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Shigeo Tanuma
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Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range
S Tanuma, CJ Powell, DR Penn
Surface and interface analysis 21 (3), 165-176, 1994
29231994
Calculations of electorn inelastic mean free paths. II. Data for 27 elements over the 50–2000 eV range
S Tanuma, CJ Powell, DR Penn
Surface and Interface Analysis 17 (13), 911-926, 1991
1992*1991
Calculations of electron inelastic mean free paths for 31 materials
S Tanuma, CJ Powell, DR Penn
Surface and Interface Analysis 11 (11), 577-589, 1988
11781988
Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range
S Tanuma, CJ Powell, DR Penn
Surface and interface analysis 43 (3), 689-713, 2011
10442011
Calculations of electron inelastic mean free paths (IMFPS). IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP‐2 for electron energies between 50 and 2000 eV
S Tanuma, CJ Powell, DR Penn
Surface and interface analysis 20 (1), 77-89, 1993
6041993
Calculation of electron inelastic mean free paths (IMFPs) VII. Reliability of the TPP‐2M IMFP predictive equation
S Tanuma, CJ Powell, DR Penn
Surface and interface analysis 35 (3), 268-275, 2003
5612003
Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50eV to 200keV range with the relativistic full Penn algorithm
DRP H. Shinotsuka, S. Tanuma, C. J. Powell
Surface and Interface Analysis 47, 871–888, 2015
4112015
Proposed formula for electron inelastic mean free paths based on calculations for 31 materials
S Tanuma, CJ Powell, DR Penn
Surface Science 192 (1), L849-L857, 1987
3191987
Calculations of electron inelastic mean free paths: VIII. Data for 15 elemental solids over the 50–2000 eV range
S Tanuma, CJ Powell, DR Penn
Surface and Interface Analysis 37 (1), 1-14, 2005
315*2005
Surface sensitivity of Auger-electron spectroscopy and X-ray photoelectron spectroscopy
CJ Powell, A Jablonski, IS Tilinin, S Tanuma, DR Penn
Journal of Electron Spectroscopy and Related Phenomena 98, 1-15, 1999
2471999
Calculations of electron inelastic mean free paths. III. Data for 15 inorganic compounds over the 50–2000 eV range
S Tanuma, CJ Powell, DR Penn
Surface and Interface analysis 17 (13), 927-939, 1991
2271991
Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study
MP Seah, SJ Spencer, F Bensebaa, I Vickridge, H Danzebrink, M Krumrey, ...
Surface and Interface Analysis: An International Journal devoted to the …, 2004
1982004
Experimental determination of electron inelastic mean free paths in 13 elemental solids in the 50 to 5000 eV energy range by elastic‐peak electron spectroscopy
S Tanuma, T Shiratori, T Kimura, K Goto, S Ichimura, CJ Powell
Surface and Interface Analysis: An International Journal devoted to the …, 2005
1762005
Calculations of electron inelastic mean free paths (IMFPs) VI. Analysis of the Gries inelastic scattering model and predictive IMFP equation
S Tanuma, CJ Powell, DR Penn
Surface and Interface Analysis: An International Journal devoted to the …, 1997
1501997
Material dependence of electron inelastic mean free paths at low energies
S Tanuma, CJ Powell, DR Penn
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 8 (3 …, 1990
1291990
Calculations of electron inelastic mean free paths. XII. Data for 42 inorganic compounds over the 50 eV to 200 keV range with the full Penn algorithm
H Shinotsuka, S Tanuma, CJ Powell, DR Penn
Surface and Interface Analysis 51 (4), 427-457, 2019
1182019
Calculations of stopping powers of 100 eV to 30 keV electrons in 10 elemental solids
S Tanuma, CJ Powell, DR Penn
Surface and Interface Analysis: An International Journal devoted to the …, 2005
1152005
Calculations of electron inelastic mean free paths. XI. Data for liquid water for energies from 50 eV to 30 keV
H Shinotsuka, B Da, S Tanuma, H Yoshikawa, CJ Powell, DR Penn
Surface and Interface Analysis 49 (4), 238-252, 2017
1042017
Use of sum rules on the energy-loss function for the evaluation of experimental optical data
S Tanuma, CJ Powell, DR Penn
Journal of electron spectroscopy and related phenomena 62 (1-2), 95-109, 1993
891993
Estimation of surface excitation correction factor for 200-5000 eV in Ni from absolute elastic scattering electron spectroscopy
S Tanuma, S Ichimura, K Goto
Surface and Interface Analysis 30 (1), 212-216, 2000
832000
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