| Exponential analysis in physical phenomena AA Istratov, OF Vyvenko Review of Scientific Instruments 70 (2), 1233-1257, 1999 | 767 | 1999 |
| Electrical and recombination properties of copper‐silicide precipitates in silicon AA Istratov, H Hedemann, M Seibt, OF Vyvenko, W Schröter, T Heiser, ... Journal of The Electrochemical Society 145 (11), 3889, 1998 | 146 | 1998 |
| X-ray beam induced current—a synchrotron radiation based technique for the in situ analysis of recombination properties and chemical nature of metal clusters in silicon OF Vyvenko, T Buonassisi, AA Istratov, H Hieslmair, AC Thompson, ... Journal of Applied Physics 91 (6), 3614-3617, 2002 | 112 | 2002 |
| HVPE growth and characterization of ε-Ga2O3 films on various substrates VI Nikolaev, SI Stepanov, AI Pechnikov, SV Shapenkov, MP Scheglov, ... ECS Journal of Solid State Science and Technology 9 (4), 045014, 2020 | 83 | 2020 |
| Regular dislocation networks in silicon as a tool for nanostructure devices used in optics, biology, and electronics M Kittler, X Yu, T Mchedlidze, T Arguirov, OF Vyvenko, W Seifert, ... Small 3 (6), 964-973, 2007 | 79 | 2007 |
| Observation of transition metals at shunt locations in multicrystalline silicon solar cells T Buonassisi, OF Vyvenko, AA Istratov, ER Weber, G Hahn, D Sontag, ... Journal of Applied Physics 95 (3), 1556-1561, 2004 | 72 | 2004 |
| Defect recognition and impurity detection techniques in crystalline silicon for solar cells AA Istratov, H Hieslmair, OF Vyvenko, ER Weber, R Schindler Solar energy materials and solar cells 72 (1-4), 441-451, 2002 | 53 | 2002 |
| Critical analysis of weighting functions for the deep level transient spectroscopy of semiconductors AA Istratov, OF Vyvenko, H Hieslmair, ER Weber Measurement Science and Technology 9 (3), 477, 1998 | 44 | 1998 |
| Halide Vapor Phase Epitaxy α‐ and ε‐Ga2O3 Epitaxial Films Grown on Patterned Sapphire Substrates S Shapenkov, O Vyvenko, E Ubyivovk, O Medvedev, G Varygin, ... physica status solidi (a) 217 (14), 1900892, 2020 | 41 | 2020 |
| Applications of synchrotron radiation X-ray techniques on the analysis of the behavior of transition metals in solar cells and single-crystalline silicon with extended defects T Buonassisi, M Heuer, OF Vyvenko, AA Istratov, ER Weber, Z Cai, B Lai, ... Physica B: Condensed Matter 340, 1137-1141, 2003 | 41 | 2003 |
| Scanning helium ion microscope: Distribution of secondary electrons and ion channeling YV Petrov, OF Vyvenko, AS Bondarenko Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques …, 2010 | 39 | 2010 |
| Photoluminescence properties of GaAs nanowire ensembles with zincblende and wurtzite crystal structure BV Novikov, SY Serov, NG Filosofov, IV Shtrom, VG Talalaev, OF Vyvenko, ... physica status solidi (RRL)–Rapid Research Letters 4 (7), 175-177, 2010 | 39 | 2010 |
| X-ray beam induced current/microprobe x-ray fluorescence: synchrotron radiation based x-ray microprobe techniques for analysis of the recombination activity and chemical nature … OF Vyvenko, T Buonassisi, AA Istratov, ER Weber Journal of Physics: Condensed Matter 16 (2), S141, 2003 | 39 | 2003 |
| A pure 1.5 μm electroluminescence from metal-oxide-silicon tunneling diode using dislocation network X Yu, W Seifert, OF Vyvenko, M Kittler, T Wilhelm, M Reiche Applied Physics Letters 93 (4), 2008 | 37 | 2008 |
| Self-organized pattern formation of biomolecules at silicon surfaces: Intended application of a dislocation network M Kittler, X Yu, OF Vyvenko, M Birkholz, W Seifert, M Reiche, T Wilhelm, ... Materials Science and Engineering: C 26 (5-7), 902-910, 2006 | 34 | 2006 |
| Secondary electron emission spectra and energy selective imaging in helium ion microscope Y Petrov, O Vyvenko Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense …, 2011 | 31 | 2011 |
| Application of synchrotron-radiation-based x-ray microprobe techniques for the analysis of recombination activity of metals precipitated at Si/SiGe misfit dislocations OF Vyvenko, T Buonassisi, AA Istratov, ER Weber, M Kittler, W Seifert Journal of Physics: Condensed Matter 14 (48), 13079, 2002 | 31 | 2002 |
| Intrinsic luminescence and core structure of freshly introduced a-screw dislocations in n-GaN O Medvedev, O Vyvenko, E Ubyivovk, S Shapenkov, A Bondarenko, ... Journal of Applied Physics 123 (16), 2018 | 29 | 2018 |
| Microscopy of carbon steels: Combined AFM and EBSD study PG Ulyanov, DY Usachov, AV Fedorov, AS Bondarenko, BV Senkovskiy, ... Applied surface science 267, 216-218, 2013 | 29 | 2013 |
| Transport of massless Dirac fermions in non-topological type edge states YI Latyshev, AP Orlov, VA Volkov, VV Enaldiev, IV Zagorodnev, ... Scientific reports 4 (1), 7578, 2014 | 28 | 2014 |
