| Charge collection and charge sharing in a 130 nm CMOS technology OA Amusan, AF Witulski, LW Massengill, BL Bhuva, PR Fleming, ML Alles, ... IEEE Transactions on nuclear science 53 (6), 3253-3258, 2006 | 491 | 2006 |
| A bias-dependent single-event compact model implemented into BSIM4 and a 90 nm CMOS process design kit JS Kauppila, AL Sternberg, ML Alles, AM Francis, J Holmes, OA Amusan, ... IEEE Transactions on nuclear Science 56 (6), 3152-3157, 2009 | 201 | 2009 |
| Single-event burnout mechanisms in SiC power MOSFETs AF Witulski, DR Ball, KF Galloway, A Javanainen, JM Lauenstein, ... IEEE Transactions on Nuclear Science 65 (8), 1951-1955, 2018 | 150 | 2018 |
| Single event upsets in deep-submicrometer technologies due to charge sharing OA Amusan, LW Massengill, MP Baze, AL Sternberg, AF Witulski, ... IEEE Transactions on Device and Materials Reliability 8 (3), 582-589, 2008 | 147 | 2008 |
| HBD layout isolation techniques for multiple node charge collection mitigation JD Black, AL Sternberg, ML Alles, AF Witulski, BL Bhuva, LW Massengill, ... IEEE transactions on nuclear science 52 (6), 2536-2541, 2005 | 134 | 2005 |
| Ion-induced energy pulse mechanism for single-event burnout in high-voltage SiC power MOSFETs and junction barrier Schottky diodes DR Ball, KF Galloway, RA Johnson, ML Alles, AL Sternberg, BD Sierawski, ... IEEE Transactions on Nuclear Science 67 (1), 22-28, 2019 | 112 | 2019 |
| Directional sensitivity of single event upsets in 90 nm CMOS due to charge sharing OA Amusan, LW Massengill, MP Baze, BL Bhuva, AF Witulski, ... IEEE Transactions on Nuclear Science 54 (6), 2584-2589, 2007 | 100 | 2007 |
| Single-event burnout of SiC junction barrier Schottky diode high-voltage power devices AF Witulski, R Arslanbekov, A Raman, RD Schrimpf, AL Sternberg, ... IEEE Transactions on Nuclear Science 65 (1), 256-261, 2017 | 98 | 2017 |
| Towards SET mitigation in RF digital PLLs: From error characterization to radiation hardening considerations Y Boulghassoul, LW Massengill, AL Sternberg, BL Bhuva, WT Holman IEEE Transactions on Nuclear Science 53 (4), 2047-2053, 2006 | 91 | 2006 |
| Proton radiation response mechanisms in bipolar analog circuits HJ Barnaby, RD Schrimpf, AL Sternberg, V Berthe, CR Cirba, RL Pease IEEE Transactions on Nuclear Science 48 (6), 2074-2080, 2001 | 89 | 2001 |
| Single event upsets in a 130 nm hardened latch design due to charge sharing OA Amusan, AL Stemberg, AF Witulski, BL Bhuva, JD Black, MP Baze, ... 2007 IEEE International Reliability Physics Symposium Proceedings. 45th …, 2007 | 86 | 2007 |
| Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation RL Pease, AL Sternberg, Y Boulghassoul, LW Massengill, S Buchner, ... IEEE Transactions on Nuclear Science 49 (6), 3163-3170, 2002 | 84 | 2002 |
| Electron-induced single-event upsets in static random access memory MP King, RA Reed, RA Weller, MH Mendenhall, RD Schrimpf, ... IEEE Transactions on Nuclear Science 60 (6), 4122-4129, 2013 | 83 | 2013 |
| Heavy ion testing and single event upset rate prediction considerations for a DICE flip-flop KM Warren, AL Sternberg, JD Black, RA Weller, RA Reed, ... IEEE Transactions on Nuclear Science 56 (6), 3130-3137, 2009 | 83 | 2009 |
| Effects of technology scaling on the SET sensitivity of RF CMOS voltage-controlled oscillators Y Boulghassoul, LW Massengill, AL Sternberg, BL Bhuva IEEE transactions on nuclear science 52 (6), 2426-2432, 2005 | 77 | 2005 |
| Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis Y Boulghassoul, LW Massengill, AL Sternberg, RL Pease, S Buchner, ... IEEE Transactions on Nuclear Science 49 (6), 3090-3096, 2002 | 72 | 2002 |
| Integrating circuit level simulation and Monte-Carlo radiation transport code for single event upset analysis in SEU hardened circuitry KM Warren, AL Sternberg, RA Weller, MP Baze, LW Massengill, RA Reed, ... IEEE Transactions on Nuclear Science 55 (6), 2886-2894, 2008 | 69 | 2008 |
| Total-dose and single-event effects in DC/DC converter control circuitry PC Adell, RD Schrimpf, WT Holman, J Boch, J Stacey, P Ribero, ... IEEE Transactions on Nuclear Science 50 (6), 1867-1872, 2003 | 67 | 2003 |
| Critical charge for single-event transients (SETs) in bipolar linear circuits RL Pease, A Sternberg, L Massengill, R Schrimpf, S Buchner, M Savage, ... IEEE Transactions on Nuclear Science 48 (6), 1966-1972, 2001 | 65 | 2001 |
| The role of parasitic elements in the single-event transient response of linear circuits AL Sternberg, LW Massengill, S Buchner, RL Pease, Y Boulghassoul, ... IEEE Transactions on Nuclear Science 49 (6), 3115-3120, 2002 | 58 | 2002 |
