| Quantitative measurement of short-range chemical bonding forces MA Lantz, HJ Hug, R Hoffmann, PJA Van Schendel, P Kappenberger, ... Science 291 (5513), 2580-2583, 2001 | 502 | 2001 |
| Low Temperature Scanning Force Microscopy of the Surface MA Lantz, HJ Hug, PJA Van Schendel, R Hoffmann, S Martin, A Baratoff, ... Physical Review Letters 84 (12), 2642, 2000 | 144 | 2000 |
| Sublattice identification in scanning force microscopy on alkali halide surfaces R Hoffmann, LN Kantorovich, A Baratoff, HJ Hug, HJ Güntherodt Physical review letters 92 (14), 146103, 2004 | 126 | 2004 |
| Dynamic force microscopy study of 3, 4, 9, 10-perylenetetracarboxylic dianhydride on KBr (001) T Kunstmann, A Schlarb, M Fendrich, T Wagner, R Möller, R Hoffmann Physical Review B 71 (12), 121403, 2005 | 125 | 2005 |
| Nucleation and Submonolayer Growth of on KBr SA Burke, JM Mativetsky, R Hoffmann, P Grütter Physical review letters 94 (9), 096102, 2005 | 123 | 2005 |
| Correlation of spin and orbital anisotropies with chemical order in alloy films using magnetic circular x-ray dichroism P Kamp, A Marty, B Gilles, R Hoffmann, S Marchesini, M Belakhovsky, ... Physical Review B 59 (2), 1105, 1999 | 101 | 1999 |
| Conductance of gold nanojunctions thinned by electromigration R Hoffmann, D Weissenberger, J Hawecker, D Stöffler Applied Physics Letters 93 (4), 043118, 2008 | 83 | 2008 |
| Electromigration and the structure of metallic nanocontacts R Hoffmann-Vogel Applied Physics Reviews 4 (3), 031302, 2017 | 69 | 2017 |
| Atomic-scale force-vector fields K Ruschmeier, A Schirmeisen, R Hoffmann Physical review letters 101 (15), 156102, 2008 | 64 | 2008 |
| Atomic resolution imaging and frequency versus distance measurements on NiO (001) using low-temperature scanning force microscopy R Hoffmann, MA Lantz, HJ Hug, PJA Van Schendel, P Kappenberger, ... Physical Review B 67 (8), 085402, 2003 | 61 | 2003 |
| In plane to out of plane magnetic reorientation transition in partially ordered FePd thin films V Gehanno, R Hoffmann, Y Samson, A Marty, S Auffret The European Physical Journal B-Condensed Matter and Complex Systems 10 (3 …, 1999 | 50 | 1999 |
| Mechanical manifestations of rare atomic jumps in dynamic force microscopy R Hoffmann, A Baratoff, HJ Hug, HR Hidber, H v Löhneysen, ... Nanotechnology 18 (39), 395503, 2007 | 46 | 2007 |
| The effective quality factor at low temperatures in dynamic force microscopes with Fabry–Pérot interferometer detection H Hölscher, P Milde, U Zerweck, LM Eng, R Hoffmann Applied Physics Letters 94 (22), 223514, 2009 | 43 | 2009 |
| Atomic resolution imaging and force versus distance measurements on KBr (0 0 1) using low temperature scanning force microscopy R Hoffmann, MA Lantz, HJ Hug, PJA van Schendel, P Kappenberger, ... Applied surface science 188 (3-4), 238-244, 2002 | 43 | 2002 |
| Magnetic domains in thin films with perpendicular anisotropy: An extensive study Y Samson, A Marty, R Hoffmann, V Gehanno, B Gilles Journal of applied physics 85 (8), 4604-4606, 1999 | 43 | 1999 |
| Site-specific force-distance characteristics on NaCl (001): measurements versus atomistic simulations MA Lantz, R Hoffmann, AS Foster, A Baratoff, HJ Hug, HR Hidber, ... Physical Review B 74 (24), 245426, 2006 | 42 | 2006 |
| v. Löhneysen, H.; Ashworth, TV; Pilet, N.; Hug, HJ A Singh, C Sürgers, R Hoffmann Appl. Phys. Lett 91, 152504, 2007 | 40 | 2007 |
| Molecular resolution imaging of C60 on Au (111) by non-contact atomic force microscopy JM Mativetsky, SA Burke, R Hoffmann, Y Sun, P Grutter Nanotechnology 15 (2), S40, 2004 | 38 | 2004 |
| Subatomic features in atomic force microscopy images HJ Hug, MA Lantz, A Abdurixit, PJA van Schendel, R Hoffmann, ... Science 291 (5513), 2509a-2509a, 2001 | 36 | 2001 |
| Scanning probe microscopy imaging of metallic nanocontacts D Stöffler, S Fostner, P Grütter, R Hoffmann-Vogel Physical Review B 85 (3), 033404, 2012 | 31 | 2012 |
Mark A. LantzIBM Research ZurichVerified email at zurich.ibm.com