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Sadahiko Miura
Sadahiko Miura
NEC, Nanobridge Semiconductor
Verified email at nanobridgesemi.com
Title
Cited by
Cited by
Year
Low-current perpendicular domain wall motion cell for scalable high-speed MRAM
S Fukami, T Suzuki, K Nagahara, N Ohshima, Y Ozaki, S Saito, R Nebashi, ...
2009 Symposium on VLSI Technology, 230-231, 2009
2152009
High critical currents in epitaxial YBa2Cu3O7−x thin films on silicon with buffer layers
XD Wu, A Inam, MS Hegde, B Wilkens, CC Chang, DM Hwang, L Nazar, ...
Applied physics letters 54 (8), 754-756, 1989
1461989
A 90nm 12ns 32Mb 2T1MTJ MRAM
R Nebashi, N Sakimura, H Honjo, S Saito, Y Ito, S Miura, Y Kato, K Mori, ...
2009 IEEE International Solid-State Circuits Conference-Digest of Technical …, 2009
1452009
Preparation of epitaxial ABO3 perovskite‐type oxide thin films on a (100)MgAl2O4/Si substrate
S Matsubara, S Miura, Y Miyasaka, N Shohata
Journal of applied physics 66 (12), 5826-5832, 1989
1191989
Atomic configuration of hydrogenated and clean Si(110) surfaces
AT H. Ampo, S. Miura, K. Kato, Y. Ohkawa
Physical Review B 34, 2329, 1986
1141986
Formation of surface superstructures by heat treatments on Ni-contaminated surface of Si (110)
T Ichinokawa, H Ampo, S Miura, A Tamura
Physical Review B 31 (8), 5183, 1985
1141985
10.5 A 90nm 20MHz fully nonvolatile microcontroller for standby-power-critical applications
N Sakimura, Y Tsuji, R Nebashi, H Honjo, A Morioka, K Ishihara, ...
2014 IEEE International Solid-State Circuits Conference Digest of Technical …, 2014
1072014
A 3.14 um2 4T-2MTJ-cell fully parallel TCAM based on nonvolatile logic-in-memory architecture
S Matsunaga, S Miura, H Honjou, K Kinoshita, S Ikeda, T Endoh, H Ohno, ...
2012 Symposium on VLSI Circuits (VLSIC), 44-45, 2012
1072012
Structural and electrical properties of liquid phase epitaxially grown Y1Ba2Cu3Ox films
S Miura, K Hashimoto, F Wang, Y Enomoto, T Morishita
Physica C: Superconductivity 278 (3-4), 201-206, 1997
1041997
A 1 Mb nonvolatile embedded memory using 4T2MTJ cell with 32 b fine-grained power gating scheme
T Ohsawa, H Koike, S Miura, H Honjo, K Kinoshita, S Ikeda, T Hanyu, ...
IEEE Journal of Solid-State Circuits 48 (6), 1511-1520, 2013
942013
Electronic device substrate using silicon semiconductor substrate
S Matsubara, Y Miyasaka, S Miura
US Patent 5,084,438, 1992
911992
Si (100) 2× n structures induced by Ni contamination
K Kato, T Ide, S Miura, A Tamura, T Ichinokawa
Surface science 194 (1-2), L87-L94, 1988
911988
Epitaxial Y‐Ba‐Cu‐O films on Si with intermediate layer by rf magnetron sputtering
S Miura, T Yoshitake, S Matsubara, Y Miyasaka, N Shohata, T Satoh
Applied physics letters 53 (20), 1967-1969, 1988
901988
Magnetic random access memory circuit
S Miura, H Numata
US Patent 6,191,972, 2001
882001
Nonvolatile logic-in-memory LSI using cycle-based power gating and its application to motion-vector prediction
M Natsui, D Suzuki, N Sakimura, R Nebashi, Y Tsuji, A Morioka, ...
IEEE Journal of Solid-State Circuits 50 (2), 476-489, 2014
732014
First demonstration of field-free SOT-MRAM with 0.35 ns write speed and 70 thermal stability under 400°C thermal tolerance by canted SOT structure and its advanced patterning …
SM H. Honjo, T. V. A. Nguyen, T. Watanabe, N. Nasuno, C. Zhang, T. Tanigawa
2019 IEEE International Electron Devices Meeting (IEDM), 28.5. 1-28.5. 4, 2019
722019
Nonvolatile logic-in-memory array processor in 90nm MTJ/MOS achieving 75% leakage reduction using cycle-based power gating
M Natsui, D Suzuki, N Sakimura, R Nebashi, Y Tsuji, A Morioka, ...
2013 IEEE International Solid-State Circuits Conference Digest of Technical …, 2013
702013
Tunneling study of clean and oriented Y-Ba-Cu-O and Bi-Sr-Ca-Cu-O surfaces
JS Tsai, I Takeuchi, J Fujita, S Miura, T Terashima, Y Bando, K Iijima, ...
Physica C: superconductivity 157 (3), 537-550, 1989
681989
Observation of gap anisotropy in YBa2Cu3O7− δ by tunneling
JS Tsai, I Takeuchi, J Fujita, T Yoshitake, S Miura, S Tanaka, T Terashima, ...
Physica C: Superconductivity 153, 1385-1386, 1988
671988
1Mb 4T-2MTJ nonvolatile STT-RAM for embedded memories using 32b fine-grained power gating technique with 1.0 ns/200ps wake-up/power-off times
T Ohsawa, H Koike, S Miura, H Honjo, K Tokutome, S Ikeda, T Hanyu, ...
2012 symposium on VLSI circuits (VLSIC), 46-47, 2012
662012
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