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Kadir Ejderha
Kadir Ejderha
Verified email at bingol.edu.tr - Homepage
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Cited by
Cited by
Year
On temperature-dependent experimental IV and CV data of Ni/n-GaN Schottky contacts
N Yıldırım, K Ejderha, A Turut
Journal of Applied Physics 108 (11), 2010
1312010
Capacitance–conductance–current–voltage characteristics of atomic layer deposited Au/Ti/Al2O3/n-GaAs MIS structures
A Turut, A Karabulut, K Ejderha, N Bıyıklı
Materials Science in Semiconductor Processing 39, 400-407, 2015
1262015
Influence of interface states on the temperature dependence and current–voltage characteristics of Ni/p-InP Schottky diodes
K Ejderha, N Yıldırım, A Türüt, B Abay
Superlattices and Microstructures 47 (2), 241-252, 2010
512010
Capacitance–conductance characteristics of Au/Ti/Al2O3/n-GaAs structures with very thin Al2O3 interfacial layer
A Turut, A Karabulut, K Ejderha, N Bıyıklı
Materials Research Express 2 (4), 046301, 2015
462015
Examination by interfacial layer and inhomogeneous barrier height model of temperature-dependent I–V characteristics in Co/p-InP contacts
K Ejderha, N Yıldırım, B Abay, A Turut
Journal of Alloys and Compounds 484 (1-2), 870-876, 2009
452009
Dependence of characteristic diode parameters on sample temperature in Ni/epitaxy n-Si contacts
K Ejderha, A Zengin, I Orak, B Tasyurek, T Kilinc, A Turut
Materials science in semiconductor processing 14 (1), 5-12, 2011
392011
The electrical characterizations and illumination response of Co/N-type GaP junction device
I Orak, K Ejderha, A Turut
Current Applied Physics 15 (9), 1054-1061, 2015
302015
Effect of temperature on the current (capacitance and conductance)–voltage characteristics of Ti/n-GaAs diode
K Ejderha, S Duman, C Nuhoglu, F Urhan, A Turut
Journal of Applied Physics 116 (23), 2014
252014
The effect of annealing temperature on the electrical characterization of Co/n type GaP Schottky diode
I Orak, K Ejderha, E Sönmez, M Alanyalıoğlu, A Turut
Materials Research Bulletin 61, 463-468, 2015
242015
The characteristic parameters of Ni/n-6H-SiC devices over a wide measurement temperature range
K Ejderha, A Karabulut, N Turkan, A Turut
Silicon 9 (3), 395-401, 2017
222017
Determination of contact parameters of Ni/n-GaP Schottky contacts
S Duman, K Ejderha, Ö Yiğit, A Türüt
Microelectronics Reliability 52 (6), 1005-1011, 2012
222012
Temperature dependence of electrical parameters of the Cu/n-Si metal semiconductor Schottky structures
ÖF Bakkaloğlu, K Ejderha, H Efeoğlu, Ş Karataş, A Türüt
Journal of Molecular Structure 1224, 129057, 2021
212021
Schottky barrier height modification in Au/n-type 6H–SiC structures by PbS interfacial layer
Y Gülen, K Ejderha, Ç Nuhoğlu, A Turut
Microelectronic engineering 88 (2), 179-182, 2011
202011
Characterization of CuO/n-Si heterojunction solar cells produced by thermal evaporation
R Özmenteş, C Temirci, A Özkartal, K Ejderha, N Yildirim
Materials Science-Poland 36 (4), 668-674, 2018
182018
Electrical and optical characteristics of Au/PbS/n-6H–SiC structures prepared by electrodeposition of PbS thin film on n-type 6H–SiC substrate
Y Gülen, M Alanyalıoğlu, K Ejderha, Ç Nuhoğlu, A Turut
Journal of alloys and compounds 509 (6), 3155-3159, 2011
172011
The Effect of Thermal Annealing and Measurement Temperature on Interface State Density Distribution and Time Constant in Ni/n-GaP Rectifying Contacts
K Ejderha, I Orak, S Duman, A Turut
Journal of Electronic Materials 47, 3502-3509, 2018
162018
Dependence of Electrical Properties of Ni/n-GaP/Al Schottky Contacts on Measurement Temperature and Thermal Annealing
K Ejderha, A Turut
Journal of Electronic Materials 50 (12), 6741-6747, 2021
122021
Temperature-dependent current-voltage characteristics in thermally annealed ferromagnetic Co/n-GaN Schottky contacts
K Ejderha, N Yıldırm, A Turut
The European Physical Journal-Applied Physics 68 (2), 20101, 2014
122014
Characteristic diode parameters in thermally annealed Ni/p-InP contacts
A Turut, K Ejderha, N Yildirim, B Abay
Journal of Semiconductors 37 (4), 044001, 2016
112016
Responses of Pt/n-InP Schottky diode to electron irradiation in different temperature conditions
A Akbay, H Korkut, K Ejderha, T Korkut, A Türüt
Journal of Radioanalytical and Nuclear Chemistry 289, 145-148, 2011
112011
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