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Marko Andjelkovic
Marko Andjelkovic
IHP, Frankfurt (Oder), Germany
Verified email at ihp-microelectronics.com
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Year
An overview of the modeling and simulation of the single event transients at the circuit level
M Andjelkovic, A Ilic, Z Stamenkovic, M Krstic, R Kraemer
2017 IEEE 30th International Conference on Microelectronics (MIEL), 35-44, 2017
442017
Using RADFET for the real-time measurement of gamma radiation dose rate
MS Andjelković, GS Ristić, AB Jakšić
Measurement Science and Technology 26 (2), 025004, 2015
422015
Feasibility study of a current mode gamma radiation dosimeter based on a commercial PIN photodiode and a custom made auto-ranging electrometer
MS Anđelković, GS Ristić
Nuclear Technology and Radiation Protection 28 (1), 73-83, 2013
342013
Design and evaluation of radiation-hardened standard cell flip-flops
O Schrape, M Andjelković, A Breitenreiter, S Zeidler, A Balashov, M Krstić
IEEE Transactions on Circuits and Systems I: Regular Papers 68 (11), 4796-4809, 2021
302021
Design of SRAM-based low-cost SEU monitor for self-adaptive multiprocessing systems
J Chen, M Andjelkovic, A Simevski, Y Li, P Skoncej, M Krstic
2019 22nd Euromicro conference on digital system design (DSD), 514-521, 2019
272019
The behavior of fixed and switching oxide traps of RADFETs during irradiation up to high absorbed doses
GS Ristić, M Andjelković, AB Jakšić
Applied Radiation and Isotopes 102, 29-34, 2015
252015
PISA: Power-robust multiprocessor design for space applications
A Simevski, O Schrape, C Benito, M Krstic, M Andjelkovic
2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020
242020
Solar particle event and single event upset prediction from SRAM-based monitor and supervised machine learning
J Chen, T Lange, M Andjelkovic, A Simevski, L Lu, M Krstic
IEEE Transactions on Emerging Topics in Computing 10 (2), 564-580, 2022
212022
Current mode response of phototransistors to gamma radiation
MS Andjelković, GS Ristić
Radiation Measurements 75, 29-38, 2015
202015
Prediction of solar particle events with SRAM-based soft error rate monitor and supervised machine learning
J Chen, T Lange, M Andjelkovic, A Simevski, M Krstic
Microelectronics Reliability 114, 113799, 2020
192020
Use of decoupling cells for mitigation of SET effects in CMOS combinational gates
M Andjelkovic, M Babic, Y Li, O Schrape, M Krstic, R Kraemer
2018 25th IEEE International Conference on Electronics, Circuits and Systems …, 2018
182018
A review of particle detectors for space-borne self-adaptive fault-tolerant systems
M Andjelkovic, J Chen, A Simevski, Z Stamenkovic, M Krstic, R Kraemer
2020 IEEE East-West Design & Test Symposium (EWDTS), 1-8, 2020
142020
Design concept for radiation-hardening of triple modular redundancy TSPC flip-flops
O Schrape, M Andjelković, A Breitenreiter, A Balashov, M Krstić
2020 23rd Euromicro Conference on Digital System Design (DSD), 616-621, 2020
142020
Towards reconfigurable CNN accelerator for FPGA implementation
RT Syed, M Andjelkovic, M Ulbricht, M Krstic
IEEE Transactions on Circuits and Systems II: Express Briefs 70 (3), 1249-1253, 2023
122023
Hardware accelerator design with supervised machine learning for solar particle event prediction
J Chen, T Lange, M Andjelkovic, A Simevski, M Krstic
2020 IEEE international symposium on defect and fault tolerance in VLSI and …, 2020
122020
Circuit-level simulation of the single event transients in an on-chip single event latchup protection switch
MS Andjelković, V Petrović, Z Stamenković, GS Ristić, GS Jovanović
Journal of Electronic Testing 31, 275-289, 2015
112015
D-SET mitigation using common clock tree insertion techniques for triple-clock TMR flip-flop
O Schrape, A Breitenreiter, M Andjelkovic, M Krstic
2018 21st Euromicro Conference on Digital System Design (DSD), 201-205, 2018
102018
A design concept for radiation hardened RADFET readout system for space applications
M Andjelkovic, A Simevski, J Chen, O Schrape, Z Stamenkovic, M Krstic, ...
Microprocessors and Microsystems 90, 104486, 2022
92022
The isochronal annealing of irradiated n-channel power VDMOSFETs
GS Ristić, M Andjelković, S Savović
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2016
92016
Double cell upsets mitigation through triple modular redundancy
Y Li, A Breitenreiter, M Andjelkovic, J Chen, M Babic, M Krstic
Microelectronics Journal 96, 104683, 2020
82020
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