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Alfredo Benso
Alfredo Benso
Politecnico di Torino - Systems Biology Group
Bestätigte E-Mail-Adresse bei polito.it
Titel
Zitiert von
Zitiert von
Jahr
An expanded evaluation of protein function prediction methods shows an improvement in accuracy
Y Jiang, TR Oron, WT Clark, AR Bankapur, D D’Andrea, R Lepore, ...
Genome biology 17, 1-19, 2016
4442016
The CAFA challenge reports improved protein function prediction and new functional annotations for hundreds of genes through experimental screens
N Zhou, Y Jiang, TR Bergquist, AJ Lee, BZ Kacsoh, AW Crocker, ...
Genome biology 20, 1-23, 2019
4252019
Fault injection techniques and tools for embedded systems reliability evaluation
A Benso, P Prinetto
Springer Science & Business Media, 2003
3152003
AC/C++ source-to-source compiler for dependable applications
A Benso, S Chiusano, P Prinetto, L Tagliaferri
Proceeding International Conference on Dependable Systems and Networks. DSN …, 2000
1192000
A watchdog processor to detect data and control flow errors
A Benso, S Di Carlo, G Di Natale, P Prinetto
9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003., 144-148, 2003
882003
Fault-list collapsing for fault-injection experiments
A Benso, M Rebaudengo, L Impagliazzo, P Marmo
Annual Reliability and Maintainability Symposium. 1998 Proceedings …, 1998
861998
Multi-level and hybrid modelling approaches for systems biology
R Bardini, G Politano, A Benso, S Di Carlo
Computational and structural biotechnology journal 15, 396-402, 2017
722017
An on-line BIST RAM architecture with self-repair capabilities
A Benso, S Chiusano, G Di Natale, P Prinetto
IEEE Transactions on Reliability 51 (1), 123-128, 2002
682002
Control-flow checking via regular expressions
A Benso, S Di Carlo, G Di Natale, P Prinetto, L Tagliaferri
Proceedings 10th Asian Test Symposium, 299-303, 2001
672001
Estimation of sickness absenteeism among Italian healthcare workers during seasonal influenza epidemics
MM Gianino, G Politano, A Scarmozzino, L Charrier, M Testa, ...
PloS one 12 (8), e0182510, 2017
642017
Cost of sickness absenteeism during seasonal influenza outbreaks of medium intensity among health care workers
MM Gianino, G Politano, A Scarmozzino, M Stillo, V Amprino, S Di Carlo, ...
International journal of environmental research and public health 16 (5), 747, 2019
572019
HD/sup 2/BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs
A Benso, S Chiusano, S Di Carlo, P Prinetto, F Ricciato, M Spadari, ...
Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159 …, 2000
562000
March AB, March AB1: new March tests for unlinked dynamic memory faults
A Benso, A Bosio, S Di Carlo, G Di Natale, P Prinetto
IEEE International Conference on Test, 2005., 8 pp.-841, 2005
512005
Fault behavior observation of a microprocessor system through a VHDL simulation-based fault injection experiment
AM Amendola, A Benso, F Corno, L Impagliazzo, P Marmo, P Prinetto, ...
Proceedings EURO-DAC'96. European Design Automation Conference with EURO …, 1996
511996
Statistical reliability estimation of microprocessor-based systems
A Savino, S Di Carlo, G Politano, A Benso, A Bosio, G Di Natale
IEEE Transactions on Computers 61 (11), 1521-1534, 2011
502011
A programmable BIST architecture for clusters of multiple-port SRAMs
A Benso, S Di Carlo, G Di Natale, P Prinetto, ML Bodoni
Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159 …, 2000
502000
A functional verification based fault injection environment
A Benso, A Bosio, S Di Carlo, R Mariani
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007
472007
EXFI: a low-cost fault injection system for embedded microprocessor-based boards
A Benso, P Prinetto, M Rebaudengo, MS Reorda
ACM Transactions on Design Automation of Electronic Systems (TODAES) 3 (4 …, 1998
471998
Beyond homology transfer: Deep learning for automated annotation of proteins
M Nauman, H Ur Rehman, G Politano, A Benso
Journal of Grid Computing 17, 225-237, 2019
442019
IEEE standard 1500 compliance verification for embedded cores
A Benso, S Di Carlo, P Prinetto, Y Zorian
IEEE transactions on very large scale integration (VLSI) systems 16 (4), 397-407, 2008
432008
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