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MD. TUSHER AHMED
MD. TUSHER AHMED
PhD Candidate
Verified email at illinois.edu - Homepage
Title
Cited by
Cited by
Year
Atomistic analysis of the thermomechanical properties of Sn–Ag–Cu solder materials at the nanoscale with the MEAM potential
M Motalab, R Paul, S Saha, S Mojumder, T Ahmed, JC Suhling
Journal of molecular modeling 25, 1-10, 2019
252019
Interface dislocations and grain boundary disconnections using Smith normal bicrystallography
NC Admal, T Ahmed, E Martinez, G Po
Acta Materialia 240, 118340, 2022
152022
Impact of Mechanical Property Degradation and Intermetallic Compound Formation on Electromigration-Oriented Failure of a Flip-Chip Solder Joint
JCS MD. Tusher Ahmed, Mohammad Motalab
Journal of Electronic Materials, 2020
15*2020
Strain-driven faceting of graphene-catalyst interfaces
M Surana, G Ananthakrishnan, MM Poss, JJ Yaacoub, K Zhang, T Ahmed, ...
Nano letters 23 (5), 1659-1665, 2023
52023
Bicrystallography-informed Frenkel–Kontorova model for interlayer dislocations in strained 2D heterostructures
MT Ahmed, C Wang, AS Banerjee, NC Admal
Mechanics of Materials 190, 104903, 2024
32024
Interface mechanics of 2D materials on metal substrates
M Surana, T Ahmed, NC Admal
Journal of the Mechanics and Physics of Solids 163, 104831, 2022
22022
Combined experimental and numerical investigation of energy harness utilizing vortex induced vibration over half cylinder using piezoelectric beams
MT Ahmed, MT Hossain, MA Rahman
AIP Conference Proceedings 1851 (1), 2017
22017
Quantifying superlubricity of bilayer graphene from the mobility of interface dislocations
MT Ahmed, M Choi, HT Johnson, NC Admal
arXiv preprint arXiv:2501.05328, 2025
2025
Effect of thermal aging on electromigration failure of a flip-chip SnAgCu solder joint subjected to random vibration
MA Motalab, MT Ahmed, MO Bappy
AIP Conference Proceedings 2324 (1), 2021
2021
Numerical Investigation on Electromigration Oriented Failure of Lead Free Solder Joints With Aging Effects
T Ahmed, M Motalab, JC Suhling
International Electronic Packaging Technical Conference and Exhibition 59322 …, 2019
2019
Effect of thermal aging on electromigration failure of a flip-chip SnAgCu solder joint
MT Ahmed
Department of Mechanical Engineering, 2019
2019
Investigation on thermal cycling life prediction of PBGA microprocessor components with wavy patterned interface layer
MT Hossain, MT Ahmed, M Motalab, AS Shakil, M Kamruzzaman
AIP Conference Proceedings 1980 (1), 2018
2018
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Articles 1–12