| Prospects and challenges of flexible stretchable electrodes for electronics W Hou, Q Liao, S Xie, Y Song, L Qin Coatings 12 (5), 558, 2022 | 46 | 2022 |
| A 10 bit 5 MS/s column SAR ADC with digital error correction for CMOS image sensors S Xie, A Theuwissen IEEE Transactions on Circuits and Systems II: Express Briefs 67 (6), 984-988, 2019 | 24 | 2019 |
| A low power all-digital self-calibrated temperature sensor using 65nm FPGAs S Xie, WT Ng 2013 IEEE International Symposium on Circuits and Systems (ISCAS), 2617-2620, 2013 | 22 | 2013 |
| On-chip smart temperature sensors for dark current compensation in CMOS image sensors S Xie, AJP Theuwissen IEEE Sensors Journal 19 (18), 7849-7860, 2019 | 21 | 2019 |
| A CMOS-imager-pixel-based temperature sensor for dark current compensation S Xie, AA Prouza, A Theuwissen IEEE Transactions on Circuits and Systems II: Express Briefs 67 (2), 255-259, 2019 | 19 | 2019 |
| Delay-line temperature sensors and VLSI thermal management demonstrated on a 60nm FPGA S Xie, WT Ng 2014 IEEE International Symposium on Circuits and Systems (ISCAS), 2571-2574, 2014 | 18 | 2014 |
| Compensation for process and temperature dependency in a CMOS image sensor S Xie, A Theuwissen Sensors 19 (4), 870, 2019 | 12 | 2019 |
| An all-digital self-calibrated delay-line based temperature sensor for VLSI thermal sensing and management S Xie, WT Ng Integration, the VLSI Journal 51, 107-117, 2015 | 10 | 2015 |
| The design considerations and challenges in MOS-based temperature sensors: A review S Xie Electronics 11 (7), 1019, 2022 | 9 | 2022 |
| Integration of 555 temperature sensors into a 64× 192 CMOS image sensor A Abarca, S Xie, J Markenhof, A Theuwissen Sensors and Actuators A: Physical 282, 243-250, 2018 | 9 | 2018 |
| Analysis and calibration of process variations for an array of temperature sensors S Xie, A Abarca, J Markenhof, X Ge, A Theuwissen 2017 IEEE SENSORS, 1-3, 2017 | 9 | 2017 |
| All‐MOS self‐referenced temperature sensor S Xie, A Theuwissen Electronics Letters 55 (19), 1045-1047, 2019 | 8 | 2019 |
| Temperature sensors incorporated into a CMOS image sensor with column zoom ADCs S Xie, X Ge, A Theuwissen 2019 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2019 | 8 | 2019 |
| A 0.02 nJ self-calibrated 65nm CMOS delay line temperature sensor S Xie, WT Ng 2012 IEEE International Symposium on Circuits and Systems (ISCAS), 3126-3129, 2012 | 8 | 2012 |
| Suppression of spatial and temporal noise in a CMOS image sensor S Xie, AJP Theuwissen IEEE Sensors Journal 20 (1), 162-170, 2019 | 7 | 2019 |
| A POWER AND AREA EFFICIENT 65 nm CMOS DELAY-LINE ADC FOR ON-CHIP VOLTAGE SENSING SA Shen, S Xie, WT Ng Journal of Circuits, Systems and Computers 22 (09), 1340014, 2013 | 7 | 2013 |
| Temperature characteristics testing and modifying of piezoelectric composites Y Zhao, L Wang, Q Liao, S Xie, B Kang, H Cao Microelectronic Engineering 242, 111533, 2021 | 6 | 2021 |
| A CMOS image sensor with a 10 MHz column readout speed using digitally calibrated pipelined ADCs S Xie, A Theuwissen Microelectronics Journal 99, 104758, 2020 | 6 | 2020 |
| A CMOS image sensor with thermal sensing capability and column zoom ADCs S Xie, AJP Theuwissen IEEE Sensors Journal 20 (5), 2398-2404, 2019 | 5 | 2019 |
| Digital integrated temperature sensors for VLSI thermal management S Xie, WT Ng 2014 12th IEEE International Conference on Solid-State and Integrated …, 2014 | 5 | 2014 |
Albert TheuwissenΗ διεύθυνση ηλεκτρονικού ταχυδρομείου έχει επαληθευτεί στον τομέα harvestimaging.com
