Christian Altenbach

Christian Altenbach

Stein Eye Institute, University of California Los Angeles
Verified email at ucla.edu
Cited by 14331
JOSE LUIS JIMENEZ

JOSE LUIS JIMENEZ

UNIVERSIDAD TECNOLOGICA DEL SURESTE DE VERACRUZ
Verified email at utsv.edu.mx
Cited by 7954
Yuequn Shang

Yuequn Shang

Linköping University
Verified email at liu.se
Cited by 5384
Angel A. Topalov

Angel A. Topalov

Max-Planck-Institut für Eisenforschung GmbH
Verified email at mpie.de
Cited by 5099
Mohamed F. Abdelkader

Mohamed F. Abdelkader

TD Engineer
Verified email at intel.com
Cited by 2267
Silviu Folea

Silviu Folea

Professor, Technical University of Cluj-Napoca, IEEE Senior Member
Verified email at aut.utcluj.ro
Cited by 2243
Evgeny Tereshatov

Evgeny Tereshatov

Principal Radiochemist, Nusano, Inc.
Verified email at nusano.com
Cited by 2116
Carlo Dri

Carlo Dri

ELETTRA-Sincrotrone Trieste SCpA
Verified email at elettra.eu
Cited by 1938
Edoardo Fiorucci

Edoardo Fiorucci

professore di misure elettriche ed elettroniche, Università degli Studi dell'Aquila
Verified email at univaq.it
Cited by 1511
Chun-Ying Huang (黃俊穎)

Chun-Ying Huang (黃俊穎)

National Chi Nan University
Verified email at ncnu.edu.tw
Cited by 1386
1 - 10