| Lifetime prediction and design of reliability tests for high-power devices in automotive applications M Ciappa, F Carbognani, W Fichtner IEEE Transactions on device and materials reliability 3 (4), 191-196, 2003 | 199 | 2003 |
| Breakdown walkout in pseudomorphic HEMT's R Menozzi, P Cova, C Canali, F Fantini IEEE Transactions on Electron Devices 43 (4), 543-546, 2002 | 112 | 2002 |
| On the effect of power cycling stress on IGBT modules P Cova, F Fantini Microelectronics Reliability 38 (6-8), 1347-1352, 1998 | 103 | 1998 |
| Review of oscillating water column converters N Delmonte, D Barater, F Giuliani, P Cova, G Buticchi IEEE Transactions on Industry Applications 52 (2), 1698-1710, 2015 | 98 | 2015 |
| A method for the analysis of multiphase bonding structures in amorphous SiOxNy films P Cova, S Poulin, O Grenier, RA Masut Journal of applied physics 97 (7), 2005 | 88 | 2005 |
| Comparison of the heat transfer capabilities of conventional single-and two-phase cooling systems for an electric vehicle IGBT power module I Aranzabal, IM de Alegría, N Delmonte, P Cova, I Kortabarria IEEE Transactions on Power Electronics 34 (5), 4185-4194, 2018 | 83 | 2018 |
| Hot electron degradation of the DC and RF characteristics of AlGaAs/InGaAs/GaAs PHEMT's M Borgarino, R Menozzi, Y Baeyens, P Cova, F Fantini IEEE Transactions on Electron Devices 45 (2), 366-372, 1998 | 76 | 1998 |
| A novel thermomechanics-based lifetime prediction model for cycle fatigue failure mechanisms in power semiconductors M Ciappa, F Carbognani, P Cova, W Fichtner Microelectronics reliability 42, 1653-1658, 2002 | 72 | 2002 |
| Trapped charge modulation: a new cause of instability in AlGaAs/InGaAs pseudomorphic HEMT's G Meneghesso, C Canali, P Cova, E De Bortoli, E Zanoni IEEE Electron Device Letters 17 (5), 232-234, 1996 | 70 | 1996 |
| Analysis of heavy ion irradiation induced thermal damage in SiC Schottky diodes C Abbate, G Busatto, P Cova, N Delmonte, F Giuliani, F Iannuzzo, ... IEEE Transactions on Nuclear Science 62 (1), 202-209, 2015 | 62 | 2015 |
| Thermo-mechanical finite element analysis in press-packed IGBT design A Pirondi, G Nicoletto, P Cova, M Pasqualetti, M Portesine Microelectronics Reliability 40 (7), 1163-1172, 2000 | 52 | 2000 |
| Enhancement and degradation of drain current in pseudomorphic AlGaAs/InGaAs HEMTs induced by hot-electrons C Canali, P Cova, E De Bortoli, F Fantini, G Meneghesso, R Menozzi, ... Proceedings of 1995 IEEE International Reliability Physics Symposium, 205-211, 1995 | 50 | 1995 |
| АЛЬТМЕТРИКИ ZF LI, HY RUAN JOURNAL OF HIGH ENERGY PHYSICS 4 (9-1), 2000 | 48* | 2000 |
| Oscillating water column power conversion: A technology review N Delmonte, D Barater, F Giuliani, P Cova, G Buticchi 2014 IEEE Energy Conversion Congress and Exposition (ECCE), 1852-1859, 2014 | 40 | 2014 |
| Effet des paramètres de croissance sur les couches épitaxiales d'InP obtenues par MOCVD (metal-organic chemical vapor deposition) à basse pression P Cova, RA Masut, JF Currie, A Bensaada, R Leonelli, CA Tran Canadian Journal of Physics 69 (3-4), 412-421, 1991 | 38 | 1991 |
| Thermal optimization of water heat sink for power converters with tight thermal constraints P Cova, N Delmonte, F Giuliani, M Citterio, S Latorre, M Lazzaroni, ... Microelectronics Reliability 53 (9-11), 1760-1765, 2013 | 37 | 2013 |
| Thermal modeling of planar transformer for switching power converters M Bernardoni, N Delmonte, P Cova, R Menozzi Microelectronics Reliability 50 (9-11), 1778-1782, 2010 | 36 | 2010 |
| Power cycling on press-pack IGBTs: measurements and thermomechanical simulation P Cova, G Nicoletto, A Pirondi, M Portesine, M Pasqualetti Microelectronics Reliability 39 (6-7), 1165-1170, 1999 | 36 | 1999 |
| Thermal damage in SiC Schottky diodes induced by SE heavy ions C Abbate, G Busatto, P Cova, N Delmonte, F Giuliani, F Iannuzzo, ... Microelectronics Reliability 54 (9-10), 2200-2206, 2014 | 33 | 2014 |
| Thermal characterization of IGBT power modules P Cova, M Ciappa, G Franceschini, P Malberti, F Fantini Microelectronics Reliability 37 (10-11), 1731-1734, 1997 | 33 | 1997 |
