lo
arXiv preprint arXiv:2309.03567, 2023
202023
Dexbert: Effective, task-agnostic and fine-grained representation learning of android bytecode
T Sun, K Allix, K Kim, X Zhou, D Kim, D Lo, TF Bissyandé, J Klein
IEEE Transactions on Software Engineering, 2023
162023
On the usage of continual learning for out-of-distribution generalization in pre-trained language models of code
M Weyssow, X Zhou, K Kim, D Lo, H Sahraoui
Proceedings of the 31st ACM Joint European Software Engineering Conference …, 2023
152023
Are we ready to embrace generative AI for software Q&A?
B Xu, TD Nguyen, T Le-Cong, T Hoang, J Liu, K Kim, C Gong, C Niu, ...
2023 38th IEEE/ACM International Conference on Automated Software …, 2023
152023
LSRepair: Live search of fix ingredients for automated program repair. In 2018 25th Asia-Pacific Software Engineering Conference (APSEC)
K Liu, A Koyuncu, K Kim, D Kim, TF Bissyandé
IEEE, 2018
152018
Collaborative agents for software engineering
D Tang, Z Chen, K Kim, Y Song, H Tian, S Ezzini, Y Huang, ...
arXiv e-prints, arXiv: 2402.02172, 2024
132024
PatchZero: Zero-shot automatic patch correctness assessment
X Zhou, B Xu, K Kim, DG Han, T Le-Cong, J He, B Le, D Lo
arXiv preprint arXiv:2303.00202, 2023
122023
Big code search: a bibliography
K Kim, S Ghatpande, D Kim, X Zhou, K Liu, TF Bissyandé, J Klein, ...
ACM Computing Surveys 56 (1), 1-49, 2023
112023
Just-in-Time Security Patch Detection--LLM At the Rescue for Data Augmentation
X Tang, Z Chen, K Kim, H Tian, S Ezzini, J Klein
arXiv preprint arXiv:2312.01241, 2023
102023
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