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Mihaela Jivanescu
Mihaela Jivanescu
Nokia Bell Labs
Bestätigte E-Mail-Adresse bei nokia-bell-labs.com
Titel
Zitiert von
Zitiert von
Jahr
Classification and control of the origin of photoluminescence from Si nanocrystals
S Godefroo, M Hayne, M Jivanescu, A Stesmans, M Zacharias, ...
Nature nanotechnology 3 (3), 174-178, 2008
6502008
Low temperature silicon dioxide by thermal atomic layer deposition: Investigation of material properties
D Hiller, R Zierold, J Bachmann, M Alexe, Y Yang, JW Gerlach, ...
Journal of Applied Physics 107 (6), 2010
1702010
Pb () centers at the Si-nanocrystal/SiO2 interface as the dominant photoluminescence quenching defect
D Hiller, M Jivanescu, A Stesmans, M Zacharias
Journal of Applied Physics 107 (8), 2010
672010
Nitrogen at the interface and its influence on luminescence and interface defects
D Hiller, S Goetze, F Munnik, M Jivanescu, JW Gerlach, J Vogt, E Pippel, ...
Physical Review B—Condensed Matter and Materials Physics 82 (19), 195401, 2010
602010
Degradation of 248 nm deep UV photoresist by ion implantation
D Tsvetanova, R Vos, G Vereecke, TN Parac-Vogt, F Clemente, ...
Journal of The Electrochemical Society 158 (8), H785, 2011
462011
Effect of heat-treatment on luminescence and structure of Ag nanoclusters doped oxyfluoride glasses and implication for fiber drawing
AS Kuznetsov, NT Cuong, VK Tikhomirov, M Jivanescu, A Stesmans, ...
Optical Materials 34 (4), 616-621, 2012
382012
Inherent paramagnetic defects in layered Si/SiO2 superstructures with Si nanocrystals
M Jivanescu, A Stesmans, M Zacharias
Journal of Applied Physics 104 (10), 2008
372008
Paramagnetic point defects at SiO2/nanocrystalline Si interfaces
A Stesmans, M Jivanescu, S Godefroo, M Zacharias
Applied Physics Letters 93 (2), 2008
282008
Size dependence of Pb-type photoluminescence quenching defects at the Si nanocrystal interface
M Jivanescu, D Hiller, M Zacharias, A Stesmans
Europhysics Letters 96 (2), 27003, 2011
272011
Electron spin resonance study of defects in low-κ oxide insulators (κ= 2.5–2.0)
VV Afanas’ev, K Keunen, A Stesmans, M Jivanescu, Z Tőkei, ...
Microelectronic engineering 88 (7), 1503-1506, 2011
252011
Influence of the supramolecular organization on the magnetic properties of poly (3-alkylthiophene) s in their neutral state
S Vandeleene, M Jivanescu, A Stesmans, J Cuppens, MJ Van Bael, ...
Macromolecules 44 (12), 4911-4919, 2011
222011
Magnetic properties of substituted poly (thiophene) s in their neutral state
S Vandeleene, M Jivanescu, A Stesmans, J Cuppens, MJ Van Bael, ...
Macromolecules 43 (6), 2910-2915, 2010
192010
Multifrequency ESR analysis of the defect in -SiO
M Jivanescu, A Stesmans, VV Afanas’ ev
Physical Review B—Condensed Matter and Materials Physics 83 (9), 094118, 2011
182011
Correlation between interface traps and paramagnetic defects in c-Si/a-Si: H heterojunctions
NH Thoan, M Jivanescu, BJ O’Sullivan, L Pantisano, I Gordon, ...
Applied Physics Letters 100 (14), 2012
172012
Influence of in situ applied ultrasound during Si+ implantation in SiO2 on paramagnetic defect generation
M Jivanescu, A Romanyuk, A Stesmans
Journal of Applied Physics 107 (11), 2010
112010
Influence of the bulkiness of the substituent on the aggregation and magnetic properties of poly (3‐alkylthiophene) s
H Peeters, M Jivanescu, A Stesmans, LMC Pereira, L Dillemans, ...
Journal of Polymer Science Part A: Polymer Chemistry 52 (1), 76-86, 2014
102014
Comparing n-and p-type polycrystalline silicon absorbers in thin-film solar cells
J Deckers, E Bourgeois, M Jivanescu, A Abass, D Van Gestel, ...
Thin Solid Films 579, 144-152, 2015
92015
Interface nature of oxidized single-crystal arrays of etched Si nanowires on (100) Si
M Jivanescu, A Stesmans, R Kurstjens, F Dross
Applied Physics Letters 100 (8), 2012
82012
Ferromagnetic resonance measurements on Co nanowires
A Popa, M Jivanescu, D Toloman, O Raita, LM Giurgiu
Journal of Physics: Conference Series 182 (1), 012073, 2009
82009
Atomic and electrical characterisation of amorphous silicon passivation layers
BJ O'Sullivan, NH Thoan, M Jivanescu, L Pantisano, T Bearda, F Dross, ...
Energy Procedia 27, 185-190, 2012
52012
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