| Monitoring the thermally induced transition from sp3-hybridized into sp2-hybridized carbons DB Schüpfer, F Badaczewski, J Peilstöcker, JM Guerra-Castro, H Shim, ... Carbon 172, 214-227, 2021 | 75 | 2021 |
| Quantitative characterization of nanometer-scale electric fields via momentum-resolved STEM A Beyer, MS Munde, S Firoozabadi, D Heimes, T Grieb, A Rosenauer, ... Nano letters 21 (5), 2018-2025, 2021 | 31 | 2021 |
| The influence of the environment on monolayer tungsten diselenide photoluminescence LM Schneider, S Lippert, J Kuhnert, O Ajayi, D Renaud, S Firoozabadi, ... Nano-Structures & Nano-Objects 15, 84-97, 2018 | 28 | 2018 |
| Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy A Beyer, FF Krause, HL Robert, S Firoozabadi, T Grieb, P Kükelhan, ... Scientific reports 10 (1), 17890, 2020 | 24 | 2020 |
| Composition determination of semiconductor alloys towards atomic accuracy by HAADF-STEM L Duschek, P Kükelhan, A Beyer, S Firoozabadi, JO Oelerich, C Fuchs, ... Ultramicroscopy 200, 84-96, 2019 | 19 | 2019 |
| Ge/SiGe parabolic quantum wells A Ballabio, J Frigerio, S Firoozabadi, D Chrastina, A Beyer, K Volz, ... Journal of Physics D: Applied Physics 52 (41), 415105, 2019 | 15 | 2019 |
| Segregation at interfaces in (GaIn) As/Ga (AsSb)/(GaIn) As-quantum well heterostructures explored by atomic resolution STEM P Kükelhan, S Firoozabadi, A Beyer, L Duschek, C Fuchs, JO Oelerich, ... Journal of Crystal Growth 524, 125180, 2019 | 13 | 2019 |
| Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si T Grieb, FF Krause, K Müller-Caspary, S Firoozabadi, C Mahr, ... Ultramicroscopy 221, 113175, 2021 | 12 | 2021 |
| Simultaneous determination of local thickness and composition for ternary III-V semiconductors by aberration-corrected STEM P Kükelhan, A Beyer, S Firoozabadi, T Hepp, K Volz Ultramicroscopy 201, 49-57, 2019 | 7 | 2019 |
| Optimization of imaging conditions for composition determination by annular dark field STEM S Firoozabadi, P Kükelhan, T Hepp, A Beyer, K Volz Ultramicroscopy 230, 113387, 2021 | 5 | 2021 |
| Composition determination for quaternary III–V semiconductors by aberration-corrected STEM P Kükelhan, T Hepp, S Firoozabadi, A Beyer, K Volz Ultramicroscopy 206, 112814, 2019 | 5 | 2019 |
| The influence of the environment on monolayer tungsten diselenide photoluminescence. Nano-Struct. Nano-Objects 15, 84–97 (2018), online 2017 LM Schneider, S Lippert, J Kuhnert, O Ajayi, D Renaud, S Firoozabadi, ... | 5 | |
| Self-assembly of nanovoids in Si microcrystals epitaxially grown on deeply patterned substrates A Barzaghi, S Firoozabadi, M Salvalaglio, R Bergamaschini, A Ballabio, ... Crystal Growth & Design 20 (5), 2914-2920, 2020 | 4 | 2020 |
| THz transmission blazed grating made out of paper tissue S Firoozabadi, F Beltran-Mejia, A Soltani, D Jahn, SF Busch, JC Balzer, ... 2017 42nd International Conference on Infrared, Millimeter, and Terahertz …, 2017 | 4 | 2017 |
| Quantitative composition determination by ADF-STEM at a low-angular regime: A combination of EFSTEM and 4DSTEM S Firoozabadi, P Kükelhan, A Beyer, J Lehr, D Heimes, K Volz Ultramicroscopy 240, 113550, 2022 | 3 | 2022 |
| Effect of growth interruption on Ga (N, As)/Ga (As, Sb)/Ga (N, As) type-II-“W” quantum well heterostructures J Lehr, L Hellweg, C Fuchs, S Firoozabadi, P Kükelhan, A Beyer, K Volz, ... Journal of Crystal Growth 582, 126501, 2022 | 3 | 2022 |
| Correlation of interface structure and optical properties of Ga (N, As) and Ga (As, Bi) based type-II hetero structures T Hepp, S Firoozabadi, R Günkel, V Chejarla, O Maßmeyer, A Beyer, ... Journal of Crystal Growth 651, 127976, 2025 | | 2025 |
| Near‐Infrared Light Trapping and Avalanche Multiplication in Silicon Epitaxial Microcrystals V Falcone, A Barzaghi, F Signorelli, J Valente, S Firoozabadi, C Zucchetti, ... Advanced Optical Materials 12 (14), 2302568, 2024 | | 2024 |
| AlP based III-V Nucleation on Silicon J Grutke, S Firoozabadi, AW Bett, D Lackner, K Volz, F Dimroth, ... | | 2023 |
| Characterization of III/V Semiconductors on Silicon by Analyzing 4D-STEM Data with Convolutional Neural Networks D Heimes, J Scheunert, A Beyer, J Belz, S Firoozabadi, K Volz Microscopy and Microanalysis 27 (S1), 450-452, 2021 | | 2021 |
Kerstin VolzProfessor of PhysicsVerified email at staff.uni-marburg.de
