| Wafer-scale nanofabrication of telecom single-photon emitters in silicon M Hollenbach, N Klingner, NS Jagtap, L Bischoff, C Fowley, U Kentsch, ... Nature Communications 13 (7683), 2022 | 68 | 2022 |
| Nanometer scale elemental analysis in the helium ion microscope using time of flight spectrometry N Klingner, R Heller, G Hlawacek, J von Borany, J Notte, J Huang, ... Ultramicroscopy 162, 91-97, 2016 | 62 | 2016 |
| Universal radiation tolerant semiconductor A Azarov, JG Fernández, J Zhao, F Djurabekova, H He, R He, Ø Prytz, ... Nature Communications 14 (1), 4855, 2023 | 53 | 2023 |
| Roadmap for focused ion beam technologies K Höflich, G Hobler, FI Allen, T Wirtz, G Rius, L McElwee-White, ... Applied Physics Reviews 10 (4), 2023 | 43 | 2023 |
| npSCOPE: A New Multimodal Instrument for In Situ Correlative Analysis of Nanoparticles O De Castro, A Biesemeier, E Serralta, O Bouton, R Barrahma, QH Hoang, ... Analytical Chemistry 93 (43), 14417-14424, 2021 | 29 | 2021 |
| Threshold and efficiency for perforation of 1 nm thick carbon nanomembranes with slow highly charged ions RA Wilhelm, E Gruber, R Ritter, R Heller, A Beyer, A Turchanin, ... 2D Materials 2 (3), 035009, 2015 | 27 | 2015 |
| Lithium ion beams from liquid metal alloy ion sources W Pilz, N Klingner, L Bischoff, P Mazarov, S Bauerdick Journal of Vacuum Science & Technology B 37 (2), 2019 | 26 | 2019 |
| Time-of-flight secondary ion mass spectrometry in the helium ion microscope N Klingner, R Heller, G Hlawacek, S Facsko, J von Borany Ultramicroscopy 198, 10-17, 2019 | 25 | 2019 |
| Effects of alloying elements on surface oxides of hot–dip galvanized press hardened steel W Gaderbauer, M Arndt, T Truglas, T Steck, N Klingner, D Stifter, J Faderl, ... Surface and Coatings Technology 404, 126466, 2020 | 22 | 2020 |
| Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass … L Wheatcroft, N Klingner, R Heller, G Hlawacek, D Özkaya, J Cookson, ... ACS Applied Energy Materials 3 (9), 8822-8832, 2020 | 22 | 2020 |
| Imaging and milling resolution of light ion beams from helium ion microscopy and FIBs driven by liquid metal alloy ion sources N Klingner, G Hlawacek, P Mazarov, W Pilz, F Meyer, L Bischoff Beilstein Journal of Nanotechnology 11 (1), 1742-1749, 2020 | 19 | 2020 |
| Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector E Serralta, N Klingner, O De Castro, M Mousley, S Eswara, SD Pinto, ... Beilstein Journal of Nanotechnology 11 (1), 1854-1864, 2020 | 18 | 2020 |
| Modelling of focused ion beam induced increases in sample temperature: a case study of heat damage in biological samples A WOLFF, N KLINGNER, W THOMPSON, Y ZHOU, J LIN, YY PENG, ... Journal of Microscopy, 2018 | 16 | 2018 |
| Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns M Mousley, S Eswara, O De Castro, O Bouton, N Klingner, CT Koch, ... Beilstein Journal of Nanotechnology 10 (1), 1648-1657, 2019 | 15 | 2019 |
| Quantum oscillations and ferromagnetic hysteresis observed in iron filled multiwall carbon nanotubes J Barzola-Quiquia, N Klingner, J Krüger, A Molle, P Esquinazi, ... Nanotechnology 23 (1), 015707, 2011 | 15 | 2011 |
| Morphology modifcation of Si nanopillars under ion irradiation at elevated temperatures: plastic deformation and controlled thinning to 10nm X Xu, KH Heinig, W Möller, HJ Engelmann, N Klingner, A Gharbi, R Tiron, ... Semiconductor Science and Technology 35, 015021, 2019 | 14 | 2019 |
| Boron liquid metal alloy ion sources for special focused ion beam applications L Bischoff, N Klingner, P Mazarov, W Pilz, F Meyer Journal of Vacuum Science & Technology B 38 (4), 2020 | 9 | 2020 |
| Optimizing the Rutherford Backscattering Spectrometry setup in a nuclear microprobe N Klingner, J Vogt, D Spemann Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2013 | 8 | 2013 |
| Differential evolution optimization of Rutherford backscattering spectra R Heller, N Klingner, N Claessens, C Merckling, J Meersschaut Journal of Applied Physics 132 (16), 2022 | 7 | 2022 |
| Backscattering Spectrometry in the Helium Ion Microscope: Imaging Elemental Compositions on the nm Scale R Heller, N Klingner, G Hlawacek Helium Ion Microscopy, 265-295, 2016 | 7 | 2016 |
Gregor HlawacekHelmholtz-Zentrum Dresden-RossendorfBestätigte E-Mail-Adresse bei hzdr.de