Παρακολούθηση
Denis Amparo
Denis Amparo
Άγνωστη συνεργασία
Η διεύθυνση ηλεκτρονικού ταχυδρομείου έχει επαληθευτεί στον τομέα amparo.net
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Παρατίθεται από
Έτος
20 Process Development for Superconducting Integrated Circuits With 80 GHz Clock Frequency
SK Tolpygo, D Yohannes, RT Hunt, JA Vivalda, D Donnelly, D Amparo, ...
IEEE transactions on applied superconductivity 17 (2), 946-951, 2007
862007
System and method for providing multi-conductive layer metallic interconnects for superconducting integrated circuits
SK Tolpygo, D Amparo, R Hunt, J Vivalda, D Yohannes
US Patent 8,437,818, 2013
592013
System and method for providing multi-conductive layer metallic interconnects for superconducting integrated circuits
SK Tolpygo, D Amparo, R Hunt, J Vivalda, D Yohannes
US Patent 8,301,214, 2012
47*2012
RSFQ/ERSFQ cell library with improved circuit optimization, timing verification, and test characterization
A Inamdar, D Amparo, B Sahoo, J Ren, A Sahu
IEEE Transactions on Applied Superconductivity 27 (4), 1-9, 2017
392017
Planarized, extendible, multilayer fabrication process for superconducting electronics
DT Yohannes, RT Hunt, JA Vivalda, D Amparo, A Cohen, IV Vernik, ...
IEEE Transactions on Applied Superconductivity 25 (3), 1-5, 2014
352014
Fabrication-process-induced variations ofNb/Al/AlOx/Nb Josephson junctions in superconductor integrated circuits
SK Tolpygo, D Amparo
Superconductor Science and Technology 23 (3), 034024, 2010
292010
Plasma process-induced damage to Josephson tunnel junctions in superconductingintegrated circuits
SK Tolpygo, D Amparo, A Kirichenko, D Yohannes
Superconductor Science and Technology 20 (11), S341, 2007
282007
Electrical stress effect on Josephson tunneling through ultrathin AlOx barrier in Nb/Al/AlOx/Nb junctions
SK Tolpygo, D Amparo
Journal of Applied Physics 104 (6), 2008
262008
Timing characterization for RSFQ cell library
D Amparo, ME Çelik, S Nath, JP Cerqueira, A Inamdar
IEEE Transactions on Applied Superconductivity 29 (5), 1-9, 2019
242019
Effects of adaptive DC biasing on operational margins in ERSFQ circuits
C Shawawreh, D Amparo, J Ren, M Miller, MY Kamkar, A Sahu, ...
IEEE Transactions on Applied Superconductivity 27 (4), 1-6, 2017
242017
System and method for superconducting multi-chip module
D Yohannes, D Amparo, O Chernyashevskyy, O Mukhanov, M Renzullo, ...
US Patent 11,121,302, 2021
222021
Improved model-to-hardware correlation for superconductor integrated circuits
A Inamdar, J Ren, D Amparo
IEEE Transactions on Applied Superconductivity 25 (3), 1-8, 2014
192014
Diffusion stop-layers for superconducting integrated circuits and qubits with Nb-based Josephson junctions
SK Tolpygo, D Amparo, RT Hunt, JA Vivalda, DT Yohannes
IEEE transactions on applied superconductivity 21 (3), 119-125, 2010
192010
Process-Induced Variability ofJunctions in Superconductor IntegratedCircuits and Protection Against It
SK Tolpygo, D Amparo, DT Yohannes, M Meckbach, AF Kirichenko
IEEE transactions on applied superconductivity 19 (3), 135-139, 2009
182009
Subgap Leakage in - Josephson Junctions and Run-to-Run Reproducibility: Effects of Oxidation Chamber and Film Stress
SK Tolpygo, DJC Amparo, RT Hunt, JA Vivalda, DT Yohannes
IEEE transactions on applied superconductivity 23 (3), 1100305-1100305, 2012
142012
Fabrication process development for superconducting VLSI circuits: Minimizing plasma charging damage
SK Tolpygo, D Amparo
Journal of Physics: Conference Series 97 (1), 012227, 2008
142008
Experimental investigation of ERSFQ circuit for parallel multibit data transmission
TV Filippov, D Amparo, MY Kamkar, J Walter, AF Kirichenko, ...
2017 16th International Superconductive Electronics Conference (ISEC), 1-4, 2017
132017
System and method for providing multi-conductive layer metallic interconnects for superconducting integrated circuits
SK Tolpygo, D Amparo, R Hunt, J Vivalda, D Yohannes
US Patent 9,130,116, 2015
122015
Investigation of the Role of H in Fabrication-Process- Induced Variations of Josephson Junctions
D Amparo, SK Tolpygo
IEEE transactions on applied superconductivity 21 (3), 126-130, 2010
122010
Effect of Electrical Stress on Josephson Tunneling Characteristics of Junctions
D Amparo, SK Tolpygo
IEEE transactions on applied superconductivity 19 (3), 154-158, 2009
72009
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