| JitSCA: Jitter-based side-channel analysis in picoscale resolution K Schoos, S Meschkov, MB Tahoori, DRE Gnad IACR Transactions on Cryptographic Hardware and Embedded Systems 2023 (3 …, 2023 | 5 | 2023 |
| New approaches of side-channel attacks based on chip testing methods S Meschkov, DRE Gnad, J Krautter, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 5 | 2022 |
| Enabling in-field parametric testing for risc-v cores SM Ghasemi, S Meschkov, J Krautter, DRE Gnad, MB Tahoori 2023 IEEE International Test Conference (ITC), 367-376, 2023 | 3 | 2023 |
| SLM ISA and hardware extensions for RISC-V processors SM Ghasemi, S Meschkov, J Krautter, DRE Gnad, MB Tahoori 2023 IEEE 29th International Symposium on On-Line Testing and Robust System …, 2023 | 3 | 2023 |
| Power side-channel attacks and countermeasures on computation-in-memory architectures and technologies B Sapui, J Krautter, M Mayahinia, A Jafari, D Gnad, S Meschkov, ... 2023 IEEE European Test Symposium (ETS), 1-6, 2023 | 3 | 2023 |
| Is your secure test infrastructure secure enough?: Attacks based on delay test patterns using transient behavior analysis S Meschkov, DRE Gnad, J Krautter, MB Tahoori 2021 IEEE International Test Conference (ITC), 334-338, 2021 | 3 | 2021 |
| Automated masking of fpga-mapped designs N Muller, S Meschkov, DRE Gnad, MB Tahoori, A Moradi 2023 33rd International Conference on Field-Programmable Logic and …, 2023 | 2 | 2023 |
| Side-Channel Attack with Fault Analysis on Memristor-based Computation-in-Memory B Sapui, S Meschkov, MB Tahoori 2024 IEEE 30th International Symposium on On-Line Testing and Robust System …, 2024 | | 2024 |
| Degradation Monitoring Through Software-controlled On-chip Sensors for RISC-V SM Ghasemi, J Krautter, T Gheshlaghi, S Meschkov, DRE Gnad, ... 2024 IEEE European Test Symposium (ETS), 1-6, 2024 | | 2024 |
| In-Field Detection of Small Delay Defects and Runtime Degradation Using On-Chip Sensors SM Ghasemi, S Meschkov, J Krautter, DRE Gnad, MB Tahoori 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-2, 2024 | | 2024 |
Mehdi B. TahooriProfessor of Computer Science, Karlsruhe Institute of Technology, GermanyΗ διεύθυνση ηλεκτρονικού ταχυδρομείου έχει επαληθευτεί στον τομέα kit.edu
