Fault-tolerant nanoscale processors on semiconductor nanowire grids CA Moritz, T Wang, P Narayanan, M Leuchtenburg, Y Guo, C Dezan, ... IEEE Transactions on Circuits and Systems I: Regular Papers 54 (11), 2422-2437, 2007 | 84 | 2007 |
CMOS control enabled single-type FET NASIC P Narayanan, M Leuchtenburg, T Wang, CA Moritz 2008 IEEE Computer Society Annual Symposium on VLSI, 191-196, 2008 | 52 | 2008 |
NASICs: A nanoscale fabric for nanoscale microprocessors T Wang, P Narayanan, M Leuchtenburg, CA Moritz 2008 2nd IEEE International Nanoelectronics Conference, 989-994, 2008 | 26 | 2008 |
Fetch halting on critical load misses N Mehta, B Singer, RI Bahar, M Leuchtenburg, R Weiss IEEE International Conference on Computer Design: VLSI in Computers and …, 2004 | 20 | 2004 |
Image processing architecture for semiconductor nanowire based fabrics P Narayanan, T Wang, M Leuchtenburg, CA Moritz 2008 8th IEEE Conference on Nanotechnology, 677-680, 2008 | 19 | 2008 |
Nanoscale application specific integrated circuits P Narayanan, J Kina, P Panchapakeshan, P Vijayakumar, KS Shin, ... 2011 IEEE/ACM International Symposium on Nanoscale Architectures, 99-106, 2011 | 14 | 2011 |
Towards a framework for designing applications onto hybrid nano/CMOS fabrics C Dezan, C Teodorov, L Lagadec, M Leuchtenburg, T Wang, ... Microelectronics journal 40 (4-5), 656-664, 2009 | 13 | 2009 |
Parameter variability in nanoscale fabrics: Bottom-Up integrated exploration P Narayanan, M Leuchtenburg, J Kina, P Joshi, P Panchapakeshan, ... 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI …, 2010 | 11 | 2010 |
Comparison of analog and digital nanosystems: Issues for the nano-architect P Narayanan, T Wang, M Leuchtenburg, CA Moritz 2008 2nd IEEE International Nanoelectronics Conference, 1003-1008, 2008 | 11 | 2008 |
Automatic live-aggregate projection refresh responsive to on-demand flattened table refresh TN Pham, Y Bei, M Leuchtenburg, HBN Tran US Patent 10,872,071, 2020 | 7 | 2020 |
Building cad prototyping tool for emerging nanoscale fabrics C Dezan, L Lagadec, M Leuchtenburg, T Wang, P Narayanan, A Moritz ENS 2007, 25-30, 2007 | 3 | 2007 |
Variability in nanoscale fabrics: bottom-up integrated analysis and mitigation P Narayanan, M Leuchtenburg, J Kina, P Joshi, P Panchapakeshan, ... ACM Journal on Emerging Technologies in Computing Systems (JETC) 9 (1), 1-24, 2013 | 2 | 2013 |
Impact of process variation on nasic nanoprocessors with 2-way redundancy M Leuchtenburg, P Narayanan, T Wang, CA Moritz 2009 9th IEEE Conference on Nanotechnology (IEEE-NANO), 737-739, 2009 | 2 | 2009 |
Vertica Flattened Tables and Live Aggregate Projections: A Column-based Alternative to Materialized Views for Analytics Y Bei, T Pham, A Aggarwal, N Tran, J Dave, C Bear, M Leuchtenburg 2019 IEEE International Conference on Big Data (Big Data), 1749-1758, 2019 | 1 | 2019 |
Variability in nanoscale architectures: Bottom-up integrated analysis and mitigation P Narayanan, M Leuchtenburg, J Kina, P Joshi, P Panchapakeshan, ... ACM Journal on Emerging Technologies in Computing Systems 9 (1), (In-Press), 2013 | 1 | 2013 |
Database column refresh via replacement M Leuchtenburg, Y Bei, CE Bear, N Tran US Patent 11,068,451, 2021 | | 2021 |
Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors M Leuchtenburg, P Narayanan, T Wang, CA Moritz Nano-Net: Third International ICST Conference, NanoNet 2008, Boston, MA, USA …, 2009 | | 2009 |