Profiles

William DA Rickard

John de Laeter Centre, Curtin University

Verified email at curtin.edu.au

Cited by 6598

Nano/microanalysis FIB-SEM ToF-SIMS Geopolymers Geoscience

Jose-Jesus Fernandez

Spanish National Research Council (CSIC)

Verified email at csic.es

Cited by 6250

Image Processing Electron Tomography FIB/SEM High Performance Computing Cryo-ET

Lucas Parent

Scientist, Draper Laboratory

Verified email at draper.com

Cited by 4041

Electron Microscopy TEM FIB-SEM nanomaterials LCTEM

Raza Moshwan

Research Fellow, QUT, Australia || CAS PIFI Fellow, DICP, China || A/Prof, IUBAT …

Verified email at qut.edu.au

Cited by 2009

Thermoelectricitiy XRD TEM/STEM SEM/EDS FIB-SEM

Katya Rechav

Electron Microscopy Center, Weizmann Institute of Science

Verified email at weizmann.ac.il

Cited by 1866

EM tomography focused ion beam microscopy FIB/SEM

Robert Winkler

Christian Doppler Laboratory for Direct-Write Fabrication of Nanoprobes, FELMI-ZFE

Verified email at felmi-zfe.at

Cited by 1811

FEBID 3D-Nanoprinting AFM SPM FIB-SEM

Mason Wolak

Peak Nano Films

Verified email at peaknano.com

Cited by 1791

dielectrics FIB/SEM breakdown nanostructured polymers OLEDs

Kang Dong

Institute of High Energy Physics CAS; Helmholtz-Zentrum Berlin (HZB)

Verified email at ihep.ac.cn

Cited by 1683

Batteries Imaging techniques X-ray tomography FIB/SEM

Christoph Pauly

Saarland University

Verified email at mx.uni-saarland.de

Cited by 1654

FIB/SEM PVD Characterization Reactive Materials Multilayers

Hossein Pourrahmani

University of California, Irvine (UCI)

Verified email at uci.edu

Cited by 1432

Fuel cells and batteries CFD FIB-SEM LCA/ exergoeconomic Neural computing/ IoT

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