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Ambika Prasad Shah
Ambika Prasad Shah
Assistant Professor, Electrical Engineering Department, Indian Institute of Technology Jammu
Verified email at iitjammu.ac.in - Homepage
Title
Cited by
Cited by
Year
An improved read-assist energy efficient single ended PPN based 10T SRAM cell for wireless sensor network
P Sanvale, N Gupta, V Neema, AP Shah, SK Vishvakarma
Microelectronics Journal 92, 104611, 2019
592019
Stable, reliable, and bit-interleaving 12T SRAM for space applications: A device circuit co-design
N Yadav, AP Shah, SK Vishvakarma
IEEE Transactions on Semiconductor Manufacturing 30 (3), 276-284, 2017
572017
On-chip adaptive body bias for reducing the impact of NBTI on 6T SRAM cells
AP Shah, N Yadav, A Beohar, SK Vishvakarma
IEEE Transactions on Semiconductor Manufacturing 31 (2), 242-249, 2018
482018
Soft error hardened asymmetric 10T SRAM cell for aerospace applications
AP Shah, SK Vishvakarma, M Hübner
Journal of Electronic Testing 36, 255-269, 2020
302020
An ultra-low power, reconfigurable, aging resilient RO PUF for IoT applications
S Khan, AP Shah, N Gupta, SS Chouhan, JG Pandey, SK Vishvakarma
Microelectronics journal 92, 104605, 2019
292019
A reliable, multi-bit error tolerant 11T SRAM memory design for wireless sensor nodes
V Sharma, N Gupta, AP Shah, SK Vishvakarma, SS Chouhan
Analog Integrated Circuits and Signal Processing 107 (2), 339-352, 2021
282021
Process variation and NBTI resilient Schmitt trigger for stable and reliable circuits
AP Shah, N Yadav, A Beohar, SK Vishvakarma
IEEE Transactions on Device and Materials Reliability 18 (4), 546-554, 2018
282018
Utilizing manufacturing variations to design a tri-state flip-flop PUF for IoT security applications
S Khan, AP Shah, SS Chouhan, S Rani, N Gupta, JG Pandey, ...
Analog Integrated Circuits and Signal Processing 103 (3), 477-492, 2020
232020
Dual threshold voltage and sleep switch dual threshold voltage DOIND approach for leakage reduction in domino logic circuits
AP Shah, V Neema, S Daulatabad, P Singh
Microsystem Technologies 25, 1639-1652, 2019
222019
An efficient NBTI sensor and compensation circuit for stable and reliable SRAM cells
AP Shah, N Yadav, A Beohar, SK Vishvakarma
Microelectronics Reliability 87, 15-23, 2018
212018
A symmetric D flip-flop based PUF with improved uniqueness
S Khan, AP Shah, SS Chouhan, N Gupta, JG Pandey, SK Vishvakarma
Microelectronics Reliability 106, 113595, 2020
192020
Analog/RF characteristics of a 3D-Cyl underlap GAA-TFET based on a Ge source using fringing-field engineering for low-power applications
A Beohar, N Yadav, AP Shah, SK Vishvakarma
Journal of Computational Electronics 17 (4), 1650-1657, 2018
182018
Efficient CZTSSe thin film solar cell employing MoTe2/MoS2 as hole transport layer
A Kannaujiya, AK Patel, S Kannaujiya, AP Shah
Micro and Nanostructures 169, 207356, 2022
172022
QCA based cost efficient coplanar 1× 4 RAM design with set/reset ability
SF Naz, S Ahmed, SB Ko, AP Shah, S Sharma
International Journal of Numerical Modelling: Electronic Networks, Devices …, 2022
162022
Effect of process, voltage and temperature (PVT) variations In LECTOR-B (leakage reduction technique) at 70 nm technology node
AP Shah, V Neema, S Daulatabad
2015 International Conference on Computer, Communication and Control (IC4), 1-6, 2015
162015
An energy‐efficient data‐dependent low‐power 10T SRAM cell design for LiFi enabled smart street lighting system application
N Gupta, V Sharma, AP Shah, S Khan, M Huebner, SK Vishvakarma
International Journal of Numerical Modelling: Electronic Networks, Devices …, 2020
132020
8-bit 250-MS/s ADC Based on SAR Architecture with Novel Comparator at 70 nm Technology Node
S Daulatabad, V Neema, AP Shah, P Singh
Procedia Computer Science 79, 589-596, 2016
132016
Next generation QCA technology based true random number generator for cryptographic applications
MM Fazili, MF Shah, SF Naz, AP Shah
Microelectronics Journal 126, 105502, 2022
122022
Radiation hardened 12T SRAM cell with improved writing capability for space applications
R Sharma, D Mondal, AP Shah
Memories-Materials, Devices, Circuits and Systems 5, 100071, 2023
112023
BTI and soft-error tolerant voltage bootstrapped Schmitt trigger circuit
N Gupta, AP Shah, SK Vishvakarma
IEEE Transactions on Device and Materials Reliability 21 (1), 153-155, 2021
112021
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