| Atomic-scale defects involved in the negative-bias temperature instability JP Campbell, PM Lenahan, CJ Cochrane, AT Krishnan, S Krishnan IEEE Transactions on Device and Materials Reliability 7 (4), 540-557, 2007 | 137 | 2007 |
| An electrically detected magnetic resonance study of performance limiting defects in SiC metal oxide semiconductor field effect transistors CJ Cochrane, PM Lenahan, AJ Lelis Journal of Applied Physics 109 (1), 2011 | 128 | 2011 |
| Vectorized magnetometer for space applications using electrical readout of atomic scale defects in silicon carbide CJ Cochrane, J Blacksberg, MA Anders, PM Lenahan Nature Scientific Reports 37077 (doi:10.1038/srep37077), http://www.nature …, 2016 | 109 | 2016 |
| Identification of a silicon vacancy as an important defect in 4H SiC metal oxide semiconducting field effect transistor using spin dependent recombination CJ Cochrane, PM Lenahan, AJ Lelis Applied Physics Letters 100 (2), 2012 | 87 | 2012 |
| Zero-field detection of spin dependent recombination with direct observation of electron nuclear hyperfine interactions in the absence of an oscillating electromagnetic field CJ Cochrane, PM Lenahan Journal of Applied Physics 112 (12), 2012 | 60 | 2012 |
| An accurate lifetime analysis methodology incorporating governing NBTI mechanisms in high-k/SiO2 gate stacks A Neugroschel, G Bersuker, R Choi, C Cochrane, P Lenahan, D Heh, ... 2006 International Electron Devices Meeting, 1-4, 2006 | 59 | 2006 |
| Miniaturized time-resolved Raman spectrometer for planetary science based on a fast single photon avalanche diode detector array J Blacksberg, E Alerstam, Y Maruyama, CJ Cochrane, GR Rossman Applied Optics 55 (4), 739-748, 2016 | 52 | 2016 |
| Magnetic induction responses of Jupiter's ocean moons including effects from adiabatic convection SD Vance, MJ Styczinski, BG Bills, CJ Cochrane, KM Soderlund, ... Journal of Geophysical Research: Planets 126 (2), e2020JE006418, 2021 | 49 | 2021 |
| Using FMCW Doppler Radar to Detect Targets up to the Maximum Unambiguous Range K Cooper, S Durden, CJ Cochrane IEEE Geoscience and Remote Sensing Letters, 1-5, 2017 | 44 | 2017 |
| Relationship Between the 4H-SiC/SiO2 Interface Structure and Electronic Properties Explored by Electrically Detected Magnetic Resonance MA Anders, PM Lenahan, CJ Cochrane, AJ Lelis IEEE Transactions on Electron Devices 62 (2), 301-308, 2014 | 40 | 2014 |
| Spin counting in electrically detected magnetic resonance via low-field defect state mixing CJ Cochrane, PM Lenahan Applied Physics Letters 104 (9), 2014 | 36 | 2014 |
| Physical nature of electrically detected magnetic resonance through spin dependent trap assisted tunneling in insulators MA Anders, PM Lenahan, CJ Cochrane, J Van Tol Journal of Applied Physics 124 (21), 2018 | 35 | 2018 |
| Exploring the interior of Europa with the Europa Clipper JH Roberts, WB McKinnon, CM Elder, G Tobie, JB Biersteker, D Young, ... Space Science Reviews 219 (6), 46, 2023 | 34 | 2023 |
| The effect of nitric oxide anneals on silicon vacancies at and very near the interface of 4H SiC metal oxide semiconducting field effect transistors using electrically detected … CJ Cochrane, PM Lenahan, AJ Lelis Applied Physics Letters 102 (19), 2013 | 33 | 2013 |
| Deep level defects which limit current gain in 4H SiC bipolar junction transistors CJ Cochrane, PM Lenahan, AJ Lelis Applied physics letters 90 (12), 2007 | 29 | 2007 |
| Defects and electronic transport in hydrogenated amorphous SiC films of interest for low dielectric constant back end of the line dielectric systems TA Pomorski, BC Bittel, CJ Cochrane, PM Lenahan, J Bielefeld, SW King Journal of Applied Physics 114 (7), 2013 | 28 | 2013 |
| In search of subsurface oceans within the Uranian moons CJ Cochrane, SD Vance, TA Nordheim, MJ Styczinski, A Masters, ... Journal of Geophysical Research: Planets 126 (12), e2021JE006956, 2021 | 27 | 2021 |
| Neptune odyssey: A flagship concept for the exploration of the neptune–triton system AM Rymer, KD Runyon, B Clyde, JI Núñez, R Nikoukar, KM Soderlund, ... The Planetary Science Journal 2 (5), 184, 2021 | 27 | 2021 |
| Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability MJ Mutch, T Pomorski, BC Bittel, CJ Cochrane, PM Lenahan, X Liu, ... Microelectronics Reliability 63, 201-213, 2016 | 27 | 2016 |
| Detection of interfacial Pb centers in Si/SiO2 metal-oxide-semiconducting field-effect transistors via zero-field spin dependent recombination with observation of precursor … CJ Cochrane, PM Lenahan Applied Physics Letters 103 (5), 2013 | 24 | 2013 |
P.M. LenahanDistinguished Professor of Engineering Science and Mecahnics and Co-Chair, Inter-College GraduateVerified email at engr.psu.edu