David ATTWOOD

David ATTWOOD

University of California, Berkeley
Verified email at berkeley.edu
Cited by 14929
Kevin F. Kelly

Kevin F. Kelly

IEEE Fellow, Electrical & Computer Engineering, Rice University
Verified email at rice.edu
Cited by 14901
Kevin F. Kelly

Kevin F. Kelly

IEEE Fellow, Electrical & Computer Engineering, Rice University
Verified email at rice.edu
Cited by 14831
Yue Lu

Yue Lu

Assistant Professor, University of Utah
Verified email at pharm.utah.edu
Cited by 5307
Wei Luo

Wei Luo

University of California, Los Angeles
Verified email at ucla.edu
Cited by 4882
Sang Jung Ahn

Sang Jung Ahn

Korea Research Institute of Standards and Science
Verified email at kriss.re.kr
Cited by 3478
Georg Ramer

Georg Ramer

TU Wien, Institute of Chemical Technologies and Analytics
Verified email at tuwien.ac.at
Cited by 1650
Saumya Saurabh

Saumya Saurabh

Assistant Professor, Department of Chemistry, New York University
Verified email at nyu.edu
Cited by 1234
Eric Dongheon Ha (He/Him)

Eric Dongheon Ha (He/Him)

National Institute of Standards and Technology (NIST)
Verified email at nist.gov
Cited by 932
Sam Stevens

Sam Stevens

University of Exeter
Verified email at exeter.ac.uk
Cited by 529